LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 1st DAY OF July, 2025
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
Uzzeni, Pier Franco
12342907 Cl. A43B 7/36.
Lahbib, Imène; Loraine, Jérôme; Drillet, Frédéric; Kumar, Albert; and U'Ren, Gregory
12349461 Cl. H10D 86/201.
Foster, Marlen L.; Yung, Connie K.; Narayanan, Vijay; Bharadwaj, Raj M.; Kolavennu, Soumitri Naga; Winberg, Jessica G.; Narayanan, Balasubramanian; and Vishnubhotla, Hima Rama Subrahmanyam
12346884 Cl. G06Q 20/0425.
U.S. WELL SERVICES, LLC: See--
Hinderliter, Brandon
12348045 Cl. H02J 3/381.
Briliauskas, Mantas; and Ševčenko, Aleksandr
12346442 Cl. G06F 21/565.
Takai, Daichi; Ezaki, Tomotaro; Kudo, Tomoyuki; and Tazoe, Kiyonari
12344920 Cl. C22C 21/08.
Li, Jie; and Cai, Xuefeng
12348324 Cl. H04L 12/10.
Keniuk, Richard J.; and Schulz, Gary D.
12347930 Cl. H01Q 19/10.
Ge, Ligang; Lìu, Yizhang; Chen, Chunyu; Xie, Zheng; and Xiong, Youjun
12344337 Cl. B62D 57/032.
Hoh, Baik; Ucar, Seyhan; Sisbot, Emrah A.; and Oguchi, Kentaro
12344264 Cl. B60W 50/14.
Ucar, Seyhan; Sisbot, Emrah Akin; and Oguchi, Kentaro Detection of abnormal driving based on behavior profiles
12344255 Cl. B60W 40/09.
Hu, Hong; Kasa, Matthew; Anliker, Ethan; Ivanyushenkov, Yury; Shiroyanagi, Yuko; Kesgin, Ibrahim; and Hasse, Quentin B.
12347613 Cl. H01F 6/04.
Zhu, Yisi; Tepavcevic, Sanja; Connell, Justin Grant; Zapol, Peter; and Markovic, Nenad
12347830 Cl. H01M 10/0585.
Uchida, Shuhei; Natsui, Ryuichi; and Nakura, Kensuke, to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. Positive electrode active material and battery including the same
12347858 Cl. H01M 4/525.
Yamada, Manabu; Takeuchi, Manabu; Inoue, Yasunobu; Uchii, Kimitaka; and Sumii, Tateki
12342863 Cl. A24F 40/42.
Gaylord, Brent S.; Bartholomew, Glenn P.; Baldocchi, Russell A.; Hong, Janice W.; Huisman, William H.; Liang, Yongchao; Nguyen, Trung; Tran, Lan T.; Wheeler, Jean M.; Palmer, Adrian Charles Vernon; and Uckert, Frank Peter
12345713 Cl. G01N 33/58.
Bonfanti, Paola; and Gjinovci, Asllan
12343447 Cl. A61L 27/3687.
Howorka, Stefan; and Xing, Yongzheng
12344891 Cl. C12Q 1/6869.
Kajiyama, Takuya; Fujii, Toshiyuki; Fujiwara, Shuhei; Kono, Yoshiyuki; and Uda, Ryosuke
12348127 Cl. H02M 1/325.
Thunuguntla, Saikiran Sri; Baddam, Vishal Reddy; Ghosh, Suman; and Uddihal, Gururaj
12346331 Cl. G06F 16/2456.
Yutkowitz, Stephen; Hein, Daniel; and Udluft, Steffen
12346086 Cl. G05B 19/404.
Wang, Gi Nam; Park, Jun Pyo; Kim, Yeon Dong; Kim, Nam Ki; Yang, Hee Chan; Ha, Yoon Woo; and Jin, Seung Jong
12346084 Cl. G05B 19/056.
Udovč, Tin: See--
Udov, Maks; and Udovč, Tin
12342816 Cl. A01N 25/28.
Gokhale, Ajay; Chen, Jiawei; Abdagic, Alvin; Olczak, Adrien; Agostini, Alessandro; Robertson, Alexander; Udrescu, Cristian; Xiang, Jackie; Daniel, Jennifer; Yan, Keqian; Sharma, Mehek; D'Ercole, Nicolo; Lu, Yang; and Ayalon, Dror
12346652 Cl. G06F 40/166.
Carter, Steven Paul; Udy, Adam; Sutter, Catriona A.; Pinches, Christopher; Clare, David S.; Brown, Andre David; Freese, John; Cleary, Patrick; Calvino, Alexander J; Cottrell, Lee; Meyer, Daniel; Innes, Daniel John; Jalbert, David; Thorne, Jason B.; Hutchinson, Peter; Howes, Gordon; Gao, Wenxiu; Wu, David; Poirier, David W.; and Der Marderosian, Daniel R.
