LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 17th DAY OF June, 2025
AND TO WHOM
REEXAMINATION CERTIFICATES AND PATENT TRIAL AND APPEAL BOARD CERTIFICATES WERE ISSUED
DURING THE WEEK BEGINNING THE 9th DAY OF June, 2025.
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

U-shin Italia S.p.A: See--
Peynot, Thomas; and Guerin, Anthony 12331566 Cl. E05B 85/107.
U.S. BANCORP, NATIONAL ASSOCIATION: See--
Abdelrahman, Ahmed; Assefa, Samuel; Engdahl, Charles; Garner, Andrew; and Ridgway, David 12333523 Cl. G06Q 20/34.
UAB Research Foundation, The: See--
Vantsevich, Vladimir V.; Gorsich, David J.; Moradi, Lee; Paldan, Jesse R.; and Ghasemi, Masood 12330654 Cl. B60W 30/18172.
Ubaldi, Fabio: See--
Iovanna, Paola; Pepe, Teresa; Ponzini, Filippo; and Ubaldi, Fabio 12335112 Cl. H04L 41/5019.
UBE Corporation: See--
Miura, Norio; Narita, Kazutaka; and Nakayama, Takeshige 12330981 Cl. C03C 17/32.
Uber Technologies, Inc.: See--
Goldstein, Lawrence Benjamin; Vora, Arjun; Malkani, Jai; Joshi, Nikhil; Walther, Eckart; Namazifar, Mahdi; Brown, Kathy; Kannan, Praveen; Bodapati, Arun; and Bell, Fran 12332903 Cl. G06F 16/24578.
Raju, Kanchanapalli Muralidhar; Shaginyan, Karapet; and Jan, Jane Alam 12332063 Cl. G01C 21/343.
Ubiqutek Ltd.: See--
Diprose, Andrew; Iyengar, Pravin; and Kalluru, Uma 12329144 Cl. A01M 21/046.
Ucar, Seyhan; and Mercer, Ryan Identifying an origin of abnormal driving behavior for improved vehicle operation 12330658 Cl. B60W 40/09.
UCB Biopharma SRL: See--
Finney, Helene Margaret; Rapecki, Stephen Edward; Tyson, Kerry Louise; and Wright, Michael John 12331117 Cl. C07K 16/2803.
Uchida, Hiroshi; to Nissan Motor Co., Ltd. Method for controlling fuel cell system and fuel cell system 12334609 Cl. H01M 8/04455.
Uchida, Kenta: See--
Aizawa, Bon; Tsukamoto, Toshinori; Kato, Masashi; Uchida, Kenta; and Yoshimura, Kaisaku 12330779 Cl. B64C 29/0025.
Uchida, Motoki: See--
Hayata, Daiki; Uchida, Motoki; and Masuzumi, Keigo 12333668 Cl. G06T 19/20.
Uchimura, Chihiro: See--
Takami, Masayoshi; Uchimura, Chihiro; Noumura, Akira; and Nomura, Shinichi 12331882 Cl. F17C 1/16.
Uchino, Ryohei; Moriguchi, Takafumi; and Okimoto, Naoki, to Sumitomo Precision Products Co., Ltd. Vibrating-type gyroscope element and angular velocity sensor including same 12332056 Cl. G01C 19/5684.
Uchiyama, Hiromasa: See--
Tang, Yifu; and Uchiyama, Hiromasa 12335922 Cl. H04W 72/02.
UCL Business Ltd: See--
Anderson, John; Fisher, Jonathan; Pulé, Martin; and Gustafsson, Kenth 12331316 Cl. C12N 5/0638.
Udy, Grant Antony; to MAXILODA LIMITED Cargo unloading system and method of operation 12330892 Cl. B65G 67/04.
Uebayashi, Akira: See--
Ueda, Miki; Matsuda, Takanori; Furuta, Tatsuo; Yabuta, Hisato; and Uebayashi, Akira 12336431 Cl. H10N 30/045.
Ueda, Atsushi: See--
Iwamoto, Fumio; Ueda, Atsushi; and Yabu, Takayuki 12332575 Cl. G03F 7/70741.
Ueda, Miki; Hashimoto, Takeshi; Murata, Kazuki; Shino, Megumi; Abe, Yukihiro; and Ida, Hayato, to CANON KABUSHIKI KAISHA Toner 12332599 Cl. G03G 9/08746.
Ueda, Miki; Matsuda, Takanori; Furuta, Tatsuo; Yabuta, Hisato; and Uebayashi, Akira, to Canon Kabushiki Kaisha Method of manufacturing piezoelectric element, method of manufacturing electronic device, piezoelectric element, and electronic device 12336431 Cl. H10N 30/045.
Ueda, Naotsugu: See--
Inoue, Yosuke; Enda, Yuka; and Ueda, Naotsugu 12332141 Cl. G01M 17/02.
Ueda, Takahiro: See--
Honda, Akiko; Sato, Masaya; Ueda, Takahiro; Ozawa, Kimitaka; and Kusagawa, Takashi 12330273 Cl. B25B 21/02.
Ueda, Takehiro: See--
Aoki, Takashi; and Ueda, Takehiro 12334410 Cl. H01L 23/3192.
Ueda, Tomoaki; Kato, Kyohei; and Matoba, Kazunari, to J. MORITA MFG. CORP. Dental treatment apparatus 12329438 Cl. A61B 18/14.
Ueda, Yoshihiro; and Yoshikawa, Masatoshi, to Kioxia Corporation Magnetic memory including transistors and magnetoresistive elements respectively connected between a conductive plate and a conductive line and additional transistors each connected between the conductive line and another conductive line 12336191 Cl. H10B 61/22.
Ueda, Yoshio; to NEC CORPORATION Base station, communication system, communication method, and non-transitory computer-readable medium 12335882 Cl. H04W 56/001.
Ueda, Yuki: See--
Takamine, Hidefumi; Ueda, Yuki; Watabe, Kazuo; Shiotani, Tomoki; and Hashimoto, Katsufumi 12332214 Cl. G01N 29/14.
Uegaki, Hidesato: See--
Ejiri, Kouki; Ichikawa, Hiroaki; Uegaki, Hidesato; Shibata, Akihiko; Asai, Kiyotaka; Tsuchimoto, Hirofumi; Tanaka, Koji; and Okude, Kyoshiro 12329490 Cl. A61B 5/0015.
Uehara, Akane: See--
Tsai, Wei-Wen; Kawabata, Katsumasa; Huang, Hui Bin; Uehara, Akane; and Takei, Yosuke 12330261 Cl. B24B 37/26.
