LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 12th DAY OF August, 2025
AND TO WHOM
REEXAMINATION CERTIFICATES AND PATENT TRIAL AND APPEAL BOARD CERTIFICATES WERE ISSUED
DURING THE WEEK BEGINNING THE 4th DAY OF August, 2025.
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

EAGLE INDUSTRY CO., LTD.: See--
Ou, Iwa; Imura, Tadatsugu; Suzuki, Hiroshi; and Tokunaga, Yuichiro 12385567 Cl. F16J 15/3412.
Eapen, George: See--
Chong, Joseph; Eapen, George; and Joshi, Rajesh 12388474 Cl. H04B 1/0096.
Eardley, Edward Charles: See--
Davis, Roger B.; Eardley, Edward Charles; and Amend, Ryan S. D1087718 Cl. D8‑68.
Earikireddy, Praneeth Kumar Reddy: See--
Bhandari, Nikhil; Dommeti, Vamshi Krishna; and Earikireddy, Praneeth Kumar Reddy 12388791 Cl. H04L 63/0272.
Earl, Jeffrey S.: See--
Shah, Shreyas; Apostol, Jr., George; Subramaniyan, Nagarajan; Regula, Jack; and Earl, Jeffrey S. 12386751 Cl. G06F 12/0868.
Earle, Adam: See--
Cosentino, Romain; and Earle, Adam 12387107 Cl. G06N 3/0985.
Earley, Leighanne; and Platt, Steven, to Aston Martin Lagonda Limited Dashboard for automobile or replica thereof D1087848 Cl. D12‑192.
Earley, Leighanne; to Aston Martin Lagonda Limited Binnacle for automobile or replica thereof D1087849 Cl. D12‑192.
Earley, Leighanne; and Platt, Steven, to Aston Martin Lagonda Limited Air vent for automobile or replica thereof D1087852 Cl. D12‑192.
EarthDaily Analytics USA, Inc.: See--
Warren, Michael S. 12384561 Cl. B64G 1/1021.
East Carolina University: See--
Brewer, Kori; and Clemens, Stefan 12383551 Cl. A61K 31/485.
EAST CHINA NORMAL UNIVERSITY: See--
Zeng, Heping; Hu, Mengyun; and Qiao, Wei 12384725 Cl. C04B 35/563.
EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY: See--
Mu, Bozhong; Zhou, Lei; Liu, Yifan; Yang, Shizhong; and Wu, Jun 12384956 Cl. C09K 8/54.
East Mountain Outfitters LLC: See--
Owen, Charles Blake; and Owen, Bryce Allen 12384302 Cl. B60R 9/10.
Eaton Intelligent Power Limited: See--
Dawson, James; Degen, Jason; Natter, Brantley; Zeidan, Mohamad; and Pavlovic, Slobodan 12388211 Cl. H01R 13/44.
Witherbee, Martin L.; and Semple, Shane A. D1087923 Cl. D13‑152.
Eatron Technologies Limited: See--
Ozdemir, Halil Umut; Ozkan, Ali Ibrahim; Yavas, Muharrem Ugur; Erhan, Can; and Kurtulus, Can 12385980 Cl. G01R 31/388.
Eaves, Felmont; to BRIJ Medical, Inc. Force modulating tissue bridge 12383270 Cl. A61B 17/085.
Ebben, Scott S.: See--
Van De Hey, Joseph F.; Zirbel, Alex M.; Kuffel, Alex N.; VanHandel, Jeffery J.; Daniels, Grant D.; and Ebben, Scott S. 12383924 Cl. B05C 5/027.
Ebbinghaus-Kintscher, Ulrich: See--
Turberg, Andreas; Heisler, Iring; Telser, Joachim; Arlt, Alexander; Jeschke, Peter; Schwarz, Hans-Georg; Fuesslein, Martin; Cancho Grande, Yolanda; Ilg, Kerstin; Ebbinghaus-Kintscher, Ulrich; Loesel, Peter; Linka, Marc; Damijonaitis, Arunas Jonas; and Limberg, Ingo 12384769 Cl. C07D 413/14.
Ebeling, Mick; Biscaro Loureiro, Daniel; Hanlon, Patrick; and Putrino, David Francis, to Not Impossible, LLC Vibrotactile control systems and methods 12387577 Cl. G08B 6/00.
Ebener, Michael Gilbert: See--
Smith, Austin Lee; Deshpande, Deepak; Krishnan, Vidyanand; Ebener, Michael Gilbert; Katz, Arnon; and Seetharaman, Prakash 12387168 Cl. G06Q 10/0834.