12342979 Cl. A47L 9/0613.
Watabe, Takeyoshi; Kawano, Yuta; Ueda, Airi; Ohsawa, Nobuharu; and Seo, Satoshi
12349538 Cl. H10K 50/858.
Ueda, Ikuo; to NIPPON FILCON CO., LTD. Industrial fabric
12344967 Cl. D03D 13/006.
Ueda, Tomoya: See--
Takada, Hibiki; Ueda, Tomoya; and Hiwa, Takahiro
12348089 Cl. H02K 15/0433.
Ueda, Yoshihiro; Takahashi, Keiichiro; and Sato, Jun, to FUJIFILM Corporation Treatment tool for endoscope
12343031 Cl. A61B 17/29.
Ueda, Yoshiyuki; and Noguchi, Takaya, to Mitsubishi Electric Corporation Semiconductor test apparatus and semiconductor test method
12345739 Cl. G01R 1/07342.
Hatanaka, Masaya; Nakaharai, Hiroyuki; Hara, Nobuhide; Uefuji, Yoichi; Eguchi, Shunsaku; Oda, Takuo; Tanimoto, Koichi; and Kitamura, Masashi
12345475 Cl. F28D 7/16.
Sakuma, Kota; Uehara, Kensuke; Murakami, Shinji; and Hiraoka, Yoshiaki
12346083 Cl. G05B 19/056.
Uehara, Tomoya: See--
Murofushi, Mitsuhide; Uehara, Tomoya; Nakao, Kenichi; Nakajima, Yuki; and Fujii, Kenichi
12346764 Cl. G06K 7/10297.
Dreiling, Ryan P.; Reiser, Aaron; and Uehling, Philip Warren
12349234 Cl. H04W 8/205.
Hayashi, Shota; Ogawa, Nobuaki; Asano, Yuki; Muranaka, Akihiro; Uejima, Takanori; and Kitajima, Hiromichi
12349327 Cl. H05K 9/0022.
Kanna, Shinichi; and Ueki, Keigo
12345850 Cl. G02B 1/002.
Tonoue, Yoshiaki; and Uekita, Kazuhiro
12346081 Cl. G05B 19/048.
Ohtsubo, Tomonori; Uemura, Hiroki; and Hirata, Yoshito
12344129 Cl. B60N 2/0028.
Ueno, Kazuyuki; and Nemoto, Takashi, to THREEBOND CO., LTD. Sheet-shaped photocurable composition, photocurable composition solution, method for producing sheet-shaped photocurable composition, and laminated body
12344689 Cl. C08F 265/06.
Ueno, Kohei: See--
Kodaira, Hirohisa; Shimada, Chiaki; and Ueno, Kohei
12344494 Cl. B65H 3/0607.
Ueno, Kousuke; Tamai, Masahiko; Aono, Shinjiro; Tsubouchi, Akio; Kato, Satoko; Doi, Masahiro; Ohashi, Tsuyoshi; and Sakai, Makoto, to Toshiba Lighting & Technology Corporation Heater and image forming apparatus
12346045 Cl. G03G 15/2057.
Ueno, Yosuke: See--
Moue, Takashi; Ueno, Yosuke; Yamashita, Tomonori; Oosako, Youhei; and Umeda, Kengo
12348682 Cl. H04N 25/78.
Calas, Guillaume; and Ughetto, Raphael
12347326 Cl. G08G 5/34.
Hunt, Donald F.; English, Ann M.; Ugrin, Scott A.; Bai, Dina L.; Shabanowitz, Jeffrey; and Syka, John Edward Philip
12347665 Cl. H01J 49/0072.
Josiah, Michael Raymond; and Dovi, Joseph
12346056 Cl. G03G 21/181.
Vlasceanu, Victor; Eslami, Zach; Jaffri, Taqi; and Rapaka, Venkata Syam Prakash
12346713 Cl. G06F 9/453.
Saito, Keita; Otani, Shinichiro; Ukiana, Tomooki; and Nakata, Masanori
12345430 Cl. F24F 11/52.
Gross, Timothy Michael; Guo, Xiaoju; Harris, Jason Thomas; Lezzi, Peter Joseph; Mitchell, Alexandra Lai Ching Kao Andrews; Oram, Pascale; Reiman, Kevin Barry; Roussev, Rostislav Vatchev; and Ukrainczyk, Ljerka
12344550 Cl. C03C 21/002.
Alibeiginabi, Mina; Brorsson, Erik; Ulander, Silas; and Waubert, Benjamin
12347209 Cl. G06V 20/588.
Mangold, Sebastian; Fiesel, Manuel; Ulbrich, Jens; Jeltsch, Thomas; Göhring, Alfred; and Barthelmes, Jan
12343751 Cl. B05B 5/053.
Pospisil, Frank; Straight, Yelena; Ullett, James M.; and Natesaiyer, Kumar
12345044 Cl. E04B 5/10.
Oakshott, Neil; Orr, Jeffrey; Johnson, Rob; Parker, Ryan; and Miller, Christopher
12345502 Cl. F41C 33/0263.
Carter, Thomas Andrew; Long, Benjamin John Oliver; and Subramanian, Sriram
12345838 Cl. G01S 7/52004.
ULTRAHAPTICS IP TWO LIMITED: See--
Namdeo, Yogansh; Hisham, Syed; Shet, Adhit; Raj, Ritwik; Singhal, Vatsal; and Kumar, Mohit
12345527 Cl. G01B 7/12.
Um, Kil Yong: See--
Park, Hae Jin; Lee, Sang Yong; Park, Hyun Jin; Lee, Gun Young; Chang, Hyo Jeong; Um, Kil Yong; and Kim, Yong Sung
12346671 Cl. G06F 8/34.
Rumade, Anagha; Umapathy, Anjana; Moghadam, Sadra Amiri; Banerjee, Abhik; Gundlapalli, Gupta; Doshi, Jainesh; and Basavaraju, Srinivasa Murthy
