LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 23th DAY OF May, 2023
AND TO WHOM
REEXAMINATION CERTIFICATES AND PATENT TRIAL AND APPEAL BOARD CERTIFICATES WERE ISSUED
DURING THE WEEK BEGINNING THE 15th DAY OF May, 2023.
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

U, LLC: See--
Abouelsoud, Mohammed 11654281 Cl. A61N 1/36025.
U-SHIN FRANCE: See--
Godard, Jerry 11654801 Cl. B60N 2/366.
UATC, LLC: See--
Zhang, Chris Jia-Han; Luo, Wenjie; and Urtasun, Raquel 11657603 Cl. G06V 20/41.
uAvionix Corporation: See--
Ramsey, Christian; Beard, Paul; Walker, Jeff; and Braun, Ryan 11658397 Cl. H01Q 1/283.
Ubaru, Shashanka: See--
Akhalwaya, Ismail Yunus; Clarkson, Kenneth; Horesh, Lior; Squillante, Mark S.; Ubaru, Shashanka; and Kalantzis, Vasileios 11657312 Cl. G06N 10/00.
Uber Technologies, Inc.: See--
Droege, Jason; Chau, Stephen; and Szybalski, Andrew Timothy 11656092 Cl. G01C 21/3679.
Zhang, Haowei; van den Boogaart, Monique Johanna Maria; and Min, Hao 11657420 Cl. G06Q 30/0206.
UBTECH ROBOTICS CORP LTD: See--
Guo, Rui; Xie, Kun; Jiang, Chenchen; Liu, Zhichao; Pang, Jianxin; and Xiong, Youjun 11654572 Cl. B25J 9/1697.
Huang, Liqun; Ren, Xiaoyu; Wang, Yuesong; and Xiong, Youjun 11654551 Cl. B25J 9/1607.
Ren, Xiaoyu; Huang, Liqun; and Xiong, Youjun 11654557 Cl. B25J 9/1633.
Ucar, Seyhan: See--
Higuchi, Takamasa; Ucar, Seyhan; and Altintas, Onur 11659360 Cl. H04W 4/08.
Uchibori, Kazuma; to TOYOTA JIDOSHA KABUSHIKI KAISHA Loading determination system, loading determination method, and non-transitory storage medium stored with loading determination processing program 11657628 Cl. G06V 20/64.
Uchibori, Tomoki; to NIDEC CORPORATION Stator and motor 11658521 Cl. H02K 1/145.
UChicago Argonne, LLC: See--
Lipson, Albert L.; and Durham, Jessica L. 11658298 Cl. H01M 4/525.
Wang, Hsien-Hau; Jagatramka, Ritesh; Plunkett, Samuel; Curtiss, Larry A.; and Amine, Khalil 11658291 Cl. H01M 4/366.
Uchida, Hitoshi: See--
Sato, Atsuko; Uchida, Hitoshi; and Tanaka, Yasuaki 11655358 Cl. C08L 23/12.
Uchida, Kenji: See--
Harada, Yuji; Uchida, Kenji; Ono, Ryohei; Kidokoro, Masayuki; and Nagatsu, Kazuhiro 11655751 Cl. F02B 19/1014.
Uchida, Kenya: See--
Ooshiro, Kenichi; Uchida, Kenya; Sugimoto, Kanta; and Kinoshita, Shizuo 11655562 Cl. D01D 5/0069.
Uchida, Yoshihiro: See--
Nagai, Hiroki; Tashiro, Hiroki; Uchida, Yoshihiro; Kuzuba, Mitsuhiro; and Sugo, Yuki 11656290 Cl. G01R 31/392.
Uchikawa, Hironori: See--
Shibata, Noboru; Uchikawa, Hironori; and Shibuya, Taira 11657879 Cl. G11C 16/26.
Uchisasai, Hiroaki: See--
Maeda, Hiroshi; Fukaya, Kazuyuki; Tomura, Kineo; Uchisasai, Hiroaki; and Abe, Takayuki 11654929 Cl. B60W 50/14.
Uchitomi, Hirotaka: See--
Nakajima, Kei; and Uchitomi, Hirotaka 11657723 Cl. G08G 5/0073.
Uchiyama, Hiromasa; Kusashima, Naoki; and Shimezawa, Kazuyuki, to SONY CORPORATION Communication device and communication method 11659624 Cl. H04W 88/04.
Uchiyama, Ryota: See--
Miyao, Yosuke; Tomonari, Toshio; and Uchiyama, Ryota 11659701 Cl. H05K 9/0088.
Uchiyama, Shigeru: See--
Takano, Takumi; Tani, Yuichiro; and Uchiyama, Shigeru D0986775 Cl. D12‑110.
Uchiyama, Yoshitaka: See--
Shibayama, Takeshi; Kuboi, Mariko; Aizawa, Toshimitsu; Kamiya, Naohito; and Uchiyama, Yoshitaka 11658596 Cl. H02P 21/18.
Udagawa, Akihiro: See--
Hayakawa, Akio; Udagawa, Akihiro; Kai, Noriko; and Tokunaga, Yuji 11655428 Cl. C10M 107/04.
Uday, Hari: See--
Scott, Michael; Phillips, Seth; Kemme, Scott; Uday, Hari; and Bruni, Nicholas 11657423 Cl. G06Q 30/0234.