Uehara, Hisayuki: See--
Matsumoto, Masanori; Oikawa, Hirona; Abe, Shingo; Tetsuka, Akio; Sato, Yoshiyuki; Kanno, Yusuke; and Uehara, Hisayuki 12329552 Cl. A61B 6/4014.
Uehara, Tatsuya: See--
Haruki, Hiroyoshi; Kanai, Jun; Uehara, Tatsuya; Sano, Fumihiko; and Deguchi, Noritaka 12333011 Cl. G06F 21/57.
Uehara, Yasuhiro; to HITACHI, LTD. Data management apparatus, data management method, and computer program 12332843 Cl. G06F 16/162.
Uejima, Takanori: See--
Kitajima, Hiromichi; Uejima, Takanori; Hanaoka, Kunitoshi; and Tsuda, Motoji 12334961 Cl. H04B 1/0057.
Matsumoto, Naoya; Uejima, Takanori; Takematsu, Yuji; and Nakagawa, Dai 12334898 Cl. H03H 9/02086.
Takematsu, Yuji; Uejima, Takanori; and Nakagawa, Dai 12336089 Cl. H05K 1/0243.
Uejima, Takanori; to MURATA MANUFACTURING CO., LTD. Radio-frequency module and communication device 12334969 Cl. H04B 1/38.
Uejima, Takanori; Kitajima, Hiromichi; Eguchi, Takahiro; Ogawa, Nobuaki; Asano, Yuki; and Hayashi, Shota, to MURATA MANUFACTURING CO., LTD. High-frequency module and communication device 12336086 Cl. H05K 1/0216.
Uematsu, Yutaka; Toba, Tadanobu; Shimbo, Kenichi; and Uezono, Takumi, to HITACHI, LTD. Distributed system and data transfer method 12332818 Cl. G06F 13/36.
Ueno, Koichi; to Asahi Kasei Kabushiki Kaisha Container for containing cellulose resin composition and package comprising same and cellulose resin composition 12330848 Cl. B65D 65/38.
Ueno, Shin: See--
Shimizu, Atsuo; Nishida, Yoshikatsu; Ueno, Shin; and Shoji, Hiromasa 12331408 Cl. C23C 28/32.
Uenodan, Akira: See--
Gorai, Nobuaki; Uenodan, Akira; Saito, Naoki; and Miki, Takahiro 12332107 Cl. G01F 5/00.
Uezono, Takaomi; Hayasaki, Minoru; and Tsuruya, Takaaki, to Canon Kabushiki Kaisha Fixing unit and image forming apparatus 12332593 Cl. G03G 15/2057.
Uezono, Takumi: See--
Uematsu, Yutaka; Toba, Tadanobu; Shimbo, Kenichi; and Uezono, Takumi 12332818 Cl. G06F 13/36.
Ufton, Jake Samuel; to RENISHAW PLC Module for additive manufacturing apparatus 12330237 Cl. B23K 26/342.
Ugajin, Kazusa; to NEC CORPORATION Processing device, transmission device, communication device, processing method and recording medium 12334985 Cl. H04B 10/54.
Ugreen Group Limited: See--
Zhang, Qingsen; Chen, Junling; and Yang, Canyu D1079635 Cl. D13‑118.
Uguz, Bedirhan; Akbas, Emre; Suat, Ozhan; Aktas, Utku; Berme, Necip; and Baro, Mohan Chandra, to Bertec Corporation System for estimating a three dimensional pose of one or more persons in a scene 12333760 Cl. G06T 7/75.
Uhelski, Kyle Anthony: See--
Garrido, Carlos Manuel; Makram, Andre; Gomaa, Mohamed; Leahy, John Jason; Jain, Reetika; Dhanens, Hailey Veronica; Alluri, Praveen; Smith, Sean-Ryan William; Turinetti, Jeremy Michael; Hadzimusic, Dunja; Emole, Ikwuagwu; Badesha, Deepinder; Marinshaw, Dania Michele; Schwarz, Megan Elizabeth; Lam, Michelle; Roffey, Chadwick Taylor; Uhelski, Kyle Anthony; Anjum, Iqra; and Selcukoglu, Aylin 12333242 Cl. G06F 40/186.
Uhnder, Inc.: See--
Maher, Monier; Roy, Arunesh; Ali, Murtaza; Bordes, Jean Pierre; and Davis, Curtis 12332376 Cl. G01S 7/352.
UIF (University Industry Foundation), Yonsei Universtiy: See--
Shin, Won-Yong; and Park, Jin-Duk 12333410 Cl. G06N 3/045.
Ulber, Dieter: See--
Beyer, Christoph; Breining, Robert; and Ulber, Dieter 12331388 Cl. C23C 10/50.
Ullah, Asim: See--
Docherty, Peter; McGuire, Christopher; Ryman, Alan; Bossard, Bryan; Ullah, Asim; and Cattanach, Ewen 12335548 Cl. H04N 21/251.
Ullah, Shakeel Salamat: See--
Lee, Pak-Ching; Chan, Hoi-Wan; Ullah, Shakeel Salamat; and Sing, Ng-Kwok 12333180 Cl. G06F 3/0655.
Ulloa, Ernesto J.: See--
Lee, Songjae; Ishii, Masato; Truemper, Martin; Collins, Richard O.; Salinas, Martin Jeffrey; Zheng, Yong; Zhao, Anita; Mariadass, Adele; Marcadal, Christophe; Barandica, Henry; and Ulloa, Ernesto J. 12334318 Cl. H01J 37/32816.
Ulrich, Drew: See--
Pennecot, Gaetan; Morriss, Zachary; Lenius, Samuel; Iordache, Dorel Ionut; Gruver, Daniel; Droz, Pierre-Yves; Wachter, Luke; Ulrich, Drew; Mccann, William; Pardhan, Rahim; Fidric, Bernard; Levandowski, Anthony; and Avram, Peter 12332379 Cl. G01S 7/4808.
ULTRA INDUSTRIES LLC: See--
Alvarez, Salvador 12329272 Cl. A46B 5/0012.
Ultrahaptics IP Two Limited: See--
Dabir, Avinash; Durdik, Paul; Mertens, Keith; and Zagorsek, Michael 12333081 Cl. G06F 3/017.
ULTRAMEMORY INC.: See--
Kajigaya, Kazuhiko 12334473 Cl. H01L 25/0657.
Ultratec, Inc.: See--
Engelke, Robert M.; Colwell, Kevin R.; and Vitek, Troy D. 12335437 Cl. H04M 3/42382.