12346317 Cl. G06F 16/243.
Moue, Takashi; Ueno, Yosuke; Yamashita, Tomonori; Oosako, Youhei; and Umeda, Kengo
12348682 Cl. H04N 25/78.
Umeda, Soichiro; and Kyutoku, Atsushi, to SHINDENGEN ELECTRIC MANUFACTURING CO., LTD. Tip connection portion of terminal member and associated semiconductor device
12347750 Cl. H01L 23/49517.
Umeda, Yuhei: See--
Dindin, Meryll; Umeda, Yuhei; and Chazal, Frederic
12346791 Cl. G06N 3/045.
Inoue, Asuka; Kasahara, Ryoichi; Umeki, Takeshi; Tadanaga, Osamu; Embutsu, Koji; Koshobu, Nobutatsu; Kazama, Takushi; and Kashiwazaki, Takahiro
12346000 Cl. G02F 1/365.
Hiratsuka, Daisuke; Teshima, Kunihiko; and Umesh, Anil
12349088 Cl. H04W 56/0015.
Imamura, Yasumasa; Matsuo, Juntaro; Umetsu, Daisuke; Okada, Kohei; and Kubo, Junichi
12344253 Cl. B60W 30/182.
Ikeuchi, Shinsuke; Umezawa, Seiji; Kurokawa, Fumiya; and Suzuki, Masayuki
12343760 Cl. B06B 1/0603.
Higuchi, Tsuyoshi; and Umezu, Yuji
12348877 Cl. H04N 23/745.
Umezu, Yuji; and Hagiwara, Soichi, to SOCIONEXT INC. Image processing device and image processing method for obtaining two sub-images from original image
12348912 Cl. H04N 9/78.
Scheunis, Lennart
12344917 Cl. C22B 23/02.
UMICORE AG & CO. KG: See--
Schoenhaber, Jan; Deibel, Naina; Roesch, Martin; and Richter, Joerg-Michael
12343713 Cl. B01J 35/19.
Schoenhaber, Jan; Richter, Joerg-Michael; and Braun, Carolin
12345193 Cl. F01N 3/2803.
Mehta, Sandip; Umrethia, Manish Kumar; and Mandal, Jayanta
12343338 Cl. A61K 31/4725.
Berns, Jason; and Lucero, Mari
12342888 Cl. A41D 31/185.
Roth, Courtney; Snoke, Margaret; and Brunette, Sarah
12342883 Cl. A41D 27/205.
Kubicek, Alexander C.; Dow, Bryan A.; and Jacobs, Alexander T.
12345589 Cl. G01L 5/00.
Jeevarajan, Judith; Juarez-Robles, Daniel; and Joshi, Tapesh
12344447 Cl. B65D 51/1622.
Smith, Jeffry R.; and O'Neill, John M.
12346981 Cl. G06Q 50/12.
Thon, Susanna M.; Lin, Yida; Qiu, Botong; Ung, Garrett; and Li, Lulin
12348181 Cl. H02S 40/22.
Chou, Wen San; and Chou, Cheng Hsien
12343950 Cl. B29C 73/166.
Chen, Chi-Feng; Yen, Po-Sheng; Wu, Ruey-Beei; Tain, Ra-Min; Wang, Chin-Sheng; and Chen, Jun-Ho
12347912 Cl. H01P 1/20309.
Renaud, Philippe; Bertrand, Daniel; Möller, Andreas; and Boven, Karl-Heinz
12345722 Cl. G01N 35/00693.
Wares, Brian; and Ely, Ethan M.
12343851 Cl. B25B 5/10.
Abu-Jdayil, Basim; Ayyash, Mutamed; and Alhamayda, Asmaa Samir
12343432 Cl. A61K 9/4866.
Ahmed, Waleed Khalil
12343934 Cl. B29C 64/188.
UNITED MICROELECTRONICS CORP.: See--
Chen, Yi-Wei; Wang, Hsu-Yang; Chiu, Chun-Chieh; and Tzou, Shih-Fang
12349340 Cl. H10B 12/485.
Chou, Ling-Chun; Chang, Yu-Hung; and Lee, Kun-Hsien
12349399 Cl. H10D 30/655.
Hsu, Chi-Hsiu; Yeh, Yu-Huan; Lai, Cheng-Hsiao; Chen, Guan-Lin; Wang, Chuan-Fu; and Fan Chiang, Hung-Yu
12347486 Cl. G11C 13/0064.
Kuo, Chih-Wei; Hou, Tai-Cheng; Lai, Yu-Tsung; and Liao, Jiunn-Hsiung
12349367 Cl. H10B 61/22.
Tsai, Shih-Hung; Liu, Hon-Huei; and Lin, Chun-Hsien
12348214 Cl. H03H 9/059.
Tseng, Chun-Yen; Wang, Shu-Ru; Kuo, Yu-Tse; Chen, Chang-Hung; Wu, Yi-Ting; Yeh, Shu-Wei; Chiou, Ya-Lan; and Huang, Chun-Hsien
12349369 Cl. H10B 61/22.
UNITED PARCEL SERVICE OF AMERICA, INC.: See--
Parameswaran, Sathiyan; Varadarajula, Padmanabha Shastry; Doddipalli, Pavan; and Parikh, Dhruvil
12346844 Cl. G06Q 10/04.
United Services Automobile Association (USAA): See--
Allerkamp, Breanna Nicole; Dahlman, Matthew Conrad; Diaz, Daniel; Enochs, Andrew Luke; and Low, Shawn D.