Uddin, Hasib: See--
Munguia, Joseph Robert; Uddin, Hasib; and Hardin, John 11655678 Cl. E21B 4/003.
Udrea, Florin; Efthymiou, Loizos; Longobardi, Giorgia; and Arnold, Martin, to CAMBRIDGE GAN DEVICES LIMITED III-V semiconductor device with integrated power transistor and start-up circuit 11658236 Cl. H01L 29/7787.
Udy, Adam: See--
Higgins, Colby Jackson; Udy, Adam; Murphy, Stephen; Godden, Stephan James; Mathias, Richard; and Sardar, Nicholas James 11653737 Cl. A45D 20/122.
Ueda, Akinobu: See--
Hiramatsu, Tetsuya; Sonoda, Ryuta; Kagaya, Osamu; Oka, Kentaro; Saito, Akira; Miyachi, Kensuke; Ueda, Akinobu; Kawano, Yoshiyuki; Andou, Jun; and Yamazaki, Taku 11658386 Cl. H01Q 1/1271.
Ueda, Hiroki; Tainaka, Kazuki; and Murakami, Tatsuya, to RIKEN Composition for preparing biological material having excellent light transmissivity and use of composition 11656159 Cl. G01N 1/30.
Ueda, Hiromi: See--
Oide, Ryuji; Ueda, Hiromi; Morioka, Satoshi; and Okumura, Motoyoshi 11658371 Cl. H01M 50/673.
Ueda, Kyoko: See--
Nakazawa, Masakazu; Ueda, Kyoko; Kitajima, Nobutaka; Kawagoe, Mutsumi; Yoshida, Tadashi; Ito, Yasuhiro; and Oga, Kenji 11657709 Cl. G08G 1/09626.
Ueda, Naotsugu: See--
Mino, Hiroyuki; Sakai, Ryusuke; and Ueda, Naotsugu 11657303 Cl. G06N 5/04.
Ueda, Takashi; and Shioya, Koji, to KOKI HOLDINGS CO., LTD. Driving tool 11654539 Cl. B25C 1/047.
Uehara, Haruki: See--
Okuyama, Fukutaro; Niiho, Ryutaro; and Uehara, Haruki 11657786 Cl. G10F 1/02.
Uehara, Hiroshi; to Exedy Corporation Power transmission device 11655859 Cl. F16D 7/025.
Uehara, Kazuhiro: See--
Harata, Yuzo; Uehara, Kazuhiro; Natsume, Mitsuyoshi; and Kawasaki, Takuya 11656771 Cl. G06F 3/0625.
Ueki, Futoshi; and Matsuhana, Bunta, to Shimadzu Corporation X-ray inspection device, management server for X-ray inspection device, and management method for X-ray inspection device 11656189 Cl. G01N 23/083.
Uematsu, Daisuke; Sano, Takashi; Kawaguchi, Yohei; Ichimura, Tatsumi; and Yasuda, Takumi, to CASIO COMPUTER CO., LTD. Electronic timepiece 11656581 Cl. G04R 60/08.
Uematsu, Masahiro: See--
Kuroda, Junichi; Okumura, Yoshikuni; Hayashi, Shinya; Uematsu, Masahiro; Hattori, Takaaki; and Yasukawa, Yuichiro 11655360 Cl. C08L 29/04.
Uemura, Keiji: See--
Shindo, Ryota; and Uemura, Keiji 11654519 Cl. B23Q 1/015.
Ueno, Atsushi; and Shimada, Shota, to NINTENDO CO., LTD. Information processing system, storage medium storing information processing program, information processing apparatus, and information processing method 11654352 Cl. A63F 13/24.
Ueno, Hitoshi: See--
Kazuno, Masataka; Otsuki, Tetsuya; and Ueno, Hitoshi 11659664 Cl. H05K 1/181.
Ueno, Masahiro; and Oka, Soichi, to Nippon Telegraph and Telephone Corporation Optical deflector parameter measurement device, method, and program 11656073 Cl. G01B 11/26.
Uenoyama, Naoki; Suzuki, Koichi; Kamimura, Ryo; Nakata, Daisuke; Tatsumoto, Yuki; and Futakuchi, Yusuke, to TOYOTA JIDOSHA KABUSHIKI KAISHA Control device, terminal device, and control method 11654750 Cl. B60H 1/32.
Uesugi, Takahiko; to NEC Platforms, Ltd. Program generation unit, information processing device, program generation method, and program 11656858 Cl. G06F 8/54.
Ugolini, Jonathan; and Cops, Wim, to MACOM Technology Solutions Holdings, Inc. Single servo loop controlling an automatic gain control and current sourcing mechanism 11658630 Cl. H03G 3/3084.
Uh, Hyounsoo: See--
Choi, Ikjin; Lee, Jung Goo; In, Juneho; Kwon, Soon Jae; Uh, Hyounsoo; Choe, Jinhyeok; Kim, Ingyu; and Shin, Eunjeong 11657933 Cl. H01F 1/0572.
Uhalte Nogues, Sira: See--
Meynen, Mathieu; Jouard, Ludovic; Reignault, Marc; and Uhalte Nogues, Sira 11654643 Cl. B29D 11/00403.
Ui, Hiroki: See--
Dai, Tiejun; Ebihara, Hiroaki; Lee, Sang Joo; Wang, Rui; and Ui, Hiroki 11658202 Cl. H01L 27/14645.
UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY: See--
Choi, Woo Young; Kim, Min Kyu; and Kim, Min Hyeong 11656491 Cl. G02F 1/133382.
UiPath Inc.: See--
Mayer, Christian; Weishaar, Gerd; and Cucosel, Bogdan N. 11656883 Cl. G06F 9/452.
Ukai, Junya; Kato, Makoto; Takata, Kazunori; and DAIWA KASEI INDUSTRY CO., LTD., to TOYOTA JIDOSHA KABUSHIKI KAISHA Electronic control component bracket 11654843 Cl. B60R 16/0231.
Ukirde, Digvijay: See--
Patil, Sandeep R.; Eda, Sasikanth; Jain, Abhishek; and Ukirde, Digvijay 11656780 Cl. G06F 3/0649.
Ukrainczyk, Ljerka: See--
Rai, Rohit; and Ukrainczyk, Ljerka 11655184 Cl. C03C 21/002.
Ulej, Daniel: See--
Berecz, Gábor; Nyulasi, Bálint; Milen, Mátyás; Simig, Gyula; Mravik, András; Németh, Gábor; Keszthelyi, Adrienn; Bali, Beatrix; Volk, Balázs; Szlávik, László; Varga, Zoltán; and Ulej, Daniel 11655251 Cl. C07D 471/16.
Ulge, Umut: See--
Silva Manzano, Daniel Adriano; Yu, Shawn; Baker, David; Garcia, Kenan Christopher; Spangler, Jamie; Walkey, Carl; and Ulge, Umut 11655278 Cl. C07K 14/55.
Ulianenko, Elizaveta: See--
Roschin, Roman A.; Karnygin, Evgenii Vladimirovich; Grebenkin, Sergey; Guskov, Dmitry; Ischeykin, Dmitrii; Potapenko, Ivan; Durdin, Denis; Gudchenko, Roman; Paraketsov, Vasily; Gorodilov, Mikhail; Vladykin, Alexey; Solovyev, Roman; Beliaev, Alexander; Ulianenko, Elizaveta; Trofimov, Leonid; Son, Anzhelika; Zhirnov, Nikolay; and Vovchenko, Alexander 11654001 Cl. A61C 9/0053.
Ulloa-Cerna, Alvaro: See--
Zimmerman, Noah; Fornwalt, Brandon; Pfeifer, John; Chen, Ruijun; Nemani, Arun; Lee, Greg; Steinhubl, Steve; Haggerty, Christopher; Raghunath, Sushravya; Ulloa-Cerna, Alvaro; Jing, Linyuan; and Morland, Thomas 11657921 Cl. G16H 50/30.
Ulreich, Daniel Robert: See--
Fletcher, Hester C.; Ulreich, Daniel Robert; Hollabaugh, Curtis L.; Fowler, Paul M.; and Davis, Gregory T. 11654063 Cl. A61G 7/001.
Ulrich, Roger: See--
Hamdy, Ahmed; Rothbaum, Wayne; Izumi, Raquel; Lannutti, Brian; Covey, Todd; Ulrich, Roger; Johnson, David M.; Barf, Tjeerd; and Kaptein, Allard 11654143 Cl. A61K 31/4985.
Ulrich, Thomas R.: See--
Kearns, Jacob; Michaud, Michael; Kruse, Geoffrey A.; Ulrich, Thomas R.; Harris, Paul; Leas, Scott; Dokken, Betsy; Marin, Garrett; and Sherer, Nicholas 11654236 Cl. A61M 5/1723.
ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY: See--
Lee, Joohee; Cheon, Junghee; Kim, Duhyeong; and Yun, Aaram 11658819 Cl. H04L 9/3006.
Ulthera, Inc.: See--
Prout, Brian Lee; Diener, Alexander Michael; Will, Kristin Marie; Denton, Spencer Michael; Springer, Luke David; Minnis, Sydney; and Davidson, Daniel S. D0986709 Cl. D8‑347.
ULTIMA GENOMICS INC.: See--
Almogy, Gilad; Pratt, Mark; and Oberstrass, Florian 11655501 Cl. C12Q 1/6869.
ULTRAHAPTICS IP LTD: See--
Long, Benjamin John Oliver; Carter, Thomas Andrew; and Subramanian, Sriram 11656686 Cl. G06F 3/016.
ULTRAHUMAN TWELVE LIMITED: See--
Finlay, William James Jonathan 11655300 Cl. C07K 16/2866.
ULTRAVISION TECHNOLOGIES, LLC: See--
Hall, William 09990869.
Ulu, Erva: See--
Ulu, Nurcan Gecer; Ulu, Erva; Hsiao, Walter; and Li, Jiahao 11654616 Cl. B29C 64/118.
Ulu, Nurcan Gecer; Ulu, Erva; Hsiao, Walter; and Li, Jiahao, to PALO ALTO RESEARCH CENTER INCORPORATED Controller and 3D printing apparatus for varying density support structures through interpolation of support polygon boundaries with scalar density fields 11654616 Cl. B29C 64/118.
UMANO MEDICAL INC.: See--
Mercier, Gabriel; and Demers, Ghislain 11654065 Cl. A61G 7/0528.
Umeda, Kensuke: See--
Suzuki, Ai; Umeda, Kensuke; and Kobayashi, Shinsuke 11656568 Cl. G03G 15/5062.