ULTRON SEMICONDUCTOR (SHANGHAI) CO., LTD.: See--
Shen, Yilin; Chen, Xinlai; Liu, Dawei; Wang, Jie; Lu, Zhengkai; Xu, Ming; Li, Panpan; Lv, Fangyi; and Liu, Chuanlong 12334368 Cl. H01L 21/67057.
Ulupinar, Fatih: See--
Radulescu, Andrei Dragos; and Ulupinar, Fatih 12335173 Cl. H04L 5/0032.
Ulusoy, Erdem: See--
Urey, Hakan; Skolianos, Georgios; Ulusoy, Erdem; Yaralioglu, Goksen G.; and Chan, Trevor 12332434 Cl. G02B 27/0101.
Um, Hyun-Chul: See--
Lim, Byung-Jun; and Um, Hyun-Chul 12334006 Cl. G09G 3/3208.
Um, Hyunah; Kim, Hyeongmin; Ahn, Heechoon; Lee, Yeseul; Im, Yirang; and Cho, Seowon, to Samsung Display Co., Ltd. Compound and light-emitting device including the same 12336425 Cl. H10K 85/654.
Um, Youngdo; Oh, Taeyoung; and Seol, Hoseok, to SAMSUNG ELECTRONICS CO., LTD. Memory system for optimizing on-die termination settings of multi-ranks, method of operation of memory system, and memory controller 12333169 Cl. G06F 3/0634.
Umair, Muhammad: See--
Mitchell, Nate; Umair, Muhammad; and Amarasinghe, Saluka D1079501 Cl. D10‑70.
Mitchell, Nate; Umair, Muhammad; and Amarasinghe, Saluka D1079502 Cl. D10‑70.
Mitchell, Nate; Umair, Muhammad; and Amarasinghe, Saluka D1079503 Cl. D10‑70.
Umbra LLC: See--
Carr, Matthew J. 12329347 Cl. A47L 19/04.
UMBRA Technologies Ltd. (UK): See--
Rubenstein, Joseph E.; Oré, Carlos Eduardo; Knutsen, Jørn Allan Dose; Broussard, Fred; and Saint-Martin, Thibaud Auguste Bernard Jean 12335329 Cl. H04L 67/025.
Umeda, Naoki; Moriyama, Takafumi; Sasaki, Hirokazu; and Matsuura, Keisuke, to SHOEI CHEMICAL INC. Semiconductor nanoparticle aggregate, semiconductor nanoparticle aggregate dispersion liquid, semiconductor nanoparticle aggregate composition, and semiconductor nanoparticle aggregate cured film 12331238 Cl. C09K 11/883.
Umemoto, Ryo; Yamamoto, Hirokatsu; and Kaminokado, Shingo, to MAKITA CORPORATION Cart 12330510 Cl. B60L 15/30.
Umemura, Naoki; to CANON KABUSHIKI KAISHA Information processing apparatus, information processing method, and storage medium 12333749 Cl. G06T 7/55.
Umesh, Mithun: See--
Aher, Ankur; Doss, Indranil Coomar; Goyal, Aashish; Puniyani, Aman; Reddy, Kandala; and Umesh, Mithun 12332937 Cl. G06F 16/635.
Umezu, Satoshi; Morino, Yusuke; Hiasa, Takumi; and Motohashi, Kazunari, to Murata Manufacturing Co., Ltd. Secondary battery 12334505 Cl. H01M 10/0569.
Umezurike, Josiah Johnson Unified identification verification system 12335260 Cl. H04L 63/0876.
Umino, Hikaru; to ORIENTAL MOTOR CO., LTD. AC motor control device and drive system equipped with same 12334846 Cl. H02P 21/24.
Umminger, Jürgen; to Johns Manville Highly efficient filter medium 12330100 Cl. B01D 39/163.
Umstadter, Karl Robert: See--
Albright, Ronald Peter; Bal, Kursat; Banine, Vadim Yevgenyevich Joseph; Bruls, Richard Joseph; De Vries, Sjoerd Frans; Frijns, Olav Waldemar Vladimir; Huang, Yang-Shan; Huang, Zhuangxiong; Jacobs, Johannes Henricus Wilhelmus; Moors, Johannes Hubertus Josephina; Nenchev, Georgi Nenchev; Nikipelov, Andrey; Raasveld, Thomas Maarten; Ranjan, Manish; Te Sligte, Edwin; Umstadter, Karl Robert; Uzgören, Eray; Van De Kerkhof, Marcus Adrianus; and Yaghoobi, Parham 12332570 Cl. G03F 7/70033.
Unagami, Yuji; Haga, Tomoyuki; Yamamoto, Kakuya; and Mitani, Ayaka, to PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA Control method, recording medium, and anomalous data sensing system 12332998 Cl. G06F 21/552.
Uncaged Innovations Inc: See--
Wang, Xiaokun; Lang, Kening; and Watson, Elizabeth 12331439 Cl. D04H 1/08.
Ung, Victoria: See--
Castelli, Brian; Spink, Ashley; Berthiaume, William; Chang, William; Ung, Victoria; and Mitchell, James 12329916 Cl. A61M 25/0136.
Unger, Brian: See--
Comstock, Kevin; and Unger, Brian 12329702 Cl. A61G 7/1011.
Unger, Jakob: See--
Schick, Friedrich; Schillen, Peter; Schindler, Patrick; Schmidt, Andre; Eberspach, Michael; Lennartz, Christian; Send, Robert; Diesselberg, Lars; Hengen, Heiko; Bruder, Ingmar; Unger, Jakob; and Bonsignore, Christian 12332352 Cl. G01S 17/46.
Unger, Jesse; Malik, Jeremy; and Donahoe, Ryan, to Nuvasive Inc. Porous spinal fusion implant 12329653 Cl. A61F 2/4455.
UNICHARM CORPORATION: See--
Okawa, Ayano; Sasano, Yasuhiro; and Nakatani, Misato 12329124 Cl. A01K 1/011.
UNILIN BV: See--
De Rick, Jan 12331529 Cl. E04F 15/042.
De Rick, Jan Eddy; and Devos, Pieter 12331528 Cl. E04F 15/02038.
Schacht, Benny; and De Rick, Jan 12331527 Cl. E04F 15/02038.
Van Vlassenrode, Kristof; and Goessens, Jurgen 12331530 Cl. E04F 15/107.
Unirac, Inc.: See--
Gallegos, Ernest; Gangumalla, Deepthi; and Babu, Nikhil D1079598 Cl. D13‑102.
UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY): See--
Yu, Hyeongseok; Sim, Hyeonuk; and Lee, Jongeun 12333418 Cl. G06N 3/063.
UNITED ARAB EMIRATES UNIVERSITY: See--
Ahmed, Waleed; Al Marzouqi, Ali; Zaneldin, Essam; Almazrouei, Noura; Elhassan, Amged; and Aziz, Muthanna 12331518 Cl. E04C 1/41.
UNITED LABORATORIES, INC.: See--
Frazier, Eric D. 12330858 Cl. B65D 83/0805.
UNITED MICROELECTRONICS CORP.: See--
Chang, Chung-Fu; Chen, Kuan-Hung; Lo, Guang-Yu; Chen, Chun-Chia; and Lu, Chun-Tsen 12336209 Cl. H10D 30/024.
Chang, Wei-Hsuan; Yan, Hao-Ping; Tsai, Ming-Hua; and Kuo, Chin-Chia 12336208 Cl. H10D 30/0227.
Hsu, Po-Kai; Wang, Hui-Lin; Hsu, Ching-Hua; Lin, Yi-Yu; Fan, Ju-Chun; and Chen, Hung-Yueh 12336194 Cl. H10B 63/80.
Huang, Shih-Che; Chang, Ching-Chih; Ko, Yuan-Fu; and Chang, Chih-Sheng 12334436 Cl. H01L 23/528.
Lai, Chien-Ming 12334462 Cl. H01L 24/08.
Lin, Chun-Hsien 12336253 Cl. H10D 64/021.
Yi, Yen-Tsai; Tsai, Wei-Chuan; Chiou, Jin-Yan; and Ke, Hsiang-Wen 12336245 Cl. H10D 62/343.
UNITED PARCEL SERVICE OF AMERICA, INC: See--
Gil, Julio 12330808 Cl. B64D 9/00.
United Parcel Service of America, Inc.: See--
Bell, Julian Leland; and Gil, Julio 12330891 Cl. B65G 67/04.
United Services Automobile Association (USAA): See--
Black, Robert Lee; Santacroce, Matthew Ryan; Buentello, Andre Rene; Romero, Jr., Jose L.; Chalmers, Timothy Blair; and Mehra, Samip Dilip 12333365 Cl. G06K 19/07345.
Hansen, Gregory David; and Buentello, Andre R. 12333611 Cl. G06Q 40/08.
Hopkins, III, John Chandler; Bueche, Jr., Michael Patrick; Buentello, Andre Rene; Hillman, James Philip; and Billman, Bradly Jay 12333609 Cl. G06Q 40/08.
Maney, Will Kerns; Warnick, Mark Paxman; Baker, Kelly Q.; and Marks, Phillip E. 12332714 Cl. G06F 1/3206.
Osterkamp, Bryan J.; Matheson, Cory A.; Bell, Curtis Mark; Philbrick, Ashley Raine; Post, Nathan Lee; Martinez, Noe Alberto; Jones, Jr., David M.; Guerra, Oscar; Dziuk, Janelle Denice; Lake, Zachery C.; and Khmelev, Yevgeniy Viatcheslavovich 12333533 Cl. G06Q 20/383.
Romero, Jr., Jose L.; Buentello, Andre Rene; Byrd, Matthew Robert; Urity, Mounica; Rahim, Sayeef; Chalmers, Timothy Blair; Black, Robert Lee; and Philbrick, Ashley Raine 12333656 Cl. G06T 19/006.
Schroeder, Eric David; Moncrief Brown, Donnette L.; Desai, Snehal; Amann, Manfred; Davison, Timothy Frank; Ballew, Rachel Michelle; O'Brien, Kelsey Anne; and Rahim, Sayeef 12334756 Cl. H02J 7/00047.
Taylor, Samantha Elizabeth; Rai, Yogen; Lake, Zachery C.; Csabi, Rachel Elizabeth; King, Hollie Ilene; Wheeler, Nicholas C.; and Kwak, Victor 12335439 Cl. H04M 3/51.
Warnick, Mark Paxman; Post, Nathan Lee; Hartshorn, Joel S.; Williams, Christian A.; Maney, Jr., Will Kerns; Durairaj, Ravi; Serrao, Nolan; and Holloway, III, Donald Nathaniel 12334047 Cl. G10L 13/033.
Zoller, Cindy; Myers, Dennis; Rice, Amy; Young, Larry; Watts, Georgiana; and Bergin, Michael 12332953 Cl. G06F 16/9535.
UNITED SILICON CARBIDE, INC.: See--
Zhu, Ke 12334917 Cl. H03K 17/687.
United States Government As Represented By The Department Of Veterans Affairs: See--
Kuo, Alfred 12329646 Cl. A61F 2/3609.
United States Government as Represented by the Department of Veterans Affairs, The: See--
Sajadi, Mohammad; Lewis, George K.; DeVico, Anthony; Kim, Dongkyoon; and Cavet, Guy 12331105 Cl. C07K 16/1063.
United States Government, The: See--
Tour, James M.; Nilewski, Lizanne; Sikkema, William; Mendoza, Kimberly; Kent, Thomas Andrew; Dalmeida, Jr., William; Derry, Paul J.; Tsai, Ah-Lim; Hegde, Muralidhar L.; Dharmalingam, Prakash; Hegde, Pavana Dixit; Mitra, Sankar; and Mitra, Joy 12329780 Cl. A61K 33/36.
United States of America, as represented by the Secretary of the Navy: See--
Chapman, Aaron Elizabeth; Christine, Ian McLean; Gilland, IV, Wilmot Singleton; Smith, Hunter Joseph; Powell, Lucas Duane; Cavaroc, Peyton; Votapka, Kevin Paul; Tolliver, Laura Catherine; and Dissington, Maxwell Thomas 12334691 Cl. H01R 25/14.
Harrison, Joel T.; and Gupta, Mool C. 12334360 Cl. H01L 21/477.
Johnson, Nicholas Thomas; Civerolo, Michael Paul; and Lichtenberg, Christopher L. 12334967 Cl. H04B 1/1036.
King, Christopher D.; Courtney, Taylor Richard; Dearhart, Amanda Nolan; Love, III, Robert William; Collins, Timothy Roy; Gross, Douglas Gerald; and Mosse, Jeremiah W. 12332011 Cl. F41A 33/00.
Swanson, Paul David 12335028 Cl. H04J 13/0022.
