LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 8th DAY OF July, 2025
AND TO WHOM
REEXAMINATION CERTIFICATES AND PATENT TRIAL AND APPEAL BOARD CERTIFICATES WERE ISSUED
DURING THE WEEK BEGINNING THE 30th DAY OF June, 2025.
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

UAB 360 IT: See--
Rafanavičius, Justas; and Ševčenko, Aleksandr 12353546 Cl. G06F 21/56.
Übelacker, Roland; and Krivenkov, Konstantin, to GRAMMER AG Vehicle seat and method for operating a vehicle seat 12351089 Cl. B60N 2/565.
Uber Technologies, Inc.: See--
Voronel, Gary; Barnett, Donald; Wantland, Timothy; Mokady, Ran; and Moradganjeh, Amid 12352582 Cl. G01C 21/3407.
Uchibori, Kenji: See--
Kosuge, Hiroyuki; Shimada, Chiaki; Uchibori, Kenji; Uemura, Naoki; Hara, Shun; Kodaira, Hirohisa; and Maeda, Riku 12351413 Cl. B65H 31/02.
Uchida, Hiroaki: See--
Toda, Narihiro; Ota, Yusuke; Doi, Fuminao; Meguro, Masaki; Hayakawa, Ichiro; Ashida, Shinji; Masuda, Takeshi; Nakada, Takashi; Iwamoto, Mitsuhiro; Harada, Naoya; Terauchi, Tomoko; Okajima, Daisuke; Nakamura, Kensuke; Uchida, Hiroaki; and Hamada, Hirofumi 12350344 Cl. A61K 35/00.
Uchida, Kengo: See--
Masunishi, Kei; Tomizawa, Yasushi; Ogawa, Etsuji; Gando, Ryunosuke; Kaji, Shiori; Hiraga, Hiroki; Miyazaki, Fumito; Ono, Daiki; and Uchida, Kengo 12352775 Cl. G01P 15/093.
Uchida, Kenta; Mizutaki, Yusuke; and Uchida, Miki, to SEIKO EPSON CORPORATION Recording method and recording apparatus 12351723 Cl. C09D 11/38.
Uchida, Kiyotaka: See--
Takayama, Kazuaki; Hasebe, Yutaka; Takahashi, Masaki; Ogawa, Chihaya; Uchida, Kiyotaka; Ikemoto, Yoshiyuki; Kawasaki, Eishi; and Murakami, Tetsuo 12352707 Cl. G01N 23/10.
Uchida, Miki: See--
Uchida, Kenta; Mizutaki, Yusuke; and Uchida, Miki 12351723 Cl. C09D 11/38.
Uchida, Takayuki; Yamashita, Yosuke; Takayama, Shintaro; Iida, Kazuaki; Yamashita, Masaharu; Hasegawa, Kazuma; Fujita, Yuji; Abe, Kenichi; Kajisawa, Yuuta; Nagashima, Yugo; DENSO CORPORATION; and TOYOTA JIDOSHA KABUSHIKI KAISHA, to JTEKT CORPORATION Steering control device 12351252 Cl. B62D 5/0469.
Uchida, Tsuneo: See--
Kuzuhara, Satoshi; and Uchida, Tsuneo 12352940 Cl. G02B 17/0856.
Uchida, Yuki: See--
Fujiwara, Ryotaro; Nakanishi, Hirotada; Kodama, Fuhito; Uchida, Yuki; Komamine, Satoshi; Okada, Yoshinori; and Hirano, Satoshi 12354489 Cl. G08G 5/76.
Uchiki, Ryosuke; and Ikemura, Yuuji, to Hitachi Industrial Equipment Systems Co., Ltd. Program update method for the gas compressor system 12352259 Cl. F04B 49/065.
Uchimura, Hiroyuki: See--
Ogayu, Shun; Uchimura, Hiroyuki; Saito, Hiroki; Endo, Tadamasa; and Kamei, Masayuki 12355338 Cl. H02K 9/227.
Uchimura, Jun; Kazo, Yasuyo; Funai, Shinji; and Sugegaya, Hiroki, to NEC CORPORATION Terminal device, purchase management method, and program 12354075 Cl. G06Q 20/208.
Uchiyama, Naoya; and Nakagawa, Jun, to MITSUBISHI ELECTRIC CORPORATION Programmable controller system, development support device, and recording medium 12353860 Cl. G06F 8/41.
Uckert, Wolfgang: See--
Rehm, Armin; Höpken, Uta Elisabeth; Bluhm, Julia; Uckert, Wolfgang; Kieback, Elisa; and Marino, Stephen 12351640 Cl. C07K 16/2878.
UCL BUSINESS LTD: See--
Ramalhinho, Joao; and Clarkson, Matthew J. 12350098 Cl. A61B 8/4245.
Uda, Tomohiko; Kitayama, Saeko; and Ishii, Kenyo, to KYORITSU SEIYAKU CORPORATION Method of detecting heart failure, device for detecting heart failure, sandwich immunoassay method, and combination of antibodies 12352764 Cl. G01N 33/6893.
Uddaraju, Padmanabha Chakravarthy: See--
Calder, Bradley Gene; Nilakantan, Niranjan; Srivastav, Shashwat; Wu, Jiesheng; Abbasi, Abdul Rafay; Mainali, Shane; and Uddaraju, Padmanabha Chakravarthy 12353437 Cl. G06F 16/275.
UDMTEK CO., LTD.: See--
Wang, Gi Nam; Park, Jun Pyo; Yu, Geun Ho; Han, Seung Woo; Han, Gang Hee; Jung, Min Young; and Yoo, Sang Chul 12353185 Cl. G05B 19/056.
Ueda, Airi: See--
Yamazaki, Shunpei; Watabe, Takeyoshi; Kubota, Tomohiro; Ueda, Airi; Seo, Satoshi; Ohsawa, Nobuharu; and Kubota, Yuko 12356791 Cl. H10K 50/115.
Ueda, Akihiko: See--
Segawa, Mayuka; Abe, Machiko; Ueda, Akihiko; Tanigawa, Yoshinori; and Harada, Takashi 12350744 Cl. B23B 51/00.
Ueda, Kazuki: See--
Uozumi, Yoshinobu; Miyoshi, Masaaki; and Ueda, Kazuki 12351280 Cl. B63B 34/10.