Umemoto, Yasunari: See--
Obu, Isao; Koya, Shigeki; Umemoto, Yasunari; and Tsutsui, Takayuki 11658180 Cl. H01L 27/0823.
Umenaka, Kazuhiro; and Kuge, Raizo, to HOSOKAWA YOKO CO., LTD. Spout-equipped packaging bag and manufacturing method therefor, and spout-equipped packaging bag that contains contents 11655089 Cl. B65D 75/008.
Under Armour, Inc.: See--
Allen, Jeffrey; Kovach, F. Grant; and Mazzoleni, Michael 11653711 Cl. A43B 7/00.
Under Dog Media, L.P.: See--
Cope, Jason B. 11654000 Cl. A61C 7/34.
Underhill, Derek Michael; and Nook, Jonathan Lewis, to Noco Company, The Case D0986595 Cl. D3‑301.
Une, Satoshi: See--
Taniyama, Masaaki; Kuwahara, Kenichi; and Une, Satoshi 11658040 Cl. H01L 21/31144.
Uneri, Ali: See--
Ketcha, Michael; deSilva, Wathudurage Tharindu; Uneri, Ali; Wolinsky, Jean-Paul; and Siewerdsen, Jeffrey H. 11657518 Cl. G06T 7/33.
Unger, Alexander: See--
Rohrmann, Thorsten; Unger, Alexander; and Decker, Peter 11655852 Cl. F16C 33/1065.
UNICHARM CORPORATION: See--
Suda, Tomokazu; Kenmochi, Yasuhiko; Manabe, Yuuka; and Yamamichi, Ayuka 11653812 Cl. A47L 13/42.
Uniloc 2017 LLC: See--
Rojas, Michael J. 08243723 Cl. H04L 51/04.
Union Hospital, Tongji Medical College, Huazhong University of Science and Technology: See--
Wu, QingSong; Zhang, YingCong; Ma, Ming; Xiang, Can; Chen, Shi; Wu, JianCai; Jin, Yang; Wang, Zheng; Luo, Fei; and Wang, ZhiHui 11653758 Cl. A47B 63/00.
Unique Home Designs, Inc.: See--
Chavez, Lawrence 11655665 Cl. E06B 1/6015.
UNITED AIRLINES, INC.: See--
Nicholas, Richard Peter John; Dryburgh, Ian Hamilton; and McKeever, John David Henry 11655037 Cl. B64D 11/0641.
UNITED MICROELECTRONICS CORP.: See--
Jheng, Pei-Lun; and Cheng, Chao-Sheng 11658227 Cl. H01L 29/4933.
Verma, Purakh Raj; Lin, Chia-Huei; and Yang, Kuo-Yuh 11658118 Cl. H01L 23/5283.
Verma, Purakh Raj; Yang, Kuo-Yuh; and Lin, Chia-Huei 11658087 Cl. H01L 23/367.
Wang, Hui-Lin; Hsu, Chia-Chang; and Huang, Rai-Min 11659772 Cl. H10N 50/01.
Wang, Zhen-Zhen; and Zhang, Jian-Jun 11658023 Cl. H01L 21/02129.
Yang, Po-Yu 11658223 Cl. H01L 29/4234.
UNITED PARCEL SERVICE OF AMERICA, INC.: See--
Black, Dale A.; and Bramble, Barry 11657467 Cl. G06Q 50/26.
Hayler, Wendie Patricia; Rutherford, Mark; Jones, Marcus A.; Kirk, Anthony David; Vanorder, Gilbert Walter; Hudson, Roy Douglas; Mason, Paul; and Termini, James 11656188 Cl. G01N 23/04.
United Semiconductor (Xiamen) Co., Ltd.: See--
Huang, Shih-Hsien; Liu, Sheng-Hsu; and Tan, Wen Yi 11658229 Cl. H01L 29/66636.
United Services Automobile Association (USAA): See--
Buckingham, Thomas B.; Davey, Richard A.; Sanclemente, Tammy; Johnson, Ryan M.; Leatham, Adam J.; and Wilkinson, Christopher Thomas 11658968 Cl. H04L 63/0861.
Durairaj, Ravi; Meyer, Gregory Brian; Tijerina, Oscar Roberto; Mitchem, Sean Carl; Huggar, Stacy Callaway; Lyle, Ruthie D.; Post, Nathan Lee; Lopez, Mark Anthony; and Serrao, Nolan 11654821 Cl. B60Q 1/26.
Funari, Leonard S.; and Gerth, William 11657354 Cl. G06Q 10/0637.
Gamboa, Marco Antonio; Watkins, Ronald Richard; Sturdivant, Patrick; Hathorn, Martha Rodriguez; Cone, Stephen Adam; and Yanta, Rhealyn Nicole 11657248 Cl. G06K 19/063.
Khmelev, Yevgeniy Viatcheslavovich; Russell, Christopher; Hansen, Gregory David; Post, Nathan Lee; Philbrick, Ashley Raine; Serrao, Nolan; Lyle, Ruthie D.; Krishnaswamy, Pooja; and Diosdado, Noemy 11659374 Cl. H04W 4/90.