United States of America, As Reprsented by the Secretary, Department of Health & Human Services, The: See--
Rao, Anjana; Tahiliani, Mamta; Koh, Kian Peng; Agarwal, Suneet; and Iyer, Aravind 12331346 Cl. C12Q 1/6827.
United States Postal Service: See--
Dearing, Stephen M. 12333475 Cl. G06Q 10/083.
Lee, Sr., James Edward; Luckay, Ryan M.; and Dixon, Jr., Robert E. 12330854 Cl. B65D 81/18.
UNITED TECHNOLOGIES RESEARCH CENTRE IRELAND: See--
Quartarone, Giusi; Bartosz, Lance R.; and Thibaud, Catherine 12330796 Cl. B64D 13/06.
UnitX, Inc.: See--
Wang, Boyun; Zheng, Weixiong; and Wang, Kedao 12335627 Cl. H04N 23/72.
Unity IPR ApS: See--
Palmaro, Gregory Lionel Xavier Jean 12333670 Cl. G06T 19/20.
Univation Technologies, LLC: See--
Liu, Bo; Wieliczko, Joel D.; Bafna, Ayush A.; and Abe, Daudi A. 12330362 Cl. B29C 48/14.
Universal City Studios LLC: See--
Jordan, Robert Michael; Traynor, Mark James; and Goergen, Patrick John 12333640 Cl. G06T 13/40.
Scheinberg, Jeremy Seth; Boessel, Thomas Michael; Jordan, Robert Michael; Williams, Thomas Owen; and Alcala, Modesto 12333809 Cl. G06V 20/44.
UNIVERSAL DISPLAY CORPORATION: See--
Hack, Michael; Weaver, Michael Stuart; and Brown, Julia J. 12336409 Cl. H10K 59/353.
Ji, Zhiqiang; Boudreault, Pierre-Luc T.; Shih, Wei-Chun; Yeager, Walter; and Alleyne, Bert 12331237 Cl. C09K 11/06.
Lin, Chun; and Thompson, Nicholas J. 12336427 Cl. H10K 85/6572.
Shih, Wei-Chun; Ji, Zhiqiang; Boudreault, Pierre-Luc T.; Yeager, Walter; Alleyne, Bert; Wozniak, Derek; and Fiordeliso, James 12331065 Cl. C07F 15/0033.
Universal Entertainment Corporation: See--
Haishima, Jun 12333900 Cl. G07F 17/3244.
UNIVERSAL PACK S.R.L.: See--
Donati, Pietro 12330834 Cl. B65B 9/15.
Universal Robots A/S: See--
Madsen, Emil 12330306 Cl. B25J 9/1653.
Universidad de Alicante: See--
Fullana Font, Andrés 12330342 Cl. B29B 17/02.
UNIVERSIDAD DE SANTIAGO DE CHILE: See--
Tello Reyes, Mario Cesar Gerardo; Santibańez Vargas, Alvaro Eugenio; Parra Mardonez, Mick Philippe; Paine Cabrera, Diego Enrique; Zapata Rojas, Claudia Andrea; and Garces Fernandez, Andrea Del Pilar 12329789 Cl. A61K 35/744.
UNIVERSIDAD TÉCNICA FEDERICO SANTA MARÍA: See--
Flores Bahamonde, Freddy Arturo; Ibarz Claret, Arnau; Kouro Renaer, Samir Felipe; Renaudineau, Hugues Jean-Marie; and Rivera Iunnissi, Sebastián Andre 12334833 Cl. H02M 3/33584.
UNIVERSIDADE DE COIMBRA: See--
Tavakoli, Mahmoud; Paisana, Hugo; De Almeida, Anibal T.; and Majidi, Carmel 12336115 Cl. H05K 3/246.
Universidade de Sao Paulo: See--
Bagnato, Vanderlei Salvador; Cypel, Marcelo; Keshavjee, Shafique; Waddell, Thomas Kenneth; and Galasso, Marcos Theophilo 12329149 Cl. A01N 1/143.
UNIVERSIDADE DO MINHO: See--
Cavaco Paulo, Artur Manuel; Gomes Gonçalves, Filipa Daniela; Araújo Magalhães Ribeiro, Artur Jorge; and Pereira Marinho Da Silva, Carla Manuela 12329841 Cl. A61K 8/64.
Università degli Studi di Roma “La Sapienza”: See--
Lucibello, Sabrina; and Inglese, Giovanni 12334107 Cl. G11B 11/16.
UNIVERSITAT DE LLEIDA: See--
Frechette, Luc; Barrau, Jérôme; and Vilarrubi Porta, Montserrat 12332003 Cl. F28F 3/02.
Universität der Bundeswehr München: See--
Schauer, Jannis; Dollinger, Günther; Ruser, Heinrich; Huang, Yuanhui; Ntziachristos, Vasilis; Wieser, Hans Peter; and Parodi, Katia 12329990 Cl. A61N 5/1071.
Universität Stuttgart: See--
Derwenskus, Felix; Schmid-Staiger, Ulrike; and Bringmann, Christian 12331025 Cl. C07D 303/32.
UNIVERSITÉ DE GENVE: See--
Jordan, Olivier; Patrulea, Viorica; Borchard, Gerrit; Ha Gan, Bee; and Reymond, Jean-Louis 12329822 Cl. A61K 47/61.
Université Paris-Saclay, The: See--
Hatchwell, Eli; Eis, Peggy S.; Smith, III, Edward B.; and Taoufik, Yassine 12331357 Cl. C12Q 1/6883.
Universiteit Antwerpen: See--
Cammue, Bruno; Thevissen, Karin; De Cremer, Kaat; and Cos, Paul 12329743 Cl. A61K 31/4164.
UNIVERSITEIT GENT: See--
Giannoulis, Spilios; Jabandzic, Irfan; and Moerman, Ingrid 12335773 Cl. H04W 28/0268.
Universiteit Hasselt: See--
Kuang, Yinghuan; Aernouts, Tom; Song, Wenya; and Lammar, Stijn 12334276 Cl. H01G 9/0036.
University Health Network: See--
Bagnato, Vanderlei Salvador; Cypel, Marcelo; Keshavjee, Shafique; Waddell, Thomas Kenneth; and Galasso, Marcos Theophilo 12329149 Cl. A01N 1/143.
University of Akron, The: See--
Dhinojwala, Ali; and Singla, Saranshu 12330187 Cl. B05D 3/002.
University of Cape Town: See--
Boje, Edward Sidney; and Hardy, Jason Andrew 12334728 Cl. H02J 13/00022.
Patel, Amir; Fisher, Callen; Clark, Liam James; and Teversham, James 12332133 Cl. G01L 5/16.