Ueda, Keiji: See--
Watanabe, Kazufumi; Takada, Atsushi; Ando, Akiyoshi; Okabe, Takatoshi; and Ueda, Keiji 12350760 Cl. B23K 35/3073.
Ueda, Koji: See--
Hattori, Akiyoshi; Ueda, Koji; Nishio, Hitoshi; and Mizoguchi, Tomohisa 12354900 Cl. H01L 21/6833.
Ueda, Kunihiro; Wada, Yoshimitsu; Hirabayashi, Hiraku; Yamawaki, Kazuma; and Umehara, Tsuyoshi, to TDK CORPORATION Sensor unit 12352830 Cl. G01R 33/0005.
Ueda, Naoyuki: See--
Yokota, Kiyohiko; Katayama, Kiyokazu; Samejima, Kanako; Kagami, Narinobu; Oba, Kouta; Ueda, Naoyuki; and Sakaguchi, Takahiro 12351765 Cl. C10G 69/126.
Ueda, Takuya: See--
Nakamura, Shinya; Ueda, Takuya; and Araki, Yukihiro 12351025 Cl. B60K 35/10.
Ueda, Teiichirou: See--
Yamawaki, Masakatsu; and Ueda, Teiichirou 12352487 Cl. F25B 7/00.
Uejima, Takanori: See--
Tsuda, Motoji; Yamaguchi, Yukiya; and Uejima, Takanori 12355473 Cl. H04B 1/0078.
Ueki, Misato; Takata, Yutaka; AUTONETWORKS TECHNOLOGIES, LTD.; and SUMITOMO WIRING SYSTEMS, LTD., to SUMITOMO ELECTRIC INDUSTRIES, LTD. Fuse element 12354822 Cl. H01H 85/055.
Ueki, Takahiro: See--
Tsukui, Isao; Okubo, Yusuke; Ueki, Takahiro; Ishibashi, Tatsuya; and Osawa, Mami 12351066 Cl. B60L 58/16.
Uekita, Masahiro; to Kabushiki Kaisha Toshiba Cutting force measurement system 12352639 Cl. G01L 1/16.
Uekubo, Masahiro; to FURUKAWA ELECTRIC CO., LTD. Heat transport device 12352502 Cl. F28D 15/04.
Uellner, Qi: See--
Nöcker, Bernd; Uellner, Qi; and Breakspear, Steven 12350360 Cl. A61K 8/4953.
Nöcker, Bernd; Uellner, Qi; Ghiasi, Fariba; Breakspear, Steven; and Bauer, Peter 12350359 Cl. A61K 8/4953.
Uemura, Naoki: See--
Kosuge, Hiroyuki; Shimada, Chiaki; Uchibori, Kenji; Uemura, Naoki; Hara, Shun; Kodaira, Hirohisa; and Maeda, Riku 12351413 Cl. B65H 31/02.
Uemura, Takuya: See--
Ikeya, Kohei; and Uemura, Takuya 12355181 Cl. H01R 13/5221.
Uemura, Yutaka; to Micron Technology, Inc. Test circuit using clock signals having mutually different frequency 12354686 Cl. G11C 29/12015.
Ueno, Masafumi: See--
Furukawa, Hiroyuki; Ueno, Masafumi; and Toridono, Chie 12354533 Cl. G09G 3/32.
Ueno, Masaya: See--
Oniduka, Toshiki; Koreeda, Shinichirou; Kamei, Toshiaki; Saitou, Hikaru; Ueno, Masaya; and Seki, Takuya 12352279 Cl. F04D 29/048.
Ueno, Shinji; to OMRON CORPORATION Traveling apparatus 12356238 Cl. H04W 28/0236.
Ueno, Yasunori; Egawa, Keisuke; Takano, Yusuke; Okada, Takehiko; Nishimura, Takuya; Noso, Terumitsu; Shirasaki, Seiichi; and Teraoka, Chisaki, to KYOCERA Document Solutions Inc. Sheet post-processing apparatus and image forming system including the apparatus 12351414 Cl. B65H 31/38.
Ueta, Yoshihiro: See--
Satoh, Eiji; and Ueta, Yoshihiro 12356788 Cl. H10K 50/115.
Ueyama, Naoki: See--
Takehara, Daiki; and Ueyama, Naoki 12354429 Cl. G07D 7/12.
Ugarte, Ander; to TUDOR WATCH U.S.A., LLC Watch D1082587 Cl. D10‑126.
Uhling, Thomas F.; and Barnes, Keith Wayne, to ITRON, INC. Determining network reliability using message success rates 12355648 Cl. H04L 43/0847.
Uhlman, Cole: See--
Khan, Mohammad Nasim Imtiaz; Wakchaure, Yogesh B.; Hoffman, Eric; Mielke, Neal; Bahirat, Shirish; Uhlman, Cole; Zhang, Ye; and Ramalingam, Anand 12353752 Cl. G06F 3/0655.
Uhm, Junwhon: See--
Yang, Hyunmo; Uhm, Junwhon; Lee, Jungkeun; Park, Yonghyun; Jeong, Junmyeong; and Hong, Myeongjae 12356548 Cl. H05K 1/147.
Uhm, Sae Hoon; Lee, Yun Seong; Sohn, Yeong Hoon; Park, Se Hong; and Kim, Ji Hoon, to EN2CORE TECHNOLOGY INC. Plasma generating device 12354838 Cl. H01J 37/3211.
Uhri, Patrick; Schlienger, Rolf; Hermann, Markus; and Gisler, Stefan, to DePuy Synthes Products, Inc. Powered surgical tool with an oscillating saw blade 12349925 Cl. A61B 17/142.
UiPath, Inc.: See--
Grigore, Mircea 12353857 Cl. G06F 8/38.
Shrivastava, Shashank; Chodisetti, Rajiv; Stanciu, Vlad; Kakumani, Raja Charu Vikram; and Popescu, Petre 12353864 Cl. G06F 8/61.
Uitto, Mikko: See--
Heikkinen, Antti; and Uitto, Mikko 12355833 Cl. H04L 65/752.
Ujino, Satoshi: See--
Shimozawa, Ryota; Ujino, Satoshi; and Sato, Koji D1082875 Cl. D15‑144.
UK PODS LIMITED: See--
Crawford, Palkesh D. 12349803 Cl. A47C 27/086.