12346975 Cl. G06Q 40/08.
Gray, Emily Margaret; Bitsis, Jr., Daniel Christopher; Kou, Qunying; Simpson, Robert Wiseman; Amann, Manfred; Brown, Donnette Moncrief; Schroeder, Eric David; Beveridge, Meredith; Maciolek, Michael J.; Mohs, Bobby Lawrence; Shipley, Brian F.; Haslam, Justin Dax; and Philbrick, Ashley Raine
12346974 Cl. G06Q 40/08.
Lyle, Ruthie D.; Mitchem, Sean Carl; Durairaj, Ravi; Lopez, Mark Anthony; and Serrao, Nolan
12346977 Cl. G06Q 40/08.
Maciolek, Michael J.; Amann, Manfred; Moncrief Brown, Donnette L.; Davison, Timothy Frank; Desai, Snehal; Ferretti, Nicole; Ballew, Rachel Michelle; O'Brien, Kelsey Anne; Rahim, Sayeef; Schroeder, Eric David; Schroeder, Steven J.; Vesco, Joseph Michael; Haslam, Justin Dax; and Porter, Melissa Jane
12345027 Cl. E03B 7/12.
Smith, Arthur Quentin; Haslam, Justin Dax; and Romero, Jr., Jose L.
12346468 Cl. G06F 21/6218.
Tougas, Brian; Farmer, William Daniel; Lyle, Ruthie D.; Baker, Kelly Q.; Russell, Ryan Thomas; and Martinez, Noe Alberto
12346421 Cl. G06F 21/32.
Weigand, Joshua Garrett
12346322 Cl. G06F 16/24542.
United States Department of Energy: See--
Ohodnicki, Jr., Paul R.; Byerly, Kevin; Agrawal, Dinesh; and Lanagan, Michael
12349262 Cl. H05B 6/80.
United States Government as represented by the Department of Veterans Affairs, The: See--
Etkin, Amit; Trivedi, Madhukar; and Wu, Wei
12343162 Cl. A61B 5/4848.
UNITED STATES GYPSUM COMPANY: See--
Pospisil, Frank; Straight, Yelena; Ullett, James M.; and Natesaiyer, Kumar
12345044 Cl. E04B 5/10.
United States of America as represented by the Administrator of NASA: See--
Cobb, Josef Benjamin
12343930 Cl. B29C 64/118.
United States of America, as represented by the Secretary, Department of Health and Human Services, The: See--
Basser, Peter J.
12345788 Cl. G01R 33/5608.
Benjamini, Dan Haim; Basser, Peter J.; and Iacono, Diego
12343132 Cl. A61B 5/055.
Wadsworth, Samuel; Scaria, Abraham; and Chan, Chi-Chao
12344842 Cl. C12N 15/1136.
United States of America as represented by the Secretary of the Air Force: See--
Mauzy, Camilla A; and Muyldermans, Serge Victor Marie
12344660 Cl. C07K 16/1228.
Page, Michael R; Shah, Piyush J; and Bas, Derek A
12347914 Cl. H01P 1/32.
United States of America as represented by the Secretary of the Navy, The: See--
Powell, Makia S; Drozdenko, Benjamin M; and Roodbeen, Steven A
12348544 Cl. H04L 63/1425.
Sorna, Mark; Yates, Jacob; Schuyler, Nathan; and Ruiz, Jose
12343571 Cl. A62B 18/025.
United States Postal Service: See--
Koohi, Anoosha; and McLellan, Charles P.
12345825 Cl. G01S 19/396.
Mittal, Chirag; Rana, Arjun; Sabapathy, Rajesh; Conway, Erin; Vishnumurthy, Sudeep; and Parganiha, Arushi
12346913 Cl. G06Q 30/0185.
Shapiro, Sheila Kay; and McClure, Donna
12347537 Cl. G16H 20/00.
Dahan, Yuval-Yoni; and Dahan, Abraham
12343690 Cl. B01F 25/30.
Goergen, Patrick John; Jordan, Robert Michael; and Chan, Eric To
12347089 Cl. G06T 7/0002.
Hall, Gregory S.; South, Dwain; Goodwin, David; and Weiser, Carlos
12343648 Cl. A63G 1/10.
UNIVERSAL DISPLAY CORPORATION: See--
Macinnis, Morgan C.; Chen, Hsiao-Fan; Fleetham, Tyler; Wolohan, Peter; Feldman, Jerald; Tsai, Jui-Yi; Boudreault, Pierre-Luc T.; Dyatkin, Alexey Borisovich; Ji, Zhiqiang; Ryno, Sean Michael; Hamze, Rasha; Lin, Chun; and Sheina, Elena
12349589 Cl. H10K 85/346.
Universal Electronics Inc.: See--
Thibault, Thomas
12345432 Cl. F24F 11/63.
Conesa Zamora, Pablo; Perez Sanchez, Horacio; Luque Fernández, Irene; Montoro García, Silvia; Alburquerque Gonzalez, Begoña; Campioni Rodrigues, Priscila; García Solano, José; Bernabé García, Angel; Nicolás Villaescusa, Francisco José; Bernabé García, Manuel; Cayuela Fuentes, Maria Luisa; Ruiz Sanz, Javier; Martínez Herrerías, Jose Cristobal; and Salo, Tuula