Ebenstein, Yuval; Zirkin, Shahar; Margalit, Sapir; and Michaeli Hoch, Yael, to Ramot at Tel-Aviv University Ltd. Multi-sample array chip for DNA modification quantification 12385161 Cl. C40B 30/04.
Eberhart, David: See--
Ogg, James; Eberhart, David; Nielsen, William D.; Franklin, Helen; and Jovanovich, Stevan B. 12385933 Cl. G01N 35/00663.
Eberler, Ludwig: See--
Ritter, Dieter; and Eberler, Ludwig 12386001 Cl. G01R 33/543.
Eberman, Kevin W.: See--
Mitchell, Michael H; Dadalas, Michael C.; Muggli, Mark W.; Traunspurger, Helmut; Streiter, André; Eberman, Kevin W.; and Bartling, Brandon A. 12388089 Cl. H01M 4/625.
Ebersole, Garrett P.: See--
Baril, Jacob C.; Banerjee, Saumya; Thomas, Justin; Dinino, Matthew A.; Pilletere, Roy J.; Roy, Nicolette L.; and Ebersole, Garrett P. 12383303 Cl. A61B 17/3423.
Ebert, Jasmin: See--
Muenzner, Sebastian; Condurache, Alexandru Paul; Glaeser, Claudius; Timm, Fabian; Drews, Florian; Faion, Florian; Ebert, Jasmin; Rosenbaum, Lars; Ulrich, Michael; Stal, Rainer; and Gumpp, Thomas 12386059 Cl. G01S 13/867.
Ebertz, Joy: See--
Pearl, Annie; Duvall, Matthew Taro; Ebertz, Joy; Valdez, Victor; and Cipolla, Steven 12386475 Cl. G06F 3/048.
Ebisu, Kenshiro: See--
Kawai, Kento; Kou, Mintei; Hoyashita, Kouki; Hiraki, Kouhei; Waseda, Futa; Chada, Kazuki; Aihara, Toshiki; and Ebisu, Kenshiro 12387530 Cl. G06V 40/20.
Ebisuno, Soichi; to OMRON Corporation Estimation device, learning device, teaching data creation device, estimation method, learning method, teaching data creation method, and recording medium for estimating skeleton information of subject based on image thereof 12387369 Cl. G06T 7/73.
ebm-papst Mulfingen GmbH & Co. KG: See--
Bürkert, Martin; Haas, Günter; Rupp, Thomas; König, Daniel; and Bader, Andreas 12388333 Cl. H02K 11/33.
Ebrahimbabaie Varnosfaderani, Pouyan; Stahl, Johannes; and Muehlmann, Ulrich Andreas, to NXP B.V. Method and detector for detecting a presence of a wireless device 12387063 Cl. G06K 7/10237.
EBUDDY TECHNOLOGIES B.V.: See--
Taylor, Paulo; Rueb, Jan-Joost; and Bakker, Onno 08510395.
Taylor, Paulo; Rueb, Jan-Joost; and Bakker, Onno 09584453.
Echavarria, Jonathan R.: See--
Murphy, Brian P.; Partlow, Joe; O'Connor, Colin; Pfeiffer, Jason; Murphy, Brian Philip; and Echavarria, Jonathan R. 12388863 Cl. H04L 63/1441.
eCHEMICLES ZRT.: See--
Danyi, Antal; Darvas, Ferenc; Endrödi, Balázs; Janáky, Csaba; Jones, Richard; Kecsenovity, Egon; Samu, Angelika; and Török, Viktor 12385146 Cl. C25B 1/135.
Echeverria Larraza, Ainhoa; Hansen, David Verne; Hotzel, Isidro; Hsiao, Yi-Chun; Lin, Zhonghua; Seshasayee, Dhaya; and Chih, Benny, to Genentech, Inc. Agonists of TREM2 12384844 Cl. C07K 16/2803.
Eckel, Bob; and Lazzouni, Mohamed, to AWARE, INC. AdHoc enrollment process 12386937 Cl. G06F 21/32.
Ecker, Ady; to INUITIVE LTD. Method for filling missing disparity values of pixels comprised in an image 12387301 Cl. G06T 5/77.
ECOLAB USA INC.: See--
Davis, Danny; Urhahn, Francis; Bickel, Michael; Bernard, Nolan; and Smith, Richard 12382944 Cl. A01M 13/003.
