US 12,332,352 B2
Detector for identifying at least one material property
Friedrich Schick, Ludwigshafen (DE); Peter Schillen, Ludwigshafen (DE); Patrick Schindler, Ludwigshafen (DE); Andre Schmidt, Ludwigshafen (DE); Michael Eberspach, Ludwigshafen (DE); Christian Lennartz, Ludwigshafen (DE); Robert Send, Karlsruhe (DE); Lars Diesselberg, Karlsruhe (DE); Heiko Hengen, Steinweiler (DE); Ingmar Bruder, Ludwigshafen (DE); Jakob Unger, Ludwigshafen (DE); and Christian Bonsignore, Ludwigshafen (DE)
Assigned to TRINAMIX GMBH, Ludwigshafen am Rhein (DE)
Filed by trinamix GmbH, Ludwigshafen am Rhein (DE)
Filed on Jun. 14, 2024, as Appl. No. 18/743,352.
Application 18/743,352 is a continuation of application No. 18/425,144, filed on Jan. 29, 2024.
Application 18/425,144 is a continuation of application No. 17/439,492, granted, now 11,947,013, issued on Apr. 2, 2024, previously published as PCT/EP2020/056759, filed on Mar. 13, 2020.
Claims priority of application No. 19163250 (EP), filed on Mar. 15, 2019.
Prior Publication US 2024/0377533 A1, Nov. 14, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G01S 17/46 (2006.01); G01B 11/22 (2006.01); G01C 21/16 (2006.01); G01S 17/66 (2006.01); G06T 5/20 (2006.01); G06T 5/70 (2024.01); G06T 7/20 (2017.01); G06T 7/521 (2017.01); G06T 7/73 (2017.01); G06V 10/145 (2022.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); H04N 23/56 (2023.01); H04N 23/74 (2023.01)
CPC G01S 17/46 (2013.01) [G01B 11/22 (2013.01); G01C 21/16 (2013.01); G01S 17/66 (2013.01); G06T 5/20 (2013.01); G06T 5/70 (2024.01); G06T 7/20 (2013.01); G06T 7/521 (2017.01); G06T 7/73 (2017.01); G06V 10/145 (2022.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); H04N 23/56 (2023.01); H04N 23/74 (2023.01)] 30 Claims
OG exemplary drawing
 
1. A detector for identifying at least one material property m comprising
at least one light projector, wherein the light projector is configured for generating at least one illumination pattern for illumination of the object, wherein the illumination pattern comprises at least one pattern selected from the group consisting of: at least one point pattern; a pseudo-random point pattern; a random point pattern or a quasi-random pattern; at least one Sobol pattern; at least one quasiperiodic pattern; at least one pattern comprising at least one pre-known feature; at least one regular pattern; at least one triangular pattern; at least one hexagonal pattern; at least one rectangular pattern; at least one pattern comprising convex uniform tilings; at least one line pattern comprising at least one line;
at least one line pattern comprising at least two lines; and at least one line pattern comprising parallel or crossing lines;
at least one camera comprising a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein the camera is configured for recording at least one reflection image of a light beam originating from at least one object; and
at least one processor configured for determining the material property by evaluation of at least one beam profile of the reflection image,
wherein the processor is configured for determining at least one material feature φ2m by applying at least one material dependent image filter Φ2 to the reflection image, wherein the material dependent image filter is at least one filter selected from the group consisting of: a luminance filter; a spot shape filter; a grey-level-occurrence-based contrast filter; a grey-level-occurrence-based energy filter; a grey-level-occurrence-based homogeneity filter; a grey-level-occurrence-based dissimilarity filter; a Law's energy filter; a threshold area filter; and a linear combination thereof;
wherein the processor is configured for determining the material property m by evaluating the material feature φ2m.