12343349 Cl. A61K 31/55.
UNIVERSIDAD DE ZARAGOZA: See--
Fernández Ledesma, Luis José; Monge Prieto, Rosa Maria; Calavia Calvo, Jose Luis; Santolaria Mazo, Jorge; Orús Pontaque, Javier; Peribáñez Subirón, Carlos; Rodriguez Fortún, José Manuel; and Ochoa Garrido, Ignacio
12343721 Cl. B01L 3/502707.
UNIVERSIDAD MIGUEL HERNÁNDEZ DE ELCHE: See--
Carrasco Hernández, José Antonio; García De Quirós Nieto, Francisco Javier; and Moreno Soriano, Ignacio
12347996 Cl. H01S 3/101.
UNIVERSIDAD TÉCNICA FEDERICO SANTA MARÍA: See--
Rivera Iunnissi, Sebastián Andre; Renaudineau, Hugues Jean-Marie; Flores Bahamonde, Freddy Arturo; and Kouro Renaer, Samir Felipe
12348122 Cl. H02M 1/0083.
Ferreira Dos Santos, João Gabriel; Zúquete, André; Nuno Rocha, Miguel; Pinheiro De Sousa Campos, António Pedro; and Barreira De Jesus, Paulo José
12346456 Cl. G06F 21/577.
UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL—UFRGS: See--
Violante Ferreira, Claudio; Pinho Dos Reis, Bruno; Marczak, Rogério José; Gomes De Melo Medeiros, Jorge; Echer, Leonel; Reckziegel, Gilnei; Manfredini Vassoler, Jakson; and Barroso De Mello, Flávio
12345099 Cl. E21B 17/017.
Corradini, Matteo; Fonda, Sergio; and Malagoli, Andrea
12343121 Cl. A61B 5/02055.
UNIVERSITÀ DEGLI STUDI DI PADOVA: See--
Bertucco, Alberto; Barbera, Elena; and Sabbadin, Giacomo
12343675 Cl. B01D 53/1406.
Quintana Romero, Albert; Sanz Iglesias, Elisenda; and Puighermanal, Emma
12343316 Cl. A61K 31/05.
Universität Bayreuth: See--
Greiner, Andreas; Agarwal, Seema; and Liao, Xiaojian
12344961 Cl. D01F 6/18.
Kroemer, Guido; and Bravo San Pedro, José Manuel
12343376 Cl. A61K 38/17.
UNIVERSITÉ PARIS EST CRÉTEIL VAL DE MARNE: See--
Cambot, Marie; Vandemeulebrouck, Gaetana; Noizat Pirenne, France; Bartolucci, Pablo; Rakotoson, Marie Georgine; Galacteros, Frédéric; and Hebert, Nicolas
12345718 Cl. G01N 33/721.
Universite Pierre Et Marie Curie (Paris 6): See--
Valle, Karine; Belleville, Philippe; Pereira, Franck; Laberty, Chrystel; Sanchez, Clément; and Bass, John
12347906 Cl. H01M 8/1041.
Cumming, David Robert Sime; and Annese, Valerio Francesco
12349610 Cl. G01N 27/4148.
UNIVERSITY-INDUSTRY COOPERATION GROUP OF KYUNG HEE UNIVERSITY: See--
Lee, Seung Ah; Lee, Kyung Chul; Baek, Nak Kyu; Park, Wook; Bae, Jung Hyun; and Jung, Jaewoo
12343954 Cl. B29D 11/00961.
UNIVERSITY INDUSTRY FOUNDATION, YONSEI UNIVERSITY WONJU CAMPUS: See--
University of Basel: See--
Ruster, Thomas; Shi, Yongqi; Treutlein, Philipp; and Ho, Melvyn
12345752 Cl. G01R 29/0878.
UNIVERSITY OF CAPE TOWN: See--
Trusler, Matthew Graham; and Barrow, Michael Stuart
12343276 Cl. A61F 5/0125.
University of Central Florida Research Foundation, Inc.: See--
Seigneur, Hubert; and Smith, Ryan
12348186 Cl. H02S 50/15.
Yuksel, Murat; Haq, A F M Saniul; and De La Llana, Patrick
12348271 Cl. H04B 10/503.
University of Chicago, The: See--
LaBelle, James; Eclov, Rachel; Bird, Gregory; and Walensky, Loren D.
12344643 Cl. C07K 14/4713.
University of Cincinnati, The: See--
Hajjar, Roger J.; Del Monte, Federica; and Kranias, Evangelia
12343353 Cl. A61K 31/66.
University of Connecticut: See--
Oliver, Douglas L.; Burghard, Alice L.; Lee, Christopher; and Fabrizio-Stover, Emily
12343534 Cl. A61N 1/36036.
University of Copenhagen: See--
De Bruijn, Irene; Raaijmakers, Josephus Maria; and Buchman, Kurt
12344836 Cl. C12N 1/205.
UNIVERSITY OF DURHAM: See--
Whiting, Andrew; Chisholm, David; Greig, Iain; Khatib, Thabat; and McCaffery, Peter
12344587 Cl. C07D 241/38.
University of Electronic Science and Technology of China: See--
Wang, Hua; and Li, Meng
12345150 Cl. E21B 47/005.
University of Florida Research Foundation, Inc.: See--
Shah, Bipin; and Srinivasan, Ravi S.