Gao, Jinsen; Zheng, Yan; and Ji, Liang 12384986 Cl. C11D 3/042.
Lake, Larry Arvid; Manderfield, Morgan Ann; Olson, Joelle Francine; Reategui, Liliana; and Schwartz, Daniel Ronald 12386093 Cl. G01V 3/02.
Li, Junzhong; Bunders, Cynthia; Staub, Richard; Schacht, Paul Frazer; Power, Caleb; Balasubramanian, Ramakrishnan; Ryther, Robert J.; and Hanson, Catherine 12382955 Cl. A01N 37/16.
Scholz, John Nathan; Thornthwaite, Philip Andrew; Pennington, Janelle Leigh; Marquez, Maria DeJesus; and Zenasni, Oussama 12385143 Cl. C23F 11/149.
Wei, Wenbin; Zhang, Ying; Ding, Zhili; and Yu, Huarong 12383647 Cl. A61L 2/24.
ECONIC TECHNOLOGIES LTD.: See--
Leeland, James; Kabir, Rakibul; Riley, Kerry; and Kember, Michael 12384880 Cl. C08G 64/183.
ECOPIA TECH CORPORATION: See--
Shu, Yuanming; Tan, Shuo; Zhao, Tuan; and Mo, Huansheng 12387456 Cl. G06V 10/44.
ECOPLASTIC CORPORATION: See--
Im, Yoon; Jung, Dae Ig; Kim, Eun Sue; Kim, Joo Hwa; Jo, In Ho; and Park, Hae Ju 12384284 Cl. B60N 3/001.
Eda, Masakatsu: See--
Naito, Yasutaka; Imazu, Koichi; Miyoshi, Noriyuki; Kimura, Kouichi; Hasegawa, Makoto; Nakamura, Satoshi; and Eda, Masakatsu 12384643 Cl. B65H 29/125.
Edamoto, Toshiyuki: See--
Katayama, Hideaki; Kishimi, Mitsuhiro; Edamoto, Toshiyuki; Sato, Yoshinori; and Kuroki, Yasutaka 09166251.
Edd, Jon F.; Kaastrup, Kaja; Kapur, Ravi; and Toner, Mehmet, to General Hospital Corporation, The Size-based particle separation and concentration using particle size amplification 12385908 Cl. G01N 33/54366.
Eddy, Patrick E.; and Kilcran, Michael D., to Parasol Medical, LLC Intravenous fluid bag with an integrated valve having a seal with a compressed state that permits fluid flow into the bag and a relaxed state preventing fluid flow 12383464 Cl. A61J 1/1475.
Edelman, Michael; to Loungera, Inc. Outdoor chaise lounge with integrated lock-box and communications system 12385316 Cl. E05G 1/005.
Eden, Scott Bumper car D1088165 Cl. D21‑833.
Eder, Florian; Heller, Janis; Katzenberger, Tobias; and Plochmann, Bastian, to INNOMOTICS GMBH Electrical insulation system of an electric motor and production method for said electrical insulation system 12388334 Cl. H02K 15/12.
Eder, Josef: See--
Allinger, Patrick; Diekmann, Hanno; and Eder, Josef 12383769 Cl. A62B 3/005.
Ederyd, Stefan: See--
Larsson, Oskar; and Ederyd, Stefan 12385119 Cl. C22C 47/08.
Edge, Stephen William: See--
Catovic, Amer; Shrestha, Bharat; Lopes, Luis Fernando Brisson; Dhanda, Mungal Singh; Zisimopoulos, Haris; Phuyal, Umesh; Chaponniere, Lenaig Genevieve; and Edge, Stephen William 12389300 Cl. H04W 36/32.
Shrivastava, Avinash; and Edge, Stephen William 12389258 Cl. H04W 24/10.
Edge, Stephen William; Fischer, Sven; and Pon, Rayman, to QUALCOMM Incorporated Systems and methods to facilitate location determination by beamforming of a positioning reference signal 12389366 Cl. H04W 64/006.
Edgewater Networks, Inc.: See--
Conner, Mark J.; Quigley, Brian M.; and Reiman, Michael P. 12388677 Cl. H04L 12/4633.
EDISON INNOVATIONS, LLC: See--
King, Robert Dean; and Steigerwald, Robert Louis 12384260 Cl. B60L 53/14.
Edlund, Anna F.; to Lafayette College Degradation of sporopollenin 12385016 Cl. C12N 9/0065.