University of Central Florida Research Foundation, Inc.: See--
Karim, Nazmul; Rahnavard, Nazanin; Khalid, Umar; and Chen, Chen 12334116 Cl. G11B 27/031.
University of Chicago, The: See--
Jonas, Eric 12334194 Cl. G16C 20/30.
Zheng, Jiyuan; Guha, Supratik; and Campbell, Joe C. 12336323 Cl. H10F 77/959.
University of Delaware: See--
Yan, Yushan; and Setzler, Brian 12334611 Cl. H01M 8/0618.
University of Florida Research Foundation, Inc.: See--
Masna, Naren Vikram Raj; Bhunia, Swarup; Mandal, Soumyajit; Bhuniaroy, Anamika; and Kalavakonda, Rohan Reddy 12329216 Cl. A41D 13/1192.
UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INCORPORATED: See--
Karamyan, Vardan T.; Trippier, Paul; Ostrov, David A.; Abbruscato, Tom; and Jayaraman, Srinidhi 12331333 Cl. C12N 9/6416.
University of Hong Kong, The: See--
Hui, Shu Yuen Ron; and Yang, Yun 12334748 Cl. H02J 50/12.
University of Houston System: See--
Hourani, Monzer A.; Ren, Zhifeng; and Yu, Luo 12330107 Cl. B01D 46/4263.
University of Kansas: See--
Picking, Wendy L.; and Picking, William D. 12331085 Cl. C07K 14/28.
University of Maryland, Baltimore: See--
Sajadi, Mohammad; Lewis, George K.; DeVico, Anthony; Kim, Dongkyoon; and Cavet, Guy 12331105 Cl. C07K 16/1063.
University of Maryland, College Park: See--
Lucas, Andrew; Tran, Minh; Ehrenberg, Adam E.; Guo, Andrew Y.; Deshpande, Abhinav; Gorshkov, Alexey Vyacheslavovich; Gong, Zhexuan; Chen, Chi-Fang; and Hong, Yifan 12333381 Cl. G06N 10/20.
University of Massachusetts: See--
Yang, Jianhua; Xia, Qiangfei; and Jiang, Hao 12333275 Cl. G06F 7/588.
University of Melbourne, The: See--
Heron, Sarah Elizabeth; Dibbens, Leanne Michelle; Berkovic, Samuel Frank; Scheffer, Ingrid Eileen; and Mulley, John Charles 12331358 Cl. C12Q 1/6883.
University of Miami: See--
Kashem, Rashed 12329453 Cl. A61B 3/024.
University of Mississippi Medical Center, The: See--
Summar, Marshall L.; Barr, Frederick E.; and Majumdar, Suvankar 12329732 Cl. A61K 31/198.
UNIVERSITY OF NORTH TEXAS: See--
Berman, Diana; Shevchenko, Elena V.; and Guha, Supratik 12331394 Cl. C23C 16/045.
University of Notre Dame du Lac: See--
Hatami, Homayoon; Mitchell, David G.; Costello, Daniel; and Fuja, Thomas 12334954 Cl. H03M 13/1125.
University of Otago: See--
Reynolds, John Noble James; Tan, Eng Wui; Hyland, Brian Ian; Jameson, Guy Nicholas Louis; Myint, Maung Mo Aung; Mackay, Sean Marshall; and Wickens, Jeffery Russell 12329815 Cl. A61K 41/0028.
University of Pittsburgh—Of the Commonwealth System of Higher Education: See--
Chung, Timothy K.; and Vorp, David A. 12329546 Cl. A61B 5/7267.
Crapo, Peter Maughan; Shah, Devang Vijay; Badylak, Stephen F.; Hussey, George; Pineda Molina, Catalina; and Sicari, Brian 12329883 Cl. A61L 27/54.
University of Pittsburgh—Of the Commonweatlh System of Higher Education: See--
DiLeo, Morgan V.; Little, Steven R.; and Schuman, Joel S. 12329730 Cl. A61K 31/164.
University of Rhode Island Board of Trustees: See--
Oxley, Jimmie; Smith, James L.; Ichiyama, Robert; and Kagan, Gerald 12330006 Cl. A62D 3/33.
UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING: See--
Yang, Renshu; Ding, Chenxi; Gong, Min; Wang, Desheng; He, Songlin; Xiao, Chenglong; You, Shuai; and Chen, Wen 12332038 Cl. F42D 1/08.
UNIVERSITY OF SOUTH CAROLINA: See--
Srivastava, Biplav; Pallagani, Vishal; Chandrasekaran Venka, Revathy; Khandelwal, Vedant; and Lakkaraju, Kausik 12332873 Cl. G06F 16/2365.
UNIVERSITY OF SOUTH FLORIDA: See--
Baker, Bill J.; Shaw, Lindsey N.; Shilling, Andrew Jason; Bory, Alexandre Jean; Allen (Adams), Jessie; Amsler, Jr., Charles Dunkle; and McClintock, James Bruce 12329737 Cl. A61K 31/343.
Totary-Jain, Hana; and Mong, Ezinne Frances 12331362 Cl. C12Q 1/6886.
University of Southern California: See--
Li, Tian-Yi; Djurovich, Peter I.; and Thompson, Mark E. 12331064 Cl. C07F 1/00.
Wong, Alex K.; and Hong, Young-Kwon 12329852 Cl. A61K 9/0024.
University of Tennessee Research Foundation: See--
Miller, Duane; Pfeffer, Lawrence M.; He, Yali; and Ganguly, Debolina 12329755 Cl. A61K 31/4995.
University of Tokyo, The: See--
Shin, Shik; Taniuchi, Toshiyuki; Imai, Shinichi; Fujiura, Kazuo; and Furukawa, Yasunori 12332196 Cl. G01N 23/227.
Someya, Takao; and Kawashima, Ikue 12333851 Cl. G06V 40/145.
UNIVERSITY OF TSUKUBA: See--
Tsuchida, Hikaru; and Nishide, Takashi 12335376 Cl. H04L 9/085.
UNIVERSITY OF UTAH RESEARCH FOUNDATION: See--
Kubanek, Jan 12329566 Cl. A61B 8/0808.
University of Virginia Patent Foundation: See--
Haj-Hariri, Hossein; and Monazami, Reza 12332000 Cl. F28D 15/04.
Rohde, Gustavo; Southerland, Andrew M.; Zhuang, Yan; McDonald, Mark; Uribe, Omar; Aldridge, Chad M.; and Hassan, Mohamed Abul 12334221 Cl. G16H 50/20.