Uka, Mahir: See--
Sharma, Gaurav; Hanagami, Nathan F.; Uka, Mahir; and Wolf, Benedikt 12353231 Cl. G05F 1/575.
Ukibune, Masanori: See--
Hisayama, Kazushi; Ukibune, Masanori; Okamoto, Tetsuya; Ohno, Masao; and Chen, Kebi 12352481 Cl. F25B 49/02.
Ukigaya, Masayuki: See--
Inoue, Daisuke; Hirose, Mitsuaki; Kitagawa, Yohichi; Ukigaya, Masayuki; Komito, Kenji; and Yamada, Hiroshi 12353166 Cl. G03G 9/081.
Ukil, Arijit; Bandyopadhyay, Soma; and Pal, Arpan, to TATA CONSULTANCY SERVICES LIMITED System and method for mitigating generalization loss in deep neural network for time series classification 12353980 Cl. G06N 3/047.
Ukpai, Gideon: See--
Rubinsky, Boris; Nastase, Gabriel; and Ukpai, Gideon 12349672 Cl. A01N 1/162.
Ukrainczyk, Ljerka: See--
Pirayesh, Hamidreza; Reiman, Kevin Barry; and Ukrainczyk, Ljerka 12350904 Cl. B32B 17/06.
Ukuma, Akio: See--
Ogata, Nobuaki; Ukuma, Akio; and Shibata, Sonomi 12351954 Cl. D04B 1/20.
UL LLC: See--
Lee, Young Min; and Sinha, Sudhi Ranjan 12354117 Cl. G06Q 30/018.
Uldry, Laurent Renaud: See--
Friedrich, Michael; Miran Farkas, Romain Michel; Allemann, Philippe; Geffrotin, Didier Christian; Marcel Boch, Nicolas Paul; Lieberherr, Christopher Emmanuel; Uldry, Laurent Renaud; and Pirkl, Werner 12349998 Cl. A61B 34/37.
Ulitzka, Tim; Tillmann, Wolfgang; and Dahl, Leif, to AB Sandvik Coromant Method of making a tool comprising carbide and steel by brazing 12350752 Cl. B23K 1/008.
Ulmer-Moll, Anne-Marie: See--
Siaud, Isabelle; and Ulmer-Moll, Anne-Marie 12355560 Cl. H04L 1/0013.
Siaud, Isabelle; and Ulmer-Moll, Anne-Marie 12356436 Cl. H04W 72/51.
Ulrich, Drew: See--
Droz, Pierre-Yves; Shepard, Ralph H.; Tazzoli, Augusto; Hutchison, David; Schleuning, David; Golshan, Nathaniel; Quillin, Nathaniel; Abo, Andrew; Onal, Caner; Tom, Michael; Lockwood, Robert; Kwong, Kelvin; Li, Daiwei; Ulrich, Drew; Ellgas, Simon; Kakani, Chandra; Eppard, Erin; Lenius, Samuel; Andrade, Justin; and Dunphy, James 12352900 Cl. G01S 7/484.
ULTRA CLEAN HOLDINGS, INC.: See--
Pradun, James; Ramacciotti, Michael; Rodriguez, Genaro; Camyre, Alan; and Hylbert, Jon 12352633 Cl. G01K 1/143.
Umakoshi, Ryosuke: See--
Iwamoto, Mikihiro; and Umakoshi, Ryosuke 12352438 Cl. F23L 5/02.
Umehara, Tsuyoshi: See--
Ueda, Kunihiro; Wada, Yoshimitsu; Hirabayashi, Hiraku; Yamawaki, Kazuma; and Umehara, Tsuyoshi 12352830 Cl. G01R 33/0005.
Umemoto, Kouichi: See--
Kimoto, Norihiro; Umemoto, Kouichi; and Kashiwagi, Takeru 12351464 Cl. C01B 32/28.
Umemura, Takumi: See--
Watanabe, Tetsu; Iwaya, Ryuji; Kuwahara, Masahiro; Umemura, Takumi; and Shimada, Yosuke 12350568 Cl. A63B 69/3623.
Umesawa, Kentaro: See--
Yamazaki, Atsushi; Umesawa, Kentaro; Yamada, Naoko; and Kageyama, Yuta 12353748 Cl. G06F 3/0647.
UMICORE: See--
Kim, Dae-Hyun; Paulsen, Jens; Lambrighs, Kasper; De Palma, Randy; and Zhu, Liang 12351477 Cl. C01G 53/50.
UMICORE AG & CO. KG: See--
Born, Dirk; Wiser, Artur; and Zeuner, Stefan 12350657 Cl. B01J 35/58.
Ummalaneni, Ritwik: See--
Alvarez, Jeffery Byron; Linard, Nicolas; Basafa, Ehsan; Ummalaneni, Ritwik; Fayad, Jad; Noonan, David Paul; Wu, Victoria Cheng-Tan; and Mago, Jesus 12349995 Cl. A61B 34/30.
Unagami, Yuji; Maeda, Manabu; Haga, Tomoyuki; Matsushima, Hideki; and Anzai, Jun, to PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA Verification method, verification apparatus, and storage medium including program stored therein 12355896 Cl. H04L 9/3247.
Unal, Erol: See--
Morrison, Mark; Vanderslice, Jason; Zhao, Jingjie; and Unal, Erol 12353494 Cl. G06F 16/955.
Underdown, David Reuel: See--
Davis, Jeremy Alexander; Lazo, Antonio; Sarrafi-Nour, Reza; and Underdown, David Reuel 12352136 Cl. E21B 43/084.
Underhill, Derek Michael: See--
McBride, James Patrick; Underhill, Derek Michael; and Filippelli, Matthew D1082698 Cl. D13‑120.
Underhill, Derek Michael; and Nook, Jonathan Lewis, to Noco Company, The Case D1082314 Cl. D3‑301.
Underhill, Matthew: See--
Youngbull, Cody; Hatch, Andrew; Larsen, Andrew; Ray, Tathagata; and Underhill, Matthew 12350672 Cl. B01L 3/502784.
Underwood, Timothy Ryan: See--
Schroeder, Kristopher Paul; and Underwood, Timothy Ryan 12353599 Cl. G06F 21/6254.
Undheim, Ruben: See--
Wulff, Carsten; Vedal, Tor Øyvind; Bruset, Ola; Balasubramanian, Shankkar; Undheim, Ruben; and Garvik, Harald 12355452 Cl. H03L 7/104.