Edlund Tjernberg, Lisa: See--
Habjan, Meyanne; and Edlund Tjernberg, Lisa D1087760 Cl. D9‑443.
Edokpayi, Frank Isioma; to Overhead Door Corporation Adjustable breakout device 12385306 Cl. E05D 15/48.
Edrei, Eitan Yehiel; Reuven, Avi; Segev, Eran; Zommer, Shahaf; Schneider, Ron; and Ben-Yishai, Rani, to BEYEONICS SURGICAL LTD Systems and methods for imaging a body part during a medical procedure 12383124 Cl. A61B 1/04.
Edsall, Thomas J.: See--
Attar, Mohammadreza Alizadeh; Edsall, Thomas J.; Dharmapurikar, Sarang M.; and Vaidyanathan, Janakiramanan 12388755 Cl. H04L 47/125.
Education University of Hong Kong, The: See--
Fu, Hong; He, Ziyu; Wang, Yitong; and Li, Xiao 12387377 Cl. G06T 7/80.
Edwards, Cliff: See--
Pike, J. Eric; Edwards, Cliff; and Crouch, Will 12387155 Cl. G06Q 10/063114.
Edwards, Erik W.: See--
Duong, Anthony D.; and Edwards, Erik W. 12383492 Cl. A61K 9/0024.
Edwards, Henry Litzmann; Khayat, Joseph Maurice; and Venugopal, Archana, to Texas Instruments Incorporated High voltage avalanche diode for active clamp drivers 12389640 Cl. H10D 62/108.
Edwards, Joshua: See--
Maiman, Tyler; Osborn, Kevin; and Edwards, Joshua 12387198 Cl. G06Q 20/355.
EDWARDS LIFESCIENCES CORPORATION: See--
Bak-Boychuk, Gregory; Rabito, Glen T.; Valencia, Juan; and Passman, Joseph Arthur 12383202 Cl. A61B 5/6869.
Han, Jingjia; and Shang, Hao 12385163 Cl. D01D 5/18.
Mourhatch, Ryan; and Liburd, Gregory G. 12383390 Cl. A61F 2/0095.
Valdez, Michael G. 12383400 Cl. A61F 2/2436.
Yang, Yimin; and Quach, Michael 12383397 Cl. A61F 2/2418.
Edwards-Millgate, Kelly Ann; to Rivendell Creations LLC Near field communication housing structure 12387078 Cl. G06K 19/0727.
Edwards Sordo, Diego Arturo: See--
D'Oracio De Almeida, Eduardo Fernando; Egger, James; Thakur, Amrith Singh; Zier, Lance Edward; and Edwards Sordo, Diego Arturo 12383995 Cl. B23P 19/10.
Ee, Kuen Chee: See--
Kotchaplayuk, Treesoon; Phu, Johnathan Hy-Tho; Ee, Kuen Chee; Glaess, David; and Keawlai, Piyawech 12389800 Cl. H10N 30/802.
Pankaew, Ekaratch; Ee, Kuen Chee; Sudachun, Preecha; Glaess, David; and Angsutanasombat, Chanatkarn 12387752 Cl. G11B 5/4833.
Effting, Andries Pieter Johan: See--
Voortman, Lenard Maarten; and Effting, Andries Pieter Johan 12387905 Cl. H01J 37/226.
Eftekhari, Amir; and Meike, Roger C., to Intuit Inc. Machine learning prediction of text to highlight during live automated text transcription 12387042 Cl. G06F 40/289.
Egami, Shigeki: See--
Shiraishi, Masayuki; Egami, Shigeki; Kawabe, Yoshio; Tatsuzaki, Yosuke; and Shibazaki, Yuichi 12383981 Cl. B23K 26/361.
Egami, Shinko; Yoshida, Takahiro; and Yamashita, Tatsuya, to TISM CO., LTD. Control device and setting device for sewing machine, and sewing machine 12385176 Cl. D05B 19/16.
Ege, Patrick C.; to Masonite Corporation Lite D1088281 Cl. D25‑103.
Egger, James: See--
D'Oracio De Almeida, Eduardo Fernando; Egger, James; Thakur, Amrith Singh; Zier, Lance Edward; and Edwards Sordo, Diego Arturo 12383995 Cl. B23P 19/10.
Eggers, Peter: See--
Bungter, Stefan; Reszat, Martin; and Eggers, Peter 12384649 Cl. B65H 59/005.