Osterkamp, Bryan J.; Meyer, Gregory Brian; Maney, Jr., Will Kerns; Lyle, Ruthie D.; Schulz, Deborah; Mitchem, Sean Carl; and Chalmers, Timothy Blair 11656617 Cl. G05D 1/0055.
Pena, Ric M.; Smith, Arthur Quentin; and Tougas, Brian 11658809 Cl. H04L 9/0819.
Serrao, Nolan; Durairaj, Ravi; Lyle, Ruthie D.; and Mitchem, Sean Carl 11659085 Cl. H04M 3/493.
White, Angelica N.; Dahlman, Matthew C.; Tougas, Brian; and Luck, Gideon B. 11659235 Cl. H04N 21/44008.
United States Government As Represented By The Department Of Veterans Affairs: See--
Goldish, Gary; Hansen, Andrew; Fairhurst, Stuart R.; Voss, Gregory O.; and Schneider, Urs 11654311 Cl. A62B 35/0012.
United States of America as Represented by the Administrator of National Aeronautics and Space Administration: See--
Downey, James M.; Schoenholz, Bryan L.; and Piasecki, Marie T. 11658398 Cl. H01Q 1/286.
United States of America, as represented by the Secretary, Department of Health and Human Services, The: See--
Saleh, Anthony D.; Van Waes, Carter; Chen, Zhong; and Cheng, Hui 11655469 Cl. C12N 15/113.
United States of America, as Represented by the Secretary, Dept. of Health and Human Services, The: See--
Yu, Paul B.; Huang, Wenwei; Sanderson, Philip Edward; Jiang, Jian-Kang; Shamim, Khalida; Zheng, Wei; Huang, Xiuli; Tawa, Gregory; Lee, Arthur; Alimardanov, Asaf; and Huang, Junfeng 11654147 Cl. A61K 31/519.
United States of America, as represented by The Secretary of Agriculture, The: See--
Guerrero, Felicito; and Domingues, Luisa N. 11654187 Cl. A61K 39/0003.
United States of America as represented by the Secretary of the Air Force: See--
Keyser, Christian; Courtney, Trevor; Timler, John; and Barrett, David M 11658450 Cl. H01S 3/0385.
UNITY TECHNOLOGIES SF: See--
Vorba, Jir̆í 11657563 Cl. G06T 15/06.
Univation Technologies, LLC: See--
Lester, Charles D.; Goode, Mark G.; Lynn, Timothy R.; Cann, Kevin J.; Moorhouse, John H.; Matthews, William Albert; Sun, Kefu; and Alexandre, Francois 11655316 Cl. C08F 210/02.
UNIVERSAL BIO RESEARCH CO., LTD.: See--
Tajima, Hideji 11656179 Cl. G01N 21/6428.
Universal City Studios LLC: See--
Brister, Michael Keith; Vamos, Clarisse Marie; and Tresaugue, Michael Joseph 11654374 Cl. A63G 21/08.
McVeen, Keith Michael 11656622 Cl. G05D 1/0088.
Smith, John David 11654375 Cl. A63G 31/00.
Universal Electronics Inc.: See--
Hatambeiki, Arsham; Chambers, Christopher A.; Yuh, Han-Sheng; and Clegg, Steven 11656743 Cl. G06F 3/0484.
Vergis, George 11657703 Cl. G08C 23/04.
UNIVERSIDAD ANDRÉS BELLO: See--
Bittner Ortega, Waldemar M.; Machuca Valenzuela, Pamela I.; Herrera Sanhueza, Valeska S.; and Fuentevilla Morgado, Ignacio A. 11654167 Cl. A61K 35/76.
UNIVERSIDAD DE SANTIAGO DE CHILE: See--
López Villarroel, Mario; and Ponce Arias, Héctor 11657213 Cl. G06F 40/166.
UNIVERSITÄT BASEL: See--
Koch, Gilbert; Wellmann, Sven; Pfister, Marc; Kasser, Severin; and Wilbaux, Melanie 11656234 Cl. G01N 33/728.
UNIVERSITÄT BERN: See--
Guenat, Olivier Thierry; Stucki, Janick Daniel; Aeschlimann, Marcel; and Léchot, Christophe 11655439 Cl. C12M 21/08.
UNIVERSITAT ZURICH: See--
Becher, Burkhard; and Tugues, Sonia 11655293 Cl. C07K 16/243.
Universite D'Aix Marseille: See--
Antonakakis, Tryfon; Craster, Richard; Achaoui, Younes; Enoch, Stefan; Guenneau, Sebastien; and Brule, Stephane 11655610 Cl. E02D 31/08.
UNIVERSITE DE HAUTE ALSACE: See--
Pluchon, Sylvain K.; Yvin, Jean-Claude; Brendle, Jocelyne; Limousy, Lionel; Dutournie, Patrick; Maillard, Anne; Bruneau, Marion; and Bennici, Simona 11655156 Cl. C01B 33/22.
UNIVERSITE DE RENNES 1: See--
Attaja, Nicolas; Ettorre, Mauro; Sauleau, Ronan; and Guihard, Davy 11658421 Cl. H01Q 9/285.
Université du Luxembourg: See--
Esteves-Veríssimo, Paulo; Völp, Marcus; Decouchant, Jérémie; and Fernandes, Maria 11657899 Cl. G16B 30/10.