12344408 Cl. B64U 20/87.
UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INCORPORATED: See--
UNIVERSITY OF HOUSTON SYSTEM: See--
Merchant, Fatima; and Cheong, Audrey
12343159 Cl. A61B 5/4312.
University of Kansas, The: See--
Maharjan, Anjana; Ezazi, Mohammadamin; and Kwon, Gibum
12344716 Cl. C08J 3/075.
University of Kentucky Research Foundation: See--
Shi, Jian; Li, Wenqi; Hunter, Jameson; and Zhang, Yuxuan
12344537 Cl. C02F 1/26.
Yuan, Ling; Singh, Sanjay K.; Pattanaik, Sitakanta; and Lawson, Darlene Madeline
12344853 Cl. C12N 15/8243.
University of Louisville Research Foundation, Inc.: See--
Hamorsky, Krystal; and Matoba, Nobuyuki
12343375 Cl. A61K 38/164.
University of Manitoba: See--
Al-Eryani, Yasser; and Hossain, Ekram
12348980 Cl. H04W 16/18.
Rajapakse, Athula Dayanarth; Haleem, Naushath Mohamed; and Wijekoon, Jagannath Sri
12345753 Cl. G01R 31/085.
University of Maryland, Baltimore: See--
Hu, Fu-Ming; Stansbury, Lynn G.; Mackenzie, Colin F.; Scalea, Thomas M.; Stein, Deborah M.; and Yang, Shiming
12343109 Cl. A61B 5/0022.
University of Maryland, Baltimore County: See--
Islam, Riadul
12348541 Cl. H04L 63/1425.
UNIVERSITY OF MARYLAND, COLLEGE PARK: See--
Wang, Yuhuang; Luo, Hongbin; and Wang, Peng
12344571 Cl. C07C 211/53.
Wu, Min; Zhu, Qiang; Tian, Xin; and Wong, Chau-Wai
12343154 Cl. A61B 5/352.
University of Massachusetts: See--
Khvorova, Anastasia; Godinho, Bruno Miguel da Cruz; and Gilbert, James W.
12344839 Cl. C12N 15/113.
Thayumanavan, Sankaran; and Dutta, Kingshuk
12344693 Cl. C08F 299/04.
Xie, Jun; and Gao, Guangping
12344857 Cl. C12N 15/86.
University of Massachusetts, The: See--
Basich, Connor; Wray, Kyle Hollins; Witwicki, Stefan; and Zilberstein, Shlomo
12344280 Cl. B60W 60/0053.
University of Notre Dame du Lac: See--
Speth, Jeremy; Flynn, Patrick; Czajka, Adam; Bowyer, Kevin; Carpenter, Nathan; and Olie, Leandro
12343177 Cl. A61B 5/7278.
University of Rochester: See--
Renninger, William
12347994 Cl. H01S 3/0057.
Storch, Gregory; Yu, Jinsheng; and Mariani, Thomas J.
12344893 Cl. C12Q 1/6883.
UNIVERSITY OF SHARJAH: See--
Al Hemairy, Mohamed; Abu Talib, Manar; and Khalil, Ather
12348634 Cl. H04L 9/3066.
UNIVERSITY OF SOUTH CAROLINA: See--
Jabbari, Esmaiel
12343445 Cl. A61L 27/26.
University of South Florida: See--
Decker, Summer J.; Ford, Jonathan; Hazelton, Todd; Goldstein, Todd; Kim, Kami; Teng, Michael; and Sinnott, John
12342996 Cl. A61B 10/02.
Karaiskaj, Denis
12346069 Cl. G04F 5/14.
University of Southampton: See--
Scofield, Adam; Zilkie, Aaron John; Yu, Guomin; Schrans, Thomas Pierre; Thomson, David John; and Zhang, Weiwei
12345967 Cl. G02F 1/025.
University of Tennessee Research Foundation: See--
Costinett, Daniel Jes; Li, Jie; and Qin, Ruiyang
12347602 Cl. H01F 27/2804.
University of Tokyo, The: See--
Nakatsuji, Satoru; Yumoto, Junji; Shimano, Ryo; Hayashi, Masamitsu; Takenaka, Mitsuru; and Horinouchi, Yusuke
12347506 Cl. G11C 19/0841.
Watanabe, Kenichi; Kyomoto, Masayuki; Honda, Shintaro; Moro, Toru; and Tanaka, Sakae
12347106 Cl. G06T 7/0012.
University of Utah Research Foundation: See--
Crabb, Brendan Thomas; Noo, Frederic Nicolas Firmin; and Fine, Gabriel Chaim
12343191 Cl. A61B 6/5264.
University of Virginia Patent Foundation: See--
Hunt, Donald F.; English, Ann M.; Ugrin, Scott A.; Bai, Dina L.; Shabanowitz, Jeffrey; and Syka, John Edward Philip
12347665 Cl. H01J 49/0072.
Kester, Mark; Da Costa Pinheiro, Pedro Filipe; and Shaw, Jeremy
12343428 Cl. A61K 9/1271.
University of Washington: See--
Park, Sung Il; Kim, Woo Seok; and Campos, Carlos Arturo
12343274 Cl. A61F 5/0013.
University of Wyoming: See--
University Public Corporation Osaka: See--
Iida, Takuya; Tokonami, Shiho; Ishikawa, Hiroki; Yamasaki, Tsutomu; and Washida, Hirohito
12345625 Cl. G01N 21/171.
Shibahara, Masakazu; Ikushima, Kazuki; Kawahara, Atsushi; Takeuchi, Rino; and Hashizume, Hikaru
12343818 Cl. B23K 31/003.
Bernard, Pawel; and Mendez, James
12347335 Cl. G09B 23/26.
Alzahrani, Saeid A.