Unezaki, Takashi: See--
Satoh, Yasushi; Unezaki, Takashi; Tanaka, Hirofumi; and Ito, Ken 12353125 Cl. G03F 1/64.
Unger, John: See--
Lee, Danny Shu-Huan; Smith, Paul; Wales, Ryan V.; Wang, Jialiang; Andersson, Niklas; Hurley, Gregory; Taylor, Jon; Unger, John; and Pyataeva, Irina 12349887 Cl. A61B 17/0206.
Ungureanu, Caius: See--
Pop, Laurentiu; Zanzinger, Werner; Huth, Tobias; Thomas, Jörg; Rinja, Sergiu; Ungureanu, Caius; and Pascalau, Marius 12351111 Cl. B60R 11/0235.
UNIFY MEDICAL, INC.: See--
Liu, Yang; and Askari Karchegani, Maziyar 12355931 Cl. H04N 13/106.
Unilin, BV: See--
Clement, Benjamin; and De Boe, Luc 12350926 Cl. B41J 11/00214.
Marcaccioli, Sergio; Menato, Christian; and Paganelli, Mariano 12351722 Cl. C09D 11/322.
UNILUMIN GROUP CO., LTD: See--
Deng, Peng; and Tu, Jian D1082733 Cl. D14‑126.
Unison Industries, LLC: See--
Tripathi, Pallavi; Nayak, Subrata; Reddy Kollam, Ramana; Patil, Sharad Pundlik; Dhabade, Milind Chandrakant; Dev Mahadevaiah, Narendra; and Ganiger, Ravindra Shankar 12352314 Cl. F16C 35/06.
UNIST (Ulsan National Institute of Science and Technology): See--
Moon, Hyungon; Park, Chanyoung; Lee, Jaehyu; and Kim, Daeyeon 12353322 Cl. G06F 12/023.
Unisys Corporation: See--
Beale, Andrew Ward; and Strong, David 12353900 Cl. G06F 9/45558.
Bruso, Kelsey L.; and Plasek, James M. 12353386 Cl. G06F 16/2246.
Unite Digital LLC: See--
Coopes, Stacey; Soffa, Ryan; Len, Ronald; and Cox, Marcus Clayton 12353776 Cl. G06F 3/1243.
United Biomedical, Inc.: See--
Wang, Chang Yi; Lin, Feng; Chen, Jiun Bo; and Ding, Shuang 12350322 Cl. A61K 39/008.
UNITED MICROELECTRONICS CORP.: See--
Chang, Kai-Kuen 12356648 Cl. H10D 30/0281.
Hsu, Chih-Kai; and Chen, Chien-Hung 12356599 Cl. H10B 10/12.
Huang, Shou-Wan; and Lin, Chun-Hsien 12356702 Cl. H10D 84/038.
Su, Po-Wen; Chang, Ming-Hua; and Lu, Shui-Yen 12356654 Cl. H10D 30/475.
United Parcel Service of America, Inc.: See--
Goja, Asheesh 12354031 Cl. G06Q 10/00.
Wall, Patrick; Radaker, Jeffrey; and Bell, Julian 12353945 Cl. G06K 7/10366.
United Semiconductor (Xiamen) Co., Ltd.: See--
Huang, Shih-Hsien; Liu, Sheng-Hsu; and Tan, Wen Yi 12356677 Cl. H10D 62/021.
United Services Automobile Association (USAA): See--
Harper, Thomas Mercer; Martinez, Noe Alberto; Hayes, Keegan Patrick; Ayala, Jennifer Dawn; Chandler-Bradley, Jennifer Marie; Louwagie, III, Joseph H.; Kottoor, Mathew Cyriac; and Van Santen, Emily Nicole 12353443 Cl. G06F 16/287.
Hartshorn, Joel S. 12353529 Cl. G06F 21/32.
Langley, Guy R.; Lindley, Jason W.; Griffin, Jr., Donald H.; Garretson, Elizabeth; Barth, Ryan R.; Duran, Francisco A; Tarrillion, Ann C.; and Roberts, David W. 12355917 Cl. H04M 3/5191.
Vera, Alejandro; Solís, Jr., Miguel; Nguyen, Hieu; Hendry, Jason Paul; Mahoney, Nathan; and Casillas, Debra Randall 12355747 Cl. H04L 63/0807.
Warnick, Mark Paxman; Carrasco, Elena Marie; Dortch, Celena; Haslam, Justin Dax; James, David Jason Anderson; Jones, Quian Antony; Smith, Rosa Maria; and Zell, Katrina Marie 12354455 Cl. G08B 21/02.
United States Government as represented by the Department of Veterans Affairs, The: See--
Hostetler, Karl Y.; Beadle, James R.; and Valiaeva, Nadejda 12350274 Cl. A61K 31/522.
Leung, Lawrence L. K.; Morser, Michael J.; and Myles, Timothy 12351625 Cl. C07K 16/24.
UNITED STATES GYPSUM COMPANY: See--
Pospisil, Frank; and Flondor, Kyle 12352034 Cl. E04B 1/34321.
United States Luggage: See--
Krulik, Richard; Courter, Adam; Lawson, Hayley; and Davies, Jon 12349776 Cl. A45C 7/0022.
United States of America as represented by the Administrator of NASA: See--
Nehmetallah, George; Aslam, Shahid; and Phan, Thuc 12352946 Cl. G02B 21/365.
United States of America as represented by the Secretary of the Air Force: See--
Hardy, Luke; Anderson, Michael; Bitting, Bradley; Good, Trinity; Neil, Anthony; and Powell, Orval 12352544 Cl. F42B 12/56.
United States of America as represented by the Secretary of the Navy: See--
Anderson, Ryan Joseph; Bermeo, Dennis G.; Watson, Jessica L.; Brock, David Walker; and Wilson, Kemakeo K. 12355134 Cl. H01Q 1/1207.
Chieh, Jia-Chi Samuel 12355153 Cl. H01Q 15/0026.
United States of America as represented by the Secretary of the Navy, The: See--
Miesner, John E. 12354789 Cl. H01F 41/074.
Phelps, Kevin L.; Amato, Brian; Pines, Daniel; and Young, Taylor 12352553 Cl. F42D 1/055.
UNITED STATES POSTAL SERVICE: See--
Foxx-Gruensteidl, Manfred 12351400 Cl. B65G 43/02.