Eggleston, Jason: See--
Bosanac, Jonathan Michael; Geeringh, Christopher Robert; Eggleston, Jason; Jasinskyj, Lonhyn; and Sengenberger, John 12388711 Cl. H04L 41/0866.
Egress Software Technologies IP Limited: See--
Chapman, Jack; and Hazell, Thomas 12388846 Cl. H04L 63/1416.
Eguchi, Shingo: See--
Yamazaki, Shunpei; Nakamura, Daiki; Hatsumi, Ryo; Sato, Rai; and Eguchi, Shingo 12389745 Cl. H10K 50/856.
EGYM GMBH: See--
Sauter, Florian 12383793 Cl. A63B 24/0087.
Ehberger, Dominik: See--
Breuer, John; Ehberger, Dominik; and Firnkes, Matthias 12386164 Cl. G02B 21/0032.
Ehrat, Markus; Furrer, Claudio; and Luscher, Beat, to ORVINUM AG Apparatus for creating a hole in a glass container 12383983 Cl. B23K 26/389.
Ehrbrecht, Bernd: See--
Hedrich, Frank; Ehrbrecht, Bernd; Kattinger, Gerhard; and Kliche, Kurt 12385862 Cl. G01N 25/18.
Ehrhardt, Klaus; Pistor, Lothar; Uecker, Wieland; and Völzke, Ronald, to Siemens Energy Global GmbH & Co. KG Generator unit and method for operating a generator unit in a power plant 12388261 Cl. H02J 3/1885.
Ehrlichman, Yossef; Amrani, Ofer; and Ruschin, Shlomo, to Ramot at Tel-Aviv University Ltd. Linearized optical digital-to-analog modulator 12388533 Cl. H04B 10/516.
Ehrmann, Klaus: See--
Bakaraju, Ravi Chandra; Ehrmann, Klaus; Fedtke, Cathleen; Sankaridurg, Padmaja; and Ho, Arthur 12386203 Cl. G02C 7/086.
Ehrnsperger, Bruno Johannes: See--
Kamphus, Juliane; Ehrnsperger, Bruno Johannes; Simonyan, Arsen Arsenov; Collias, Dimitris Ioannis; McDaniel, John Andrew; James, Martin Ian; Gilbertson, Gary Wayne; Thomas, Jacqueline Besinaiz; and Sun, Yiping 12384900 Cl. C08J 11/10.
Ehteshami, John R.; and Zoghi, Mahyar, to Additive Implants, Inc. Dynamic inter vertebral spacer implant 12383410 Cl. A61F 2/447.
Eicher, Manuel; to Geobrugg AG Corrosion protection device, corrosion protection system, corrosion-protected embankment stabilization system, and method for corrosion-protected anchoring of a geotechnical anchor element 12385207 Cl. E02D 5/801.
Eichhorn, Alexander; and Hettinger, Alexander, to Robert Bosch GmbH Internal combustion engine with spark plug and prechamber spark plug 12385446 Cl. F02F 1/242.
Eichhorn, Reinhold: See--
Koeppl, Alois; Eichhorn, Reinhold; Schmitt, Jana; and Fuellgrabe, Martin 12384063 Cl. B26B 19/06.
Eichhorn, Tim: See--
Schwartz, Ilai; Parker, Anna; Knecht, Stephan; Eichhorn, Tim; and Blanchard, John 12385994 Cl. G01R 33/3628.
Eichmann, Shannon L.: See--
Sandu, Constantin; and Eichmann, Shannon L. 12385858 Cl. G01N 23/046.
Eikelenberg, Nicole Leonarda Wilhelmina: See--
Aslandere, Turgay Isik; and Eikelenberg, Nicole Leonarda Wilhelmina 12387087 Cl. G06N 3/0455.
Eilert, Sean S.: See--
Parekh, Kunal R.; Hush, Glen E.; Eilert, Sean S.; and Zaidy, Aliasger T. 12387780 Cl. G11C 11/4093.
Einan, David: See--
Gillespie, Ronald; Perkins, Thad; Fabry, Tim; Dohnalik, Al; Piotrowski, Tom; and Einan, David 12384578 Cl. B65B 25/146.
Einhorn, Erik: See--
Lothe, Pierre; Einhorn, Erik; Homann, Hanno; Lindner, Julian; Seer, Maurice; and Knorr, Moritz Michael 12385759 Cl. G01C 21/3859.
Einy, Gilad: See--
Berger, Amir; Leshem, Eli; Rapoport, Boris; and Einy, Gilad 12383468 Cl. A61J 1/2096.