UNIVERSITE PIERRE ET MARIE CURIE (PARIS 6): See--
Nassif, Nadine; Moreira Martins Fernandes, Francisco Miguel; Boissiere, Cedric; Sanchez, Clement; and Giraud-Guille, Marie-Madeleine 11654212 Cl. A61L 27/24.
Universiteit Gent: See--
Chuah, Marinee; Vandendriessche, Thierry; and De Bleser, Pieter 11654201 Cl. A61K 48/0058.
UNIVERSITY OF CENTRAL FLORIDA RESEARCH FOUNDATION, INC.: See--
Chanda, Debashis; Franklin, Daniel; and Cencillo Abad, Pablo Manuel 11655377 Cl. C09D 5/004.
UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA: See--
Zhou, Guoyun; Hong, Yan; Li, Jiujuan; He, Wei; Chen, Yuanming; Wang, Shouxu; Zhang, Dainan; and Wang, Chong 11655379 Cl. C09D 5/24.
University of Florida Research Foundation, Inc.: See--
Bhunia, Swarup; Rahman, Md Moshiur; and Alaql, Abdulrahman 11657127 Cl. G06F 21/14.
Fernandez-Nieves, Alberto; Angelini, Thomas Ettor; Chang, Ya-Wen; and Marquez, Samantha M. 11654612 Cl. B29C 64/106.
Grant, Maria A.; Salazar, Tatiana E.; and Xie, Huisheng 11654159 Cl. A61K 35/28.
Koehler, Philip G.; Pereira, Roberto M.; and Levi, Enrico Paolo 11653641 Cl. A01M 1/103.
Scheiffele, Gary W.; and Stanley, Edward L. 11657924 Cl. G21K 1/10.
UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INCORPORATED: See--
Chowdhury, Sreeja; Ganji, Fatemeh; Maghari, Nima; and Forte, Domenic J. 11657405 Cl. G06Q 30/0185.
Loria, Rosemary; Zhang, Yucheng; Ding, Yousong; and Jiang, Guangde 11655477 Cl. C12N 15/76.
Samant, Sanjiv Singh; Nimmagadda, Jyothier; Baciak, James Edward; Samant, Thomas S.S.; and Enqvist, Andreas Jon 11654302 Cl. A61N 5/1049.
UNIVERSITY OF GENEVA: See--
Vinet, Laurent; Babic, Andrej; and Allemann, Eric 11654202 Cl. A61K 49/0438.
University of Georgia Research Foundation, Inc.: See--
Ruter, John M. PP035180 Cl. PLT‑213.
Tripp, Ralph A 11655471 Cl. C12N 15/113.
University of Maryland, Baltimore: See--
Xue, Fengtian; and Shu, Yan 11655233 Cl. C07D 401/12.
University of Maryland, College Park: See--
Rabenhorst, Martin C. 11656215 Cl. G01N 33/24.
University of Massachusetts: See--
Gao, Guangping; Tai, Phillip; Muhuri, Manish; and Zhan, Wei 11655483 Cl. C12N 15/86.
Marosfoi, Miklos; Gounis, Matthew; and Wakhloo, Ajay K. 11654011 Cl. A61F 2/06.
University of Newcastle, The: See--
Capano, Alexandra M.; Tanwar, Pradeep Singh; and Nance, Alex 11654171 Cl. A61K 36/185.
Capano, Alexandra M.; Tanwar, Pradeep Singh; and Nance, Alex 11654172 Cl. A61K 36/185.
University of North Texas: See--
Wan, Yan; Gu, Yixin; He, Chenyuan; Li, Songwei; Liu, Mushuang; and Fu, Shengli 11658754 Cl. H04B 17/318.
University of Oregon: See--
Lockery, Shawn 11654434 Cl. B01L 3/502761.
University of Pittsburgh—Of the Commonwealth System of Higher Education: See--
Barnett, John B.; Blair, Harry C.; and Soboloff, Jonathan 11654123 Cl. A61K 31/167.
Salcido, David D.; Sundermann, Matthew Leo; Tisherman, Robert Theodore; and Menegazzi, James J. 11654080 Cl. A61H 31/006.
UNIVERSITY OF ROCHESTER: See--
Elfar, John; Tseng, Kuang-Ching; and Noble, Mark 11654110 Cl. A61K 9/1647.
University of Tokyo, The: See--
Suzuki, Shinji; Tsuchiya, Takeshi; and Kumada, Masayuki 11655046 Cl. B64D 45/00.
University of Tsukuba: See--
Sankai, Yoshiyuki 11654035 Cl. A61F 2/64.
UNIVERSITY OF ULSAN FOUNDATION FOR INDUSTRY COOPERATION: See--
Kim, Namkug; Hwang, Jeongeun; Seo, Joon Beom; and Lee, Sang Min 11657499 Cl. G06T 7/0012.
UNIVERSITY OF ULSAN FOUNDATION FOR INDUSTRYCOOPERATION: See--
Lee, Joo Yong; Baek, In Jeoung; and Sung, Young Hoon 11653636 Cl. A01K 67/0276.
UNIVERSITY OF WASHINGTON: See--
Silva Manzano, Daniel Adriano; Yu, Shawn; Baker, David; Garcia, Kenan Christopher; Spangler, Jamie; Walkey, Carl; and Ulge, Umut 11655278 Cl. C07K 14/55.