Skadron, Kevin; and Lenjani, Marzieh 12334183 Cl. G11C 7/1039.
Zheng, Jiyuan; Guha, Supratik; and Campbell, Joe C. 12336323 Cl. H10F 77/959.
University of Washington: See--
Stayton, Patrick S.; Ypma, Menko P.; Chiarelli, Peter A.; Park, Joshua Sang Hun; Ellenbogen, Richard G.; Xu, Julia Mengyun; Mourad, Pierre D.; Lee, Donghoon; Convertine, Anthony; and Kievit, Forrest M. 12329773 Cl. A61K 31/765.
UNIVERSITY OF WASHINGTON & VICIS IP, LLC: See--
Reinhall, Per; Leonard, Paul C.; Glover, Travis Edward; Stone, Andre Hunter Paggao; Alferness, Anton Perry; Fischer, Kurt V.; Kaplan, Gary S.; Dardis, II, John T.; and Browd, Samuel R. 12329226 Cl. A42B 3/063.
University of Waterloo: See--
Bonakdar, Ali; Liravi, Farzad; Toyserkani, Ehsan; Ali, Usman; Chenouri, Shoja'edin; and Mahmoodkhani, Yahya 12330217 Cl. B22F 10/85.
Uniwersytet Jagiellonski: See--
Kaminski, Krzysztof; Abram, Michal; Jakubiec, Marcin; Rapacz, Anna; Mogilski, Szczepan; Latacz, Gniewomir; and Struga, Marta 12331019 Cl. C07D 207/27.
Unno, Hiroto; Fukuda, Masahiro; Fujimoto, Naoki; and Nagata, Tatsuo, to NIPPON STEEL CHEMICAL & MATERIAL CO., LTD. Ni-plated steel foil for nickel-hydrogen secondary battery current collector, nickel-hydrogen secondary battery current collector, and nickel-hydrogen secondary battery 12334563 Cl. H01M 4/667.
Uno, Tomohiro; Oyamada, Tetsuya; Oda, Daizo; Shimomura, Kota; Yamaguchi, Tadashi; and NIPPON MICROMETAL CORPORATION, to NIPPON STEEL Chemical & Material Co., Ltd. Copper bonding wire 12334467 Cl. H01L 24/45.
Unrau, Chad: See--
Demeter, Ethan L.; Connor, Jr., Michael James; Unrau, Chad; and McDonald, Brian M. 12330121 Cl. B01D 67/0088.
Unterborn, Erik: See--
Dokania, Rajeev Kumar; Mukadam, Mustansir Yunus; Unterborn, Erik; Kolar, Pramod; Mathuriya, Amrita; Olaosebikan, Debo; Gosavi, Tanay; Sato, Noriyuki; and Manipatruni, Sasikanth 12334127 Cl. G11C 11/221.
UNTHINK, INC.: See--
Mani, Mary 12333594 Cl. G06Q 30/0643.
Unwin, Neil; and Hurink, Frank, to YOKOGAWA ELECTRIC CORPORATION Edge controller apparatus and corresponding systems, method, and computer program 12335343 Cl. H04L 67/12.
Uozumi, Toshiya: See--
Kono, Hiroyuki; Masuyama, Takahiro; Marui, Shinta; and Uozumi, Toshiya 12331138 Cl. C08F 110/06.
Upadhyay, Mrityunjay: See--
Bhagi, Sri Karthik; Gadhave, Pratima Laxman; dos Reis Mansano, Marcelo; Upadhyay, Mrityunjay; Bedhapudi, Purnachandra Sekhar; and Ramkumar, Shyam Sundar 12333007 Cl. G06F 21/554.
Upadhyay, Ram Kumar: See--
Sinha, Shatil; Bollacker, James Duvall; and Upadhyay, Ram Kumar 12330090 Cl. B01D 19/02.
Upadhyay, Sudhir: See--
Behera, Monik Raj; Upadhyay, Sudhir; Otter, Rob; and Shetty, Suresh 12333400 Cl. G06N 20/20.
Upadhyaya, Ankit: See--
Bidkar, Prashant Anna; Upadhyaya, Ankit; Khare, Prashant; Tamuly, Suman Boroi; Singh, Harmeet; and Indrakanti, Bharat 12335734 Cl. H04W 12/122.
Upadhyaya, Varun; and Tiruvamattur, Venkateswarlu Ramaswamy, to TEXAS INSTRUMENTS INCORPORATED Low-dropout voltage regulator with split-buffer stage 12332674 Cl. G05F 1/575.
Updyke, John R.; to Hilliard Corporation, The Spring and damper assembly for a centrifugal clutch in a continuously variable transmission 12331798 Cl. F16D 43/18.
Upguard, Inc.: See--
Sabbatini, Jacopo; Pollock, Gregory Ford; Hendren, Jonathan David; Bradbury, Daniel; Baukes, Michael Franz; Cossell, Stephen; and Lloyd, Justin Glenn 12333038 Cl. G06F 21/6218.
UPL LTD: See--
Panchal, Digish Manubhai; Desai, Jigar Kantilal; Shroff, Jaidev Rajnikant; and Shroff, Vikram Rajnikant 12331028 Cl. C07D 401/04.
UPM-KYMMENE CORPORATION: See--
Leonardi, Giuliano; Pietarinen, Suvi; and Hübsch, Christian 12329725 Cl. A61K 31/09.
Upton, Daniel; to TOYOTA MOTOR ENGINEERING & MANUFACTURING NORTH AMERICA, INC. Apparatus and method for assembly line charging of vehicle batteries 12330525 Cl. B60L 53/66.
Urabe, Yoshio: See--
Iwai, Takashi; Urabe, Yoshio; and Takata, Tomohumi 12335998 Cl. H04W 74/006.
Murakami, Yutaka; Urabe, Yoshio; Kimura, Tomohiro; and Ouchi, Mikihiro 12335079 Cl. H04L 27/261.
Urasawa, Kenichi: See--
Nakao, Tomoaki; Hasegawa, Yukie; Harada, Kenji; and Urasawa, Kenichi 12333883 Cl. G07C 9/38.
Urata, Hideyuki: See--
Narumiya, Akinori; and Urata, Hideyuki 12332395 Cl. G01V 1/01.
Urban, David: See--
Gilson, Ross; Francisco, Mark; and Urban, David 12335992 Cl. H04W 72/542.
Urena Pimentel, Katherine: See--
Poteet, Steven; Martz, Thomas; D'Alessio, Bradford; McConnell, David C.; Pujar, Vijay V.; Urena Pimentel, Katherine; and Rexwinkle, Irene 12332180 Cl. G01N 21/78.