EIS GmbH: See--
Dumler, Alex; Yzusqui Burkard, Mariana Rosa; and Rosenlind, Rebecka D1088259 Cl. D24‑215.
Eisai R&D Management Co., Ltd.: See--
Shimizu, Masashi; Sato, Toshitaka; and Arita, Yoshihisa 12384824 Cl. C07K 14/4753.
Eisenbart, Bernd: See--
Lugert, Michael; Eisenbart, Bernd; and Oblinger, Werner 12383112 Cl. A47L 15/22.
Eisenfeld, Tsion; and Chriki, Ronen, to Lumus Ltd. Optical systems including light-guide optical elements with two-dimensional expansion 12386114 Cl. G02B 6/0061.
Eisenfrats, Kevin; and Grover, Gregory, to Contraline, Inc. Contraceptive devices 12383421 Cl. A61F 6/206.
Eisert, Peter: See--
Hellge, Cornelius; Schierl, Thomas; Eisert, Peter; Hilsmann, Anna; Skupin, Robert; Sánchez De La Fuente, Yago; Morgenstern, Wieland; and Bhullar, Gurdeep Singh 12387433 Cl. G06T 17/205.
Eitschberger, Christian; Burmeister, Gernot Uwe; and Shahinpour, Arash, to DynaEngergetics Europe GmbH Perforating gun assembly with rotating shaped charge holder 12385369 Cl. E21B 43/119.
Eivazi, Anna: See--
Kroschel, Alexander; Ilin, Alexander; Michalowski, Andreas; Ridderbusch, Heiko; Vinogradska, Julia; Tighineanu, Petru; and Eivazi, Anna 12383977 Cl. B23K 26/03.
Ejiri, Kouichirou: See--
Sato, Jumpei; Ejiri, Kouichirou; Oono, Kazuhiro; and Yada, Tomoki 12384351 Cl. B60W 10/06.
Ek, Steven W.: See--
Sikora, George; and Ek, Steven W. 12383307 Cl. A61B 17/683.
Ekelund, Magnus: See--
Maderud, Carl-Johan; Sundstrom, Johan; Ekelund, Magnus; and Englund, Sven 12383956 Cl. B22F 3/15.
Eker, Johan: See--
Svensson, Fredrik; Skarin, Per; Eker, Johan; and Millnert, Victor 12388754 Cl. H04L 47/125.
EKO Development LTD: See--
Chen, Yizhi D1088389 Cl. D34‑9.
Ekpenyong, Anthony Edet: See--
Chen, Runhua; Onggosanusi, Eko N.; Bendlin, Ralf Matthias; and Ekpenyong, Anthony Edet 12388552 Cl. H04J 11/0053.
Ekshinge, Sunil S.: See--
Allard, Paul Bennett; Aurand, Wesley J.; Bauman, Gregory Edward; Ekshinge, Sunil S.; and Phalak, Sanket V. 12385797 Cl. G01L 19/148.
Ekshinge, Sunil Shivaji: See--
Allard, Paul Bennett; Ekshinge, Sunil Shivaji; McCray, Chad Eric; and Guizoni, Jr., Jose 12385690 Cl. F25D 23/063.
Eksler, Vaclav; to VOICEAGE CORPORATION Method and system for coding metadata in audio streams and for flexible intra-object and inter-object bitrate adaptation 12387734 Cl. G10L 19/167.
El-Chammas, Manar Ibrahim; Tripathi, Vaibhav; and Agrawal, Jagdish Kumar, to Omni Design Technologies, Inc. Latchup detector and clock loss detector 12385972 Cl. G01R 31/31727.
El Fajri, Oumnia: See--
Denison, Carson; Seaver, Richard W.; Torniainen, Erik D.; Kornilovich, Pavel; Govyadinov, Alexander; Jebakumar, Anand Samuel; and El Fajri, Oumnia 12383876 Cl. B01F 33/3012.
El Ghusayni, Roudi; Al Burr, Wafa; and Al Zahrani, Ahmed S., to Arkan Al Falah Company for Industry Non-destructive testing and cleaning apparatus 12385882 Cl. G01N 29/265.
ELAGO CO. LTD: See--
Lee, Chanwoo D1087973 Cl. D14‑253.