Luckay, Ryan M.; Dixon, Jr., Robert E.; and Lee, Sr., James E. 12354048 Cl. G06Q 10/08.
Simpson, Ryan J. 12354314 Cl. G06T 9/20.
UnitedHealth Group Incorporated: See--
Hane, Christopher A.; and Nori, Vijay S. 12353972 Cl. G06N 20/20.
Mosquera, Javier; and Guo, Yinglong 12353683 Cl. G06F 3/0484.
Unity Technologies ApS: See--
Malhotra, Shrey; Chmilenko, Andriy Andy; and Myhill, Adam 12354220 Cl. G06T 17/10.
Unity Technologies SF: See--
Harish, Arnon; and Basat, Sagi Ben 12353873 Cl. G06F 8/71.
UNIVERCELLS TECHNOLOGIES S.A.: See--
Mairesse, Bastien; De Viron, Laetitia; and Chatel, Alex 12351793 Cl. C12M 47/10.
Universal Electronics Inc.: See--
Hascher, Thomas; Godwin, Jason; and Haughawout, Joseph Lee 12354469 Cl. G08C 17/02.
Kalayjian, Nicholas; Isbister, David; and Hirsch, Michael 12353669 Cl. G06F 3/0481.
Lamb, Michael; and Petrucci, Carlo Q. 12354461 Cl. G08B 25/008.
Universal Robots A/S: See--
Grummas, Malin; Bohman, Johan; Saabye, Anja; Christiansen, Michael Sjørup; Johansen, Steffen; and Fair, Michael D1082878 Cl. D15‑199.
Thomsen, Dan Kielsholm; Søe-Knudsen, Rune; Jessen, Jeppe Barsøe; and Lorenzen, Christian Valdemar 12350838 Cl. B25J 9/1664.
Universidad de Santiago de Chile: See--
Vega Viveros, Ricardo Emilio 12351468 Cl. C01B 7/14.
UNIVERSIDAD SANTIAGO DE CALI: See--
Dvries Arturo, Richard Fernando; Piñeros, Octavio; and Villamizar Delgado, Stephanny 12351592 Cl. C07F 1/08.
Universidade Estadual Paulista “Júlio De Mequita Filho”—UNESP: See--
Cilli, Eduardo Maffud; and Bueno, Paulo Roberto 12352746 Cl. G01N 33/5438.
UNIVERSITAT DE VALENCIA-ESTUDI GENERAL: See--
Estrela Arigüel, José María; Obrador Pla, Maria Elena; Salvador, Rosario; and Dellinger, Ryan W. 12350283 Cl. A61K 31/7076.
UNIVERSITE CLERMONT AUVERGNE: See--
Dallel, Radhouane; Artola, Alain; Descheemaeker, Amélie; Anizon, Fabrice; Thomas, Isabelle; Moreau, Pascale; Visseq, Alexia; and Giraud, Francis 12351556 Cl. C07D 213/76.
Universite De Bretagne Occidentale: See--
Le Garrec, Raphaele; L'Herondelle, Killian; Misery, Laurent; Pierre, Ophelie; and Mignen, Olivier 12350260 Cl. A61K 31/438.
UNIVERSITE DE MONTPELLIER: See--
Sitbon, Marc; Petit, Vincent; Ivanova, Svilena; Battini, Jean-Luc; Courgnaud, Valérie; Giovannini, Donatella; and Lezaar, Jawida 12352761 Cl. G01N 33/6872.
Spuhler, Christoph; Haddab, Yassine; Poignet, Philippe; Morel, Antoine; and Sanchez, Alonso 12352343 Cl. F16H 37/122.
Tavernier, Romain; Granado, Lérys; David, Ghislain; Caillol, Sylvain; and Foyer, Gabriel 12351562 Cl. C07D 265/16.
UNIVERSITE DE NANTES: See--
Brument, Nicole 12351832 Cl. C12N 7/02.
UNIVERSITE GRENOBLE ALPES: See--
Guillet De Chatellus, Hugues; Bourdarot, Guillaume; and Berger, Jean-Philippe 12355489 Cl. H04B 10/2557.
UNIVERSITÉ PARIS CITÉ: See--
Bico, José; Siefert, Emmanuel; Roman, Benoît; and Reyssat, Etienne 12352055 Cl. E04G 11/045.
Hulot, Jean-Sébastien 12351634 Cl. C07K 16/2848.
Sitbon, Marc; Petit, Vincent; Ivanova, Svilena; Battini, Jean-Luc; Courgnaud, Valérie; Giovannini, Donatella; and Lezaar, Jawida 12352761 Cl. G01N 33/6872.
Université Paris—Est Créteil Val de Marne: See--
Gracies, Jean-Michel; and Mohammed, Samer 12350062 Cl. A61B 5/4082.
UNIVERSITEIT ANTWERPEN: See--
Wuyts, Sander; Lebeer, Sarah; and Eilers, Tom 12351842 Cl. C12N 9/2437.
University-Industry Cooperation Group of Kyung Hee University: See--
Kim, Hui Yong; Lim, Sung Chang; Lee, Jin Ho; Choi, Jin Soo; Kim, Jin Woong; Park, Gwang Hoon; and Kim, Kyung Yong 12355967 Cl. H04N 19/129.
Kim, Woo Sik; Kang, Jeong Ki; Kim, Jinsoo; and Kim, Jinsoo 12350782 Cl. B24B 19/22.
UNIVERSITY OF CENTRAL FLORIDA RESEARCH FOUNDATION, INC.: See--
Thomas, Jayan; Pandey, Deepak; and Kumar, Kowsik Sambath 12354796 Cl. H01G 11/40.
Yestrebsky, Cherie; and Almutairi, Adibah M. 12350535 Cl. A62D 3/34.
University of Cincinnati: See--
Lu, Mingming 12350605 Cl. B01D 11/0457.
University of Dundee: See--
Virdee, Satpal; Mathur, Sunil; and Fletcher, Adam 12351857 Cl. C12Q 1/48.
UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA: See--
Fan, Hua; Liu, Yilin; Zhang, Wei; Luo, Jing; Zhao, Panfeng; and Feng, Quanyuan 12355461 Cl. H03M 1/1033.