12344395 Cl. B64D 5/00.
Rangasamy, Venkatachalam; Jeyapaul, Jaganathan; Trent, Jeffrey; Hiremath, Jay; Somasundaram, Senthilkumar; Sundaram, Krithika Bharathi; Unnikrishnan, Parvathy; Mula, Vijay Bhasker; and Sharma, Esha
12346304 Cl. G06F 16/2343.
Unnikrishnan, Sreenath; Chong, Boon Sim; Rizvi, Farrukh Raza; Viernes, Rafael Raymund; and Lye, Pierre Zeloon, to Razer (Asia-Pacific) Pte. Ltd. User input devices, panels for use with a user input device and computer peripheral devices
12346510 Cl. G06F 3/038.
Yamao, Yoshimichi; Yokoyama, Satoshi; and Unoh, Akihisa
12347587 Cl. H01B 17/583.
Paspek, Stephen; Unsworth, John Francis; Adams, Jeramie Joseph; and Bassham, Seth Taylor
12344799 Cl. C10B 55/02.
Van Mill, Michael D.; Gerdeman, Shawn W.; and Schlimgen, Ronald J.
12342755 Cl. A01D 41/127.
Van Mill, Michael D.; Gerdeman, Shawn W.; and Walvatne, John
12344333 Cl. B62D 55/06.
Uo, Toyoaki; Shimizu, Hiroaki; and Kabushiki Kaisha Toshiba, to Toshiba Electronic Devices & Storage Corporation Communication device
12348342 Cl. H04L 27/04.
Yamazaki, Shunpei; Kimura, Hajime; Matsuzaki, Takanori; Onuki, Tatsuya; Okamoto, Yuki; Uochi, Hideki; and Okamoto, Satoru
12347491 Cl. G11C 16/0483.
Pham, Thai; Anguiano, J Ascencion; Hudson, Hank M.; Cuellar, Kyle T.; Brostow, Adam; Peterson, Stephen N; and Pierce, Michael C.
12344807 Cl. C10L 3/105.
Nakagawa, Satoru; Ohashi, Hideto; Hironaka, Nobuyuki; Sasaki, Hironao; Uotani, Kosuke; and Togawa, Keiichiro
12344705 Cl. C08G 63/183.
Urs, Deepthi; Chunekar, Shraddha; Dobrean, Adrian; Upadhyay, Navneet; Andra, Sunder Ramesh; and Ramachandran, Amith
12346210 Cl. G06F 11/1451.
Upadhyay, Ronak: See--
Kaleeswaran, Shalini; Upadhyay, Ronak; and Prasad, Aaranya
12348366 Cl. H04L 41/0816.
Upadhyay, Swami: See--
Aneja, Harchetan S.; Bharos, Amit; Upadhyay, Swami; and Rajarathnam, Boopathi
12342987 Cl. A61B 1/00137.
Ethen, Tyler Joseph; Paul, Anish; Upchurch, Joseph Adam; and Childs, William Dwight
12343293 Cl. A61G 7/0528.
Castillo, William; Altman, Adam J.; Pavlidis, Ioannis; Sahu, Sarthak; and Upendran, Manish
12348857 Cl. H04N 23/64.
Koban, Mary E.; Ferraioli, Stephen James; Jewell, Lewis Robert; Stasio, Anthony F.; and Uphaus, Roderic Nathan
12344457 Cl. B65D 83/14.
Merati, Bruce
12347278 Cl. G07F 17/3288.
Hämäläinen, Esa; Kesti, Tero; Heikkilä, Teemu; Hätönen, Vili; Lehto, Oskari; and Pyykkö, Joel
12345637 Cl. G01N 21/453.
Mignard, Marc; Chui, Clarence; Parmar, Manu; Uppuluri, Avinash Venkata; and Le, John
12347026 Cl. G06T 15/506.
Mueller-Auffermann, Konrad
12344828 Cl. C12M 25/02.
Hopkins, Alistair
12347117 Cl. G06T 7/20.
Dubinsky, Ilya; and Ur, Shmuel
12346705 Cl. G06F 9/44505.
Kakuya, Yuuji; Ikeda, Masakazu; Sanji, Kenichiro; Miyashita, Tomokazu; Fujii, Ryozo; Urabe, Masashi; and Naito, Hiromichi
12347945 Cl. H01Q 9/0407.
Urabe, Yoshio: See--
Chitrakar, Rojan; Huang, Lei; and Urabe, Yoshio
12349216 Cl. H04W 76/14.
Pirhooshyaran, Mohammad; Du, Jiang; Jang, Taeuk; Toner, Jonathan; Zhu, Feng; Chen, Tian; and Urankar, Ashish Satish