Elanco Animal Health GmbH: See--
Turberg, Andreas; Heisler, Iring; Telser, Joachim; Arlt, Alexander; Jeschke, Peter; Schwarz, Hans-Georg; Fuesslein, Martin; Cancho Grande, Yolanda; Ilg, Kerstin; Ebbinghaus-Kintscher, Ulrich; Loesel, Peter; Linka, Marc; Damijonaitis, Arunas Jonas; and Limberg, Ingo 12384769 Cl. C07D 413/14.
Elati, Noam: See--
Livne, Sarig; Elati, Noam; Krishnan, Hemanth; Krishna Iyer, Venkidesh; Conyers, Adam; and Lefevre, Michael G. 12388760 Cl. H04L 47/2441.
Elazzami, Bassem; Sayyed, Ibrahim; and Montero, Adolfo S., to Dell Products L.P. Embedded controller method for prevention of denial of service attacks 12386954 Cl. G06F 21/554.
Elbadri, Faris M.: See--
Verel, Aliette; and Elbadri, Faris M. 12382965 Cl. A21D 6/003.
ELBIT SYSTEMS LTD.: See--
Aburmad, Shimon; Charny, Adi; Gil, Yotam; Ben Ishai, Liad; and Toledano, Yaniv 12386183 Cl. G02B 27/0172.
Electra Aero, Inc.: See--
Masefield, Oliver; Courtin, Christopher B.; and Hansman, Jr., Robert John 12384550 Cl. B64D 31/06.
ELECTRIC HYDROGEN CO.: See--
Jain, Aryan; McDermott, Adam; and Xu, Walter 12385150 Cl. C25B 9/77.
ELECTRIC LINE TECHNOLOGIES, LLC: See--
Derouen, Derrick P. 12385515 Cl. F16B 39/282.
ELECTRIC MIRROR, LLC: See--
Huang, Yao-Yuan; and Erickson, Patrick Daniel D1087622 Cl. D6‑308.
Electric Power Science & Research Institute of State Grid Tianjin Electric Power Company: See--
Fang, Shengchen; Yu, Yang; Li, Weibo; Song, Pengxian; He, Chun; Zhang, Chi; Tang, Qinghua; Li, Longji; Zhang, Chunhui; Li, Songyuan; Lu, Fei; Li, Lin; Yang, Lei; Wang, Xiaoguang; Zhu, Xuliang; Duan, Minghui; Wang, Haoming; and Fan, Wei 12385966 Cl. G01R 31/14.
Electro Scan, Inc.: See--
Hansen, Charles A.; Blottie, Sean; Campos, Matthew; VanBergen, Thomas; Mullinix, Janine; Hansen, Sonja; Hansen, Bianca; Hansen, Morgan; and Zaharie, Valeri 12385865 Cl. G01N 27/041.
Electronic Arts Inc.: See--
Phan, Hau Nghiep 12387409 Cl. G06T 13/40.
Taillandier, Robin; Ferrario, Andrea; Gomer, Simon; Taslaman, Leo; and Matsumiya, Masatoshi 12387432 Cl. G06T 17/205.
Electronic Theatre Controls, Inc.: See--
Cahalane, David J. 12389511 Cl. H05B 47/105.
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE: See--
Bang, Gun; and Lim, Woong 12388981 Cl. H04N 19/105.
Choi, Sung Woo 12388576 Cl. H04L 1/1812.
Jang, Jae Yoon; Kim, Jae Hong; and Yoon, Ho Sub 12386781 Cl. G06F 16/119.
Jang, YongWon; Park, Hwin Dol; Ahn, Chang-Geun; Kim, Do Hyeun; Kim, Seunghwan; Noh, Hyung Wook; Chung, Kwang Hyo; and Choi, Jae Hun 12385889 Cl. G01N 33/0006.
Jeong, Chi Yoon; Kim, Moo Seop; Moon, Kyeong Deok; and Park, Yun Kyung 12387336 Cl. G06T 7/10.
Kang, Jung Won; Lee, Ha Hyun; Lim, Sung Chang; Lee, Jin Ho; Jeon, Byeung Woo; and Park, Jee Yoon 12389006 Cl. H04N 19/132.
Kang, Jung Won; Lee, Ha Hyun; Lim, Sung Chang; Lee, Jin Ho; and Kim, Hui Yong 12388986 Cl. H04N 19/107.
Kim, Hee Wook 12388554 Cl. H04J 13/0048.
Kim, Jung Bin 12386077 Cl. G01S 19/256.
Lee, Jin Ho; Kang, Jung Won; Lee, Ha Hyun; Lim, Sung Chang; Kim, Hui Yong; Kim, Jae Gon; Park, Do Hyeon; Yoon, Yong Uk; and Lee, Yung Lyul 12389005 Cl. H04N 19/13.