UNIVERSITY OF GEORGIA RESEARCH FOUNDATION, INC.: See--
MohanKumar, Sheba M. J.; MohanKumar, Puliyur S.; and Chuang, Yen-Jun 12350384 Cl. A61K 9/5123.
University of Houston System: See--
Xian, Wa; McKeon, Frank; and Vincent, Matthew P. 12351822 Cl. C12N 5/0607.
UNIVERSITY OF KENTUCKY RESEARCH FOUNDATION: See--
Martinez-Sobrido, Luis; Chambers, Thomas; and King, Kendall Wayne 12350328 Cl. A61K 39/145.
University of Manchester, The: See--
Barran, Perdita; Sarkar, Depanjan; Trivedi, Drupad; Kunath, Tilo; Milne, Joy; and Sinclair, Eleanor 12354864 Cl. H01J 49/26.
University of Maryland, Baltimore: See--
Kim, Eunkyoung; Payne, Gregory F.; Kang, Mijeong; Ghodssi, Reza; Winkler, Thomas E.; Banis, George; Kitchen, Christopher; Kelly, Deanna L.; and Bentley, William E. 12352720 Cl. G01N 27/3277.
University of Maryland, Baltimore County: See--
Koru, Gunes; Zhang, Yili; and Tamakuwala, Pratik 12353369 Cl. G06F 16/215.
UNIVERSITY OF MARYLAND, COLLEGE PARK: See--
Kim, Eunkyoung; Payne, Gregory F.; Kang, Mijeong; Ghodssi, Reza; Winkler, Thomas E.; Banis, George; Kitchen, Christopher; Kelly, Deanna L.; and Bentley, William E. 12352720 Cl. G01N 27/3277.
UNIVERSITY OF MASSACHUSETTS: See--
Libraty, Daniel H. 12350331 Cl. A61K 39/295.
Visconti, Pablo E.; and Navarrete, Felipe 12351821 Cl. C12N 5/0604.
Watkins, James; Beaulieu, Michael R.; and Hendricks, Nicholas R. 12355055 Cl. H01M 4/04.
Wolfe, Scot A; Emerson, Jr., Charles P; Iyer, Sukanya; Suresh, Sneha; Mueller, Christian; Chen, Jennifer; Guo, Dongsheng; and King, Oliver 12351836 Cl. C12N 9/22.
University of Melbourne, The: See--
Oetomo, Denny; Tan, Ying; Fong, Justin; and Crocher, Vincent 12350215 Cl. A61H 1/02.
UNIVERSITY OF NEWCASTLE UPON TYNE: See--
Ferreira-Duarte, Ana Marina; and Gentile, Piergiorgio 12350706 Cl. B05D 1/02.
University of North Carolina at Charlotte, The: See--
Zhang, Yong; Pal, Antardipan; and Yau, Dennis 12354650 Cl. G11C 11/42.
UNIVERSITY OF PITTSBURGH—OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION: See--
Guo, Zong Sheng; Bartlett, David; Liu, Zuqiang; and Feist, Mathilde 12350303 Cl. A61K 35/763.
University of Rhode Island Board of Trustees: See--
Rivera, Kevin M.; and Gregory, Otto J. 12356857 Cl. H10N 10/82.
University of Rochester: See--
Martinez-Sobrido, Luis; Chambers, Thomas; and King, Kendall Wayne 12350328 Cl. A61K 39/145.
University of Shanghai for Science and Technology: See--
Peng, Yan; Zeng, Linggao; Zhu, Yiming; Yang, Qingrou; Shi, Chenjun; Wu, Xu; and Zhuang, Songlin 12352693 Cl. G01N 21/3581.
University of South Carolina: See--
Davidson, Matthew T.; Hunt, Michelle L.; and Benigni, Andrea 12355237 Cl. H02J 13/00009.
University of South Florida: See--
Uysal, Ismail; and Abdella, Alla 12353467 Cl. G06F 16/353.
University of Southern California: See--
Agus, David; Ruderman, Daniel; Rawat, Rishi; Sha, Fei; and Shibata, Darryl 12354012 Cl. G06N 3/088.
University of the Ryukyus: See--
Park, Kyung Bae; Kageyama, Hiroshi; Higa, Akira; and Noguchi, Takashi 12356786 Cl. H10K 39/32.
University of Toledo, The: See--
Stanko, Kelley; Chen, Yixing; and Brainard, Daniel 12354493 Cl. G09B 23/286.
UNIVERSITY OF ULSAN FOUNDATION FOR INDUSTRY COOPERATION: See--
Kang, Dong Wha; Lim, Hyun Taek; Lee, Byung Joo; Hong, Rak Kyeun; and Kim, Yong Hwan 12350230 Cl. A61H 5/005.
UNIVERSITY OF UTAH RESEARCH FOUNDATION: See--
Varley, Katherine (K-T) E.; Stewart, Rachel L.; Bernard, Philip S.; and Updike, Katherine 12352750 Cl. G01N 33/57415.
Yang, Jiyuan; Li, Lian; Peterson, C. Matthew; and Kopecek, Jindrich 12350337 Cl. A61K 45/06.
University of Virginia Patent Foundation: See--
Chamberlain, Adam Lee; Opila, Elizabeth J.; and Ridley, Mackenzie J. 12351522 Cl. C04B 35/62222.
Kipnis, Jonathan; and Da Mesquita, Sandro 12352767 Cl. G01N 33/6896.
Kudithipudi, Chengalrayan; Shen, Yanxin; Xu, Dongmei; Timko, Michael Paul; and Rabara, Roel 12351809 Cl. C12N 15/8262.
Medin, Jeffrey A.; Faber, Mary L; Tate, Everett R.; and Oldham, Robyn A. A. 12351639 Cl. C07K 16/2878.
Timko, Michael Paul; Rushton, Paul J.; and Bokowiec, Marta Tatiana 12351606 Cl. C07K 14/415.
University of Washington: See--
Chiu, Daniel T.; Wu, Changfeng; McNeil, Jason; and Yu, Jiangbo 12352754 Cl. G01N 33/587.
University of Washington through its Center for Commercialization: See--
Gundlach, Jens; Derrington, Ian M.; Laszlo, Andrew; and Manrao, Elizabeth 12352742 Cl. G01N 33/48721.
UNIVERSITY OF WYOMING: See--
Alloush, Rami; Piri, Mohammad; and Lowry, Ewan W. 12352773 Cl. G01N 5/02.