Urey, Hakan; Skolianos, Georgios; Ulusoy, Erdem; Yaralioglu, Goksen G.; and Chan, Trevor, to CY VISION INC. Holographic head-up display system 12332434 Cl. G02B 27/0101.
Uribe, Felipe: See--
Salem, Ardeshir; and Uribe, Felipe D1080071 Cl. D28‑66.
Uribe, Omar: See--
Rohde, Gustavo; Southerland, Andrew M.; Zhuang, Yan; McDonald, Mark; Uribe, Omar; Aldridge, Chad M.; and Hassan, Mohamed Abul 12334221 Cl. G16H 50/20.
Uribe Plaza, Jose Ignacio; to PLASTIC REPAIR SYSTEM 2011, S.L. Automatic machine for repairing plastic sheets 12330383 Cl. B29C 73/04.
Uridil, Morgan; and Roszkowiak, Amanda, to Medline Industries, LP Fecal management applicator and assembly 12329676 Cl. A61F 5/451.
Urity, Mounica: See--
Romero, Jr., Jose L.; Buentello, Andre Rene; Byrd, Matthew Robert; Urity, Mounica; Rahim, Sayeef; Chalmers, Timothy Blair; Black, Robert Lee; and Philbrick, Ashley Raine 12333656 Cl. G06T 19/006.
Urklinski, Erik Adam: See--
Segelmark, Lukas; Löf, Anton; and Urklinski, Erik Adam 12335655 Cl. H04N 5/33.
Urman, Roy: See--
Govari, Assaf; Altmann, Andres Claudio; Urman, Roy; Ziv-Ari, Morris; Zar, Lior; Tran, Brandon Andrew; Meitav, Shaked; and Cohen-Sacomsky, Hanna 12329578 Cl. A61B 8/463.
US Conec Ltd.: See--
Higley, Jason; and Childers, Darrell R. 12332486 Cl. G02B 6/3871.
USA AS REPRESENTED BY THE SECRETARY OF THE ARMY ON BEHALF OF USAMRMC: See--
Alocilja, Evangelyn C.; Cloutier, Barbara Christine; and Anderson, Michael J. 12332238 Cl. G01N 33/5434.
Ushanov, Artem; Iuskevich, Ilia; Dedenis, Laurent; Bell, Serg; Protasov, Stanislav; and Constructor Technology AG, to Constructor Education and Research Genossenschaft Systems and methods for conducting a synchronized student-lecturer session in e-learning server 12333957 Cl. G09B 5/02.
Ushigami, Yoshiyuki: See--
Yamamoto, Shinji; Ushigami, Yoshiyuki; and Takatani, Shinsuke 12331377 Cl. C21D 9/46.
Ushio, Kentaro: See--
Shibuya, Masaki; Oki, Takuya; Yamamoto, Kyohei; Arimoto, Shoichi; Ito, Ryuichi; and Ushio, Kentaro 12334290 Cl. H01H 47/22.
UST Global (Singapore) Pte. Limited: See--
Krishnamurthy, Dasaprakash; Valle, José Pablo Romero; and Hernández, Álvaro Hernández 12333839 Cl. G06V 30/19173.
Ustach, Thomas; to McCue Corporation Impact monitoring system 12333943 Cl. G08G 1/164.
Usui, Naoki: See--
Nishio, Tsuyoshi; Anezaki, Masahiro; Yano, Takanao; Hinata, Makoto; Muto, Kanji; and Usui, Naoki 12330552 Cl. B60Q 1/2692.
Usui, Ryosuke: See--
Akiyama, Yuto; Usui, Ryosuke; and Yanai, Ken 12334235 Cl. H01C 7/112.
USWE Sports AB: See--
Gustafsson, Jörgen Gustav 12329269 Cl. A45F 3/04.
UT-Battelle, LLC: See--
Brahlek, Matthew J.; Dumitrescu, Eugene; Halasz, Gabor; Hua, Chengyun; and Lawrie, Benjamin J. 12333384 Cl. G06N 10/40.
Sharma, Jaswinder K. 12330950 Cl. C01B 33/18.
Utilization of Carbon Dioxide Institute Co., Ltd.: See--
Yukawa, Hideaki; and Ohtani, Naoto 12331300 Cl. C12N 15/74.
Utopus Insights, Inc.: See--
Wang, Yajuan; Solymosi, Gabor; Szarka, Ede; and Kim, Younghun 12333222 Cl. G06F 30/20.
Utschig-Samuels, Stephen: See--
Polignone, Donato; and Utschig-Samuels, Stephen 12331270 Cl. C11D 7/5031.
Utsunomiya, Shohhei; and Yoshida, Eiichiro, to Ricoh Company, Ltd. Evaluation assisting system, information processing device, evaluation assisting method, and recording medium 12335061 Cl. H04L 12/1831.
Uttecht, Cathleen M.: See--
Qin, Jian; Calewarts, Deborah J.; Colman, Charles W.; Waldroup, Donald E.; Uttecht, Cathleen M.; and Wallace, Peter 12331465 Cl. D21H 15/10.
UUCOM CO., LTD: See--
Choi, Su Han 12335943 Cl. H04W 72/1268.
UXStream AB: See--
Eriksson, Thomas 12335738 Cl. H04W 12/37.
Uy, William L.: See--
Vilale, Rodimir N.; Alatorre Mercado, Raymundo; Uy, William L.; and Kurwa, Murad M. 12332131 Cl. G01L 1/26.
Uygun, Mustafa Korkut; Bruinsma, Bote G.; and Izamis, Maria-Louisa, to General Hospital Corporation, The Devices and methods to improve and assess viability of human livers 12329150 Cl. A01N 1/143.
Uzgören, Eray: See--
Albright, Ronald Peter; Bal, Kursat; Banine, Vadim Yevgenyevich Joseph; Bruls, Richard Joseph; De Vries, Sjoerd Frans; Frijns, Olav Waldemar Vladimir; Huang, Yang-Shan; Huang, Zhuangxiong; Jacobs, Johannes Henricus Wilhelmus; Moors, Johannes Hubertus Josephina; Nenchev, Georgi Nenchev; Nikipelov, Andrey; Raasveld, Thomas Maarten; Ranjan, Manish; Te Sligte, Edwin; Umstadter, Karl Robert; Uzgören, Eray; Van De Kerkhof, Marcus Adrianus; and Yaghoobi, Parham 12332570 Cl. G03F 7/70033.