Unluhisarcikli, Ozer: See--
Nath, Janardan; Mankala, Kalyan Kumar; Downey, Todd R.; Lyons, Joseph Harry; Unluhisarcikli, Ozer; Ledbetter, Alexander Harris; Apone, Nicholas Stephen; and Gang, Tian 11656555 Cl. G03F 7/70191.
Unterreiner, Fabian: See--
Richer, Thomas; and Unterreiner, Fabian 11656862 Cl. G06F 8/65.
UOP LLC: See--
Bozzano, Andrea G.; Wang, Haiyan; Mani, Krishna; and Frey, Stanley Joseph 11655424 Cl. C10G 69/04.
Broderick, Erin; Lobo, Rodrigo; Lupton, Francis; Yang, Shurong; Shih, Raymond; Bozzano, Andrea; and Abrevaya, Hayim 11655350 Cl. C08J 11/08.
Uozumi, Seiji: See--
Sumi, Nobuyuki; Kayashima, Shun; Hattori, Satoshi; and Uozumi, Seiji 11654510 Cl. B23K 26/03.
UPI SEMICONDUCTOR CORP.: See--
Hung, Wei-Hsiu; Lai, Min-Rui; and Chang, Chih-Lien 11656644 Cl. G05F 1/575.
Upson, Gwendolyn: See--
Txarola, Joseph; Upson, Gwendolyn; and Chen, Ping 11658426 Cl. H01R 4/2429.
Upstream Data Inc.: See--
Barbour, Stephen 11659682 Cl. H05K 7/1497.
Uptake Medical Technology Inc.: See--
Henne, Erik; Barry, Robert L.; and Keast, Thomas M. 11653927 Cl. A61B 17/12104.
Ur, Shmuel: See--
Shmueli, Aviram; Ascher, Alon; Alfi, Ben; and Ur, Shmuel 11656328 Cl. G01S 7/4004.
Ura, Masato: See--
Nakano, Yuki; Ura, Masato; Takao, Koji; Sakurai, Hideyuki; Hotta, Keisuke; Masutani, Rieko; Hanawa, Atsushi; Ohmi, Masanobu; Hayashi, Takashi; Nabata, Atsushi; and Sakaguchi, Tetsuro 11657717 Cl. G08G 1/202.
Urabe, Yohei: See--
Kikuchi, Kenta; and Urabe, Yohei 11654803 Cl. B60N 2/5657.
Urabe, Yoshio: See--
Chitrakar, Rojan; Huang, Lei; and Urabe, Yoshio 11659489 Cl. H04W 52/0235.
Urahama, Hidehiro; to NEC Platforms, Ltd. Cleaning enabling device, cleaning device, and magnetic tape device 11657838 Cl. G11B 5/41.
Urakawa, Kei: See--
Aoki, Hitoshi; Gotoh, Toshihisa; Urakawa, Kei; Takamatsu, Kishoh; Konishi, Tomohiro; and Inoue, Tsuguhisa 11653820 Cl. A61B 1/00147.
Urakawa, Yutaka; Watanabe, Satoshi; Ito, Katsuaki; Banno, Hirokazu; Yamamoto, Kazutaka; Miyazawa, Masafumi; Shimada, Yusuke; and Nagasaki, Takeshi, to BROTHER KOGYO KABUSHIKI KAISHA Communication apparatus, control program of communication apparatus, and relay apparatus providing efficient download of electronic data 11656825 Cl. G06F 3/1285.
Urano, Yasuteru; Kamiya, Mako; and Hayashi, Kento, to THE UNIVERSITY OF TOKYO Prodrug-type anticancer agent using cancer-specific enzymatic activity 11655269 Cl. C07H 23/00.
Urban Armor Gear, LLC: See--
Armstrong, Steven 11653733 Cl. A45C 13/002.
Urban, Christopher S.: See--
Petilli, Eugene M.; Urban, Christopher S.; and Cusack, Jr., Francis J. 11659260 Cl. H04N 23/11.
Urban, David: See--
Gilson, Ross; Urban, David; and Davey, James 11659541 Cl. H04W 72/12.
Urian, Jeff Howard: See--
Mensch, Martin Wayne; Fisher, Brandon William; Douglass, Robert Stephen; Zurface, Austin Robert; Urian, Jeff Howard; David, James; Suda, Bharath; Soni, Asheesh; Gerving, Karsten; Vollmar, Guido; Schmitz, Gerd; Bausch, Christoph; Molitor, Ute; Friedrichsen, Lutz; Schroeder, Kai; Otte, Julia; Philipsohn, Madeline; Roesner, Norbert; Lang, Volker; Meissner, Johannes; D'Amico, Paolo; Shah, Jalpa; Wang, Meng; Piyabongkarn, Damrongrit; Ramseyer, Niles Stephen; Dukaric, Dennis; Haylock, Matt; and Griffiths, Justin Keith 11658477 Cl. H02H 7/085.
Urmson, Christopher Paul: See--
Smith, Warren; Eade, Ethan; Anderson, Sterling J.; Bagnell, James Andrew; Nabbe, Bartholomeus C.; and Urmson, Christopher Paul 11654917 Cl. B60W 40/04.
Urtasun, Raquel: See--
Zhang, Chris Jia-Han; Luo, Wenjie; and Urtasun, Raquel 11657603 Cl. G06V 20/41.
