US 12,331,238 B2
Semiconductor nanoparticle aggregate, semiconductor nanoparticle aggregate dispersion liquid, semiconductor nanoparticle aggregate composition, and semiconductor nanoparticle aggregate cured film
Naoki Umeda, Tosu (JP); Takafumi Moriyama, Tosu (JP); Hirokazu Sasaki, Tosu (JP); and Keisuke Matsuura, Tosu (JP)
Assigned to SHOEI CHEMICAL INC., Tokyo (JP)
Appl. No. 17/757,175
Filed by SHOEI CHEMICAL INC., Tokyo (JP)
PCT Filed Dec. 4, 2020, PCT No. PCT/JP2020/045283
§ 371(c)(1), (2) Date Jun. 10, 2022,
PCT Pub. No. WO2021/124935, PCT Pub. Date Jun. 24, 2021.
Claims priority of application No. 2019-227246 (JP), filed on Dec. 17, 2019.
Prior Publication US 2023/0028095 A1, Jan. 26, 2023
Int. Cl. C09K 11/88 (2006.01); B82Y 20/00 (2011.01); B82Y 40/00 (2011.01); C09K 11/02 (2006.01); C09K 11/08 (2006.01); C09K 11/70 (2006.01)
CPC C09K 11/883 (2013.01) [B82Y 20/00 (2013.01); B82Y 40/00 (2013.01); C09K 11/02 (2013.01); C09K 11/0883 (2013.01); C09K 11/703 (2013.01); C01P 2004/50 (2013.01); C01P 2004/64 (2013.01); C01P 2004/80 (2013.01)] 11 Claims
 
1. A semiconductor nanoparticle aggregate that is an aggregate of core/shell type semiconductor nanoparticles comprising a core comprising In and P and a shell comprising one or more layers, wherein
a peak wavelength (λ1MAX) of an emission spectrum (λ1) when the semiconductor nanoparticle aggregate is excited with excitation light of 450 nm in a state where the semiconductor nanoparticle aggregate is dispersed in a dispersion medium is from 515 nm to 535 nm and a full width at half maximum (FWHM1) of the emission spectrum (λ1) is 43 nm or less,
an emission spectrum (λ2) from each particle obtained by exciting the semiconductor nanoparticles constituting the semiconductor nanoparticle aggregate with excitation light of 445 nm satisfies all of following requirements (1) to (3):
(1) an average value of a full width at half maximum (FWHM2) of the emission spectrum (λ2) is 15 nm or more,
(2) a standard deviation (SD1) of a peak wavelength (λ2MAX) of the emission spectrum (λ2) is 12 nm or less, and
(3) a standard deviation (SD2) of the full width at half maximum (FWHM2) of the emission spectrum (λ2) is 2 nm or more.