UNIVERSITY OF YORK: See--
Duckett, Simon Benedict; Iali, Wissam; and Olaru, Maria-Alexandra 12350350 Cl. A61K 49/106.
Uniyal, Rahul; to Bank of America Corporation Gamification of training for phishing prevention in metaverse 12355814 Cl. H04L 63/1483.
UNLIKELY ARTIFICIAL INTELLIGENCE LIMITED: See--
Tunstall-Pedoe, William; Heywood, Robert; Warren, Seth; Benn, Paul; Reynolds, Duncan; Shah, Ayush; Krnic, Luci; and Zhu, Ziyi 12353827 Cl. G06F 40/20.
Unmanned Aerospace LLC: See--
Shaanan, Gad 12351301 Cl. B64C 27/57.
Unnikrishnan, Sudeep: See--
Pandey, Anilabh; Srivastava, Rahul; Kodandaraman, Geetha; Sridharamurthy, Arun; Srivastava, Kartik; Kozhipurath, Jyothish; and Unnikrishnan, Sudeep 12354076 Cl. G06Q 20/322.
Uno, Masahiro: See--
Ogasahara, Tomoyoshi; Uno, Masahiro; Aoyama, Takayasu; and Tashima, Yuki 12354140 Cl. G06Q 30/0283.
Unoh, Akihisa: See--
Yamao, Yoshimichi; Yokoyama, Satoshi; and Unoh, Akihisa 12354768 Cl. H01B 17/583.
Unomah, Michael Ogechukwuka: See--
Matovic, Gojko; Nizamidin, Nabijan; Unomah, Michael Ogechukwuka; Kim, Do Hoon; Dwarakanath, Varadarajan; Malik, Taimur; Pinnawala, Gayani W.; Alexis, Dennis A.; and Lau, Samuel Wei-en 12352149 Cl. E21B 43/267.
Unverricht, Maik: See--
Kraewer, Bernd; and Unverricht, Maik 12352654 Cl. G01M 15/102.
Uozumi, Yoshinobu; Miyoshi, Masaaki; and Ueda, Kazuki, to Kawasaki Motors, Ltd. Small planing watercraft and method of controlling small planing watercraft 12351280 Cl. B63B 34/10.
Upadrasta, Prasad V.; Balan, Anusha; Chau, Joey; and Tonthat, Quang, to Intuitive Surgical Operations, Inc. Auto-configurable simulation system and method 12349978 Cl. A61B 34/10.
Updike, Katherine: See--
Varley, Katherine (K-T) E.; Stewart, Rachel L.; Bernard, Philip S.; and Updike, Katherine 12352750 Cl. G01N 33/57415.
Uppal, Simmi Kaur: See--
Teran, Alexander; Burdynska, Joanna; Rupert, Benjamin; Nasybulin, Eduard; Venugopal, Saranya; and Uppal, Simmi Kaur 12355075 Cl. H01M 4/405.
UPTIMEAI TECH PRIVATE LIMITED: See--
Gattu, Jagadish; and Yalamanchili, Vamsi 12353200 Cl. G05B 23/024.
Ur, Shmuel: See--
Nehmadi, Youval; Ur, Shmuel; and Cohen, Ronny 12352591 Cl. G01C 21/3602.
Urabe, Junichiro: See--
Tobita, Kazuya; Kazuta, Youichi; Takubo, Yuichi; Urabe, Junichiro; Hamachi, Noriaki; Shiga, Yuto; and Matsuura, Toshinori 12354786 Cl. H01F 27/292.
Urabe, Yoshio: See--
Chitrakar, Rojan; Huang, Lei; and Urabe, Yoshio 12356480 Cl. H04W 76/15.
Urakawa, Naoya: See--
Kawasaki, Minoru; Sakamoto, Kaho; Yajima, Shunsuke; Saito, Takeshi; Miyoshi, Seiki; and Urakawa, Naoya 12351379 Cl. B65D 75/5883.
Urata, Shinichi: See--
Tsuchitani, Takumi; Nakamura, Kenichi; Hashimoto, Hiroshi; Urata, Shinichi; Sone, Chisato; and Matsumura, Koichiro 12352028 Cl. E03D 1/263.
Uratani, Mitsuru: See--
Sakai, Hiroyuki; Uratani, Mitsuru; Ishida, Yuki; Omagari, Yuki; and Suzuki, Tomohiro 12356085 Cl. H04N 23/88.
Urayama, Hirofumi: See--
Mashita, Makoto; Miyajo, Akira; Moriguchi, Masakatsu; Hagihara, Takeshi; and Urayama, Hirofumi 12355597 Cl. H04L 25/20.
Urban, Fabrice: See--
Rath, Gagan; Racape, Fabien; and Urban, Fabrice 12355970 Cl. H04N 19/132.
Urban, Fabrice; Galpin, Franck; and Bordes, Philippe, to InterDigital CE Patent Holdings, SAS Motion vector derivation in video encoding and decoding 12355974 Cl. H04N 19/137.
Urban, Matthew W.; Capriotti, Margherita; and Greenleaf, James F., to Mayo Foundation for Medical Education and Research Time-aligned plane wave compounding of ultrasound data 12352855 Cl. G01S 15/8995.
URBAN SKY THEORY INC.: See--
McLaughlin, Maxmillion J. W.; Leidich, Jared; and Henault, Nathan 12351291 Cl. B64B 1/62.
Urbanski, Jeff: See--
Alfonso, Ted; Wheeler, Steve; and Urbanski, Jeff 12350487 Cl. A61N 1/05.
Urbina, Hugo; Qureshi, Asfia; Huston Davenport, Adrienne; Tan, Xuqiu; Kutscher, Jochen; Funke, Andreas; Seitter, Michael; Haefner, Stefan; and Le, Anh-Huy Phan, to BASF SE Amylase enzymes 12351841 Cl. C12N 9/2414.
Urbix, Inc.: See--
Gangopadhyay, Palash; Cabrero Vilatela, Andrea; and Austin, Kurumi 12351462 Cl. C01B 32/21.
Urda, Adriana Cristina: See--
Azar, Ziad; Becs, Balazs Janos; Choudhary, Vikas; Demissie, Edom; Groendahl, Erik; Jacobsen, Bo Nedergaard; and Urda, Adriana Cristina 12355306 Cl. H02K 1/2791.