USA, as represented by the Secretary, Dept. of Health and Human Services, The: See--
Bonnemann, Carsten G.; Bolduc, Veronique; Muntoni, Francesco; Wilton, Steve; Macarthur, Daniel; Lek, Monkol; and Cummings, Beryl 11655470 Cl. C12N 15/113.
USA Intellectual Property Holding, Inc.: See--
Goff, James Earl; and Vajanyi, III, John P. 11659414 Cl. H04W 24/02.
Usami, Makoto: See--
Yoshida, Kazuhiro; Katoh, Takamichi; Tada, Takashi; Kawamoto, Hiroyuki; Usami, Makoto; and Ono, Kenichi 11657477 Cl. G06T 3/4038.
Ushiroda, Hiroshi; Okada, Naobumi; and Hirose, Kenji, to SONY OLYMPUS MEDICAL SOLUTIONS INC. Medical observation system, control method, and program in which illumination light is controlled in accordance with a usage state of an image sensor 11653826 Cl. A61B 1/0655.
USI TECHNOLOGIES, INC.: See--
Wampler, Christopher 11657115 Cl. G06F 16/958.
Usui, Hideyuki: See--
Mase, Yusuke; Usui, Hideyuki; Moriya, Yoshiaki; Ohachi, Jiro; Tomiku, Yuki; Misumi, Yuji; Narita, Tetsuhiro; and Onitsuka, Masakatsu 11654901 Cl. B60W 30/09.
Usui, Yuki: See--
Kitano, Hiromi; Nakaji, Tadashi; Usui, Yuki; Nishino, Taito; and Kishioka, Takahiro 11655273 Cl. C07K 7/62.
Uszkoreit, Jakob D.: See--
Chan, William; Stern, Mitchell Thomas; Kitaev, Nikita; Gu, Kelvin; and Uszkoreit, Jakob D. 11657277 Cl. G06N 3/08.
UT-BATTELLE, LLC: See--
Puente, Bryan P. Maldonado; Kaul, Brian C.; Schuman, Catherine D.; Mitchell, John Parker; and Young, Steven R. 11655775 Cl. F02D 41/2438.
Utah State University: See--
Hassan, Rohail; Wang, Hongjie; and Zane, Regan A. 11656297 Cl. G01R 31/40.
Utility Global, Inc.: See--
Dawson, Matthew; Farandos, Nicholas; Dana, Jason; and Dawson, Jin 11655546 Cl. C25B 1/02.
Utley, Alek D.: See--
Utley, David S.; Utley, Jack D.; Utley, Kathryn M.; Utley, Alek D.; Utley, Haley G.; Utley, MacKenzie T.; and Utley, Emma K. 11653878 Cl. A61B 5/4848.
Utley, David S.; Utley, Jack D.; Utley, Kathryn M.; Utley, Alek D.; Utley, Haley G.; Utley, MacKenzie T.; and Utley, Emma K., to Pivot Health Technologies Inc. Systems and methods for quantification of, and prediction of smoking behavior 11653878 Cl. A61B 5/4848.
Utley, Emma K.: See--
Utley, David S.; Utley, Jack D.; Utley, Kathryn M.; Utley, Alek D.; Utley, Haley G.; Utley, MacKenzie T.; and Utley, Emma K. 11653878 Cl. A61B 5/4848.
Utley, Haley G.: See--
Utley, David S.; Utley, Jack D.; Utley, Kathryn M.; Utley, Alek D.; Utley, Haley G.; Utley, MacKenzie T.; and Utley, Emma K. 11653878 Cl. A61B 5/4848.
Utley, Jack D.: See--
Utley, David S.; Utley, Jack D.; Utley, Kathryn M.; Utley, Alek D.; Utley, Haley G.; Utley, MacKenzie T.; and Utley, Emma K. 11653878 Cl. A61B 5/4848.
Utley, Kathryn M.: See--
Utley, David S.; Utley, Jack D.; Utley, Kathryn M.; Utley, Alek D.; Utley, Haley G.; Utley, MacKenzie T.; and Utley, Emma K. 11653878 Cl. A61B 5/4848.
Utley, MacKenzie T.: See--
Utley, David S.; Utley, Jack D.; Utley, Kathryn M.; Utley, Alek D.; Utley, Haley G.; Utley, MacKenzie T.; and Utley, Emma K. 11653878 Cl. A61B 5/4848.
Utterberg, Mats; to VOLVO CAR CORPORATION Front air outlet D0986790 Cl. D12‑192.
Uyghur, Dilhumar: See--
Oda, Tsuneo; Ito, Yoshiteru; Miyazaki, Tohru; Takeuchi, Kohei; Tokunaga, Norihito; Hoashi, Yasutaka; Hattori, Yasushi; Imamura, Keisuke; Kajita, Yuichi; Miyanohana, Yuhei; Sugimoto, Takahiro; Koike, Tatsuki; and Uyghur, Dilhumar 11655241 Cl. C07D 405/12.
Uziel, Lior: See--
Zach, Noam; Wolf, Guy; Levy, Sharon; Eger, Ory; Ben Shahar, Ori; Uziel, Lior; and Touboul, Assaf 11659383 Cl. H04W 12/037.
Uzoh, Cyprian Emeka; Sitaram, Arkalgud R.; and Enquist, Paul, to ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC. Stacked dies and methods for forming bonded structures 11658173 Cl. H01L 25/50.