12346867 Cl. G06Q 10/083.
Hasegawa, Hirokazu; Shibutani, Atsushi; Kawamura, Yoshihiro; and Urano, Miyuki
12343650 Cl. A63H 29/22.
Urano, Yuta; Arima, Eiji; Yamakawa, Hiromichi; and Honda, Toshifumi, to HITACHI HIGH-TECH CORPORATION Defect inspection device, defect inspection method, and adjustment substrate
12345654 Cl. G01N 21/8806.
Henry, William; Tsanaktsidis, John; Hornung, Christian; Urban, Andrew Joseph; Fraser, Darren; Gunasegaram, Dayalan Romesh; Horne, Michael David; Veder, Jean-Pierre; and Rodopoulos, Theo
12343693 Cl. B01F 25/431.
Urban, Thomas Scott: See--
Haber, Steven Henry; Nelson, Noah Trent; and Urban, Thomas Scott
12346290 Cl. G06F 16/128.
Saeed, Dana Khalid; and Urbeck, Connor Allen
12347992 Cl. H01R 43/00.
Golan, Amos; Uri, Itay; and Zon, Fabio
12342836 Cl. A23J 3/227.
Shamir, Reuven Ruby; Urman, Noa; Bomzon, Zeev; Bakalo, Oren Ben Zion; and Glozman, Yana
12343529 Cl. A61N 1/36002.
Marple, Eric Todd; and Urmey, Kirk David
12345949 Cl. G02B 7/10.
Chen, Chien-Tung; Wu, Chung-Hou; Chen, Chao-Cheng; Chiang, Wen-Wei; and Lin, Yi-Jin
12346124 Cl. G05D 1/0287.
Cui, Alexander Yuhao; Sadat, Abbas; Casas, Sergio; Liao, Renjie; and Urtasun, Raquel
12344279 Cl. B60W 60/0027.
Benson, Charles T.; Haupt, Axel; Thomas, Melissa Kay; and Urva, Shweta
12343382 Cl. A61K 38/26.
Ortega Trucios, Arkaitz; Gimeno Eguia, Julen; Gómez Picaza, Mikel; Urzainki Beristain, Rubén; and Urzainki Beristain, Antxoka
12343234 Cl. A61C 8/0057.
Urzainki Beristain, Rubén: See--
Ortega Trucios, Arkaitz; Gimeno Eguia, Julen; Gómez Picaza, Mikel; Urzainki Beristain, Rubén; and Urzainki Beristain, Antxoka
12343234 Cl. A61C 8/0057.
Thiel, Laura; and Urzi, Giancarlo
12347885 Cl. H01M 50/247.
Thiel, Laura; and Urzi, Giancarlo
12348183 Cl. H02S 40/34.
Usami, Shigeyoshi: See--
Nakamura, Marika; Usami, Shigeyoshi; Takiguchi, Yuki; Yamada, Takahiro; Saito, Hisashi; Watahiki, Tatsuro; and Yagyu, Eiji
12349390 Cl. H10D 30/475.
Chamon, Claudio; and Jakes-Schauer, Jonathan
12346461 Cl. G06F 21/602.
Amouie, Mabby Nicholas; Gebhardt, Evan Thomas; Usher, Colin; Samoylov, Alex; Darling, Howard Taylor-Bryce; Yeager, Brian Thomas; and Fox, Thomas Samuel
12344294 Cl. B61L 27/57.
Amouie, Mabby Nicholas; Gebhardt, Evan Thomas; Usher, Colin; Samoylov, Alex; Hoang, John; Thomas, Sean; Mandrekar, Parth; Yeager, Brian Thomas; and Fox, Thomas Samuel
12348880 Cl. H04N 23/90.
Cosby, David W; Velez, Wilson; Caporale, Patrick L; and Ushery, Jr., Gerald C
12346570 Cl. G06F 3/0617.
Imada, Shota; Suzuki, Satoshi; and Ushikubo, Takumi
12345674 Cl. G01N 27/4067.
Nakatani, Mitsunobu; Hiruma, Kei; and Ushiyama, Tomoyuki
12344749 Cl. C09D 11/037.
Ranasinghe, Nadeesha O.; Al-Ali, Ammar; Kiani, Massi Joe E.; Usman, Mohammad; Zhao, Bowen; de Malliard, Pierre; and Min, Peter Sunghwan
12347202 Cl. G06V 20/52.
Usman, Muhammad: See--
Suliman, Munzir Hamedelniel Mohamed; and Usman, Muhammad
12344947 Cl. C25B 11/095.
Usui, Yuta; Omori, Noboru; and Naito, Yuma, to Canon Kabushiki Kaisha Image processing apparatus capable of efficiently converting image file, control method therefor, and storage medium
12346293 Cl. G06F 16/1794.
Chen, Gugang; Rao, Yi; and Li, Xia
12349585 Cl. H10K 71/441.
Wood, Eugene H.; and Beane, Thomas
12343849 Cl. B25B 27/14.
Rue, David M.; Wagner, John C.; and Alavandi, Sandeep
12343677 Cl. B01D 53/265.
Elsasser, Ryan; Mallery, Eric; Romano, Enrico A.; Eagle, Jason R.; Utter, James Clark; Ruiz, Daniel; and Scaglione, Joseph
12346010 Cl. G03B 17/561.
Khlass, Ahlem; Ratasuk, Rapeepat; Mangalvedhe, Nitin; Toskala, Antti Anton; Selvaganapathy, Srinivasan; Koskinen, Jussi-Pekka; Turtinen, Samuli Heikki; and Uzeda Garcia, Luis Guilherme
12349163 Cl. H04W 72/231.