Urena Pimentel, Katherine: See--
Martz, Thomas; Rexwinkle, Irene; McConnell, David C.; Poteet, Steven; and Urena Pimentel, Katherine 12350388 Cl. A61L 2/10.
Urie, Alistair; to NOKIA SOLUTIONS AND NETWORKS OY Adding per-user equipment controls to radio intelligent controller E2 policy 12356503 Cl. H04W 8/186.
Uriondo, Adrian: See--
Flower, Paul David; and Uriondo, Adrian 12355302 Cl. H02K 1/04.
Urita, Yuki; Ogihara, Atsushi; Tsuchida, Shigeru; Hiromi, Chikako; Ara, Ryota; Nagasawa, Sohei; Katori, Mitsuomi; and Hosaka, Misako, to YKK Corporation Aluminum alloy fastening member, fastener chain and method for producing aluminum alloy fastening member 12351895 Cl. C22C 21/08.
Urquhart, Gordon T.: See--
Miller, James E.; Hommes, Jonathan Douglas; Walby, Karl; and Urquhart, Gordon T. 12350695 Cl. B05B 14/45.
Urry, Robin Scott: See--
Messerly, Shayne; Misener, Anthony K.; Sowards, Steffan; and Urry, Robin Scott 12349983 Cl. A61B 34/20.
Ursenbach, Daniel O.: See--
Shen, Shyan Bob; van Tooren, Michael; Ursenbach, Daniel O.; and Woods, Jeffrey D. 12351305 Cl. B64C 3/26.
Urtasun, Raquel: See--
Casas, Sergio; Frossard, Davi Eugenio Nascimento; Suo, Shun Da; Tu, Xuanyuan; and Urtasun, Raquel 12350835 Cl. B25J 9/163.
Urzi, Giancarlo: See--
Thiel, Laura; Urzi, Giancarlo; and Cid, Carlos 12355094 Cl. H01M 50/256.
Thiel, Laura; Urzi, Giancarlo; and Cid, Carlos 12355217 Cl. H02B 1/26.
Thiel, Laura; Urzi, Giancarlo; and Cid, Carlos 12355286 Cl. H02J 7/0042.
US Conec Ltd.: See--
Childers, Darrell R.; Hughes, Michael E.; and Kurtz, Daniel D. 12353022 Cl. G02B 6/3853.
US SYNTHETIC CORPORATION: See--
Bertagnolli, Kenneth E.; Qian, Jiang; Wiggins, Jason K.; Vail, Michael A.; Mukhopadhyay, Debkumar; and Linford, Brandon P. 12350792 Cl. B24D 3/10.
USA, as represented by the Secretary, Dept. of Health and Human Services, The: See--
Lederman, Robert J.; Khan, Jaffar M.; and Rogers, Toby 12349957 Cl. A61B 18/082.
Usaj, Marko; Bogdan, Kristjan; Sik, Peter; Barbis, Andrej; and Panger, Marko, to Nielsen Company (US), LLC, The Apparatus, articles of manufacture, and methods to self-test wireless networking devices 12355501 Cl. H04B 17/19.
Uschold, Robert C.: See--
Taluskie, Karen V.; Sears, Stephen Benson; Hunt, Eric Taylor; Collett, William Robert; Chang, Yi-ping; Weight, Kristen Dodds; Karg, Jeffrey A.; Eacock, Graham P.; Ebbs, Matthew C.; Uschold, Robert C.; and Sloan, III, Walker Maclaughlin 12349732 Cl. A24F 40/46.
Ushio Denki Kabushiki Kaisha: See--
Fukuda, Minoru; and Samejima, Takanori 12356517 Cl. H05B 41/282.
Ushpizin, Yonatan: See--
Rotman, Elad; Detinis, Eitan; Zucker, Ido; Zehavi, Eliyahu; and Ushpizin, Yonatan 12349991 Cl. A61B 34/30.
Usuda, Masashi; to KAI R&D CENTER CO., LTD. Razor D1083227 Cl. D28‑47.
Usui, Masaru: See--
Kuroda, Yohei; Usui, Masaru; and Arai, Jun 12349860 Cl. A61B 1/000096.
Uszkoreit, Jakob D.: See--
Kaiser, Lukasz Mieczyslaw; Roy, Aurko; Vaswani, Ashish Teku; Parmar, Niki; Bengio, Samuel; Uszkoreit, Jakob D.; and Shazeer, Noam M. 12353991 Cl. G06N 3/08.
UT-Battelle, LLC: See--
Chen, Xi; Dudney, Nancy J.; Kalnaus, Sergiy; Palmer, Max J.; and Westover, Andrew S. 12355102 Cl. H01M 50/446.
Greenwood, M. Scott; Smith, Michael B. R.; Thompson, Nick; Nelson, Noel B.; and Peplow, Douglas E. 12354501 Cl. G09B 9/00.
Utah State University Space Dynamics Laboratory: See--
Willis, Bryan Jon 12355149 Cl. H01Q 13/02.
Utecht, Tom A.: See--
Ives, Kyle Stephen; Harke, Michael C.; and Utecht, Tom A. 12352825 Cl. G01R 31/52.
UTF Australia Pty Ltd: See--
Clarke, Ben; and Clarke, Bruce 12349663 Cl. A01K 5/0225.
Uth, Nicholas: See--
Webster, Thaddaeus; Hadley, Brian; Mason, Carrie; Jaques, Colin; Tummala, Seshu; Rowland-Jones, Ruth Christine; Levinson, Yonatan; Uth, Nicholas; Sinha, Pankaj; and Abraham, Eytan 12352625 Cl. G01J 3/44.
Uttormark, Michael J.; to Hewlett Packard Enterprise Development LP Kernel memory monitor for user-space mapping change notifications 12353331 Cl. G06F 12/10.
Uusitalo, Jukka-Pekka: See--
Launis, Sirpa; Uusitalo, Jukka-Pekka; Rekola, Jenni; Voigt, Matthias; and Anders, Erik 12352166 Cl. E21B 7/15.
Uysal, Ismail; and Abdella, Alla, to University of South Florida Representation and visualization of multivariate sensory time series data 12353467 Cl. G06F 16/353.
Uzunkaya, Ramazan: See--
Mühlfeld, Florian; Müller, Matthias; Mesnier, Pierre; Uzunkaya, Ramazan; and Quell, Ulrich 12352354 Cl. F16H 63/3425.