Lim, Kyongchun; Youn, Chun Ju; Choe, Joong-Seon; Kim, Minchul; and Choi, Byung-seok 12388630 Cl. H04L 9/0852.
Lim, Sung Chang; Kang, Jung Won; Lee, Ha Hyun; Lee, Jin Ho; Kim, Hui Yong; and Kim, Dae Yeon 12389000 Cl. H04N 19/124.
Park, Sung-Ik; Kwon, Sun-Hyoung; Lee, Jae-Young; Kim, Heung-Mook; and Hur, Nam-Ho 12388467 Cl. H03M 13/2757.
Seo, Hong-Seok; Song, Dong Hoon; Park, Jeong Won; and Huh, Chul 12385836 Cl. G01N 21/645.
ELECTRONICS FOR IMAGING, INC.: See--
Salamone, Filippo 12384175 Cl. B41J 11/42.
ELECTROSEA, LLC: See--
Cosentino, Louis Ciro; Cosentino, Daniel L.; and Golden, Brian Alan 12384702 Cl. C02F 1/4674.
Element Energy, Inc.: See--
Kahn, Seth Marshall; Cammi, Corrado; and Stratakos, Anthony John 12388285 Cl. H02J 7/00714.
Element Six (UK) Limited: See--
Ghosh, Santonu 12383976 Cl. B23K 20/1255.
Eleos Pharmaceuticals, Inc.: See--
Buice, Mona E.; Sailors, David M.; and Greeson, Joshua Z 12383607 Cl. A61K 38/28.
ELESA S.P.A.: See--
Bertani, Alberto D1087725 Cl. D8‑303.
Elettromedia s.p.a.: See--
Girotti, Luca; and Pantaleone, Pietro 12389147 Cl. H04R 1/028.
ElGhamrawy, Mohamed: See--
Azouaoui, Melissa; ElGhamrawy, Mohamed; Renes, Joost Roland; and Schneider, Tobias 12388657 Cl. H04L 9/3247.
Elgharabawy, Mounir: See--
Wildsmith, Jeremy Allen; and Elgharabawy, Mounir 12388849 Cl. H04L 63/1416.
Elghazaly, Ahmed: See--
Elsheikh, Ahmad K; ElSahhar, Bassem; Abdelkader, Aya; Abdelkader, Mohamed; Tarek, Bassem; ElSayed, Omar; Ahmed, Ziad; and Elghazaly, Ahmed D1088238 Cl. D24‑181.
Elghazzawi, Ziad F.: See--
Freeman, Gary A.; Pan, Jing; and Elghazzawi, Ziad F. 12383460 Cl. A61H 31/005.
Elhadi, Belaifa: See--
Abdelrahman, Moemen A.; Elhadi, Belaifa; and Chen, Zhen 12385818 Cl. G01N 7/14.
Elhaik, Yann: See--
Morenstein, Josh; and Elhaik, Yann D1088354 Cl. D28‑7.
Morenstein, Josh; and Elhaik, Yann D1088355 Cl. D28‑7.
Elharrouss, Omar: See--
Al-Maadeed, Somaya S. A. Ali; Al-Maadeed, Noor; Chaari, Mohamed-Zied; Akbari, Younes; Elharrouss, Omar; Al-Qitairi, Aisha Abdulla; Al-Thani, Alanood Ahmed; and Alsalem, Aldana 12387507 Cl. G06V 20/64.
ELI LILLY AND COMPANY: See--
Backfish, Matthew David; and Günay, Murat 12383681 Cl. A61M 5/31575.
Eliantte Group Inc.: See--
Buryev, Elliot D1087816 Cl. D11‑16.
Elias, Kevin M.: See--
Chowdhury, Dipanjan; Elias, Kevin M.; Fendler, Wojciech; and Stawiski, Konrad 12385099 Cl. C12Q 1/6886.
Eliashevsky, Ilya: See--
Santorello, Noah; Eliashevsky, Ilya; and Shelgren, Taylor 12387242 Cl. G06Q 30/0276.
Santorello, Noah; Eliashevsky, Ilya; and Shelgren, Taylor 12387243 Cl. G06Q 30/0276.
Elimelech, Nissan; Wolf, Stuart; and Krasney, Nitzan, to AUGMEDICS LTD. Mirroring in image guided surgery 12383369 Cl. A61B 90/37.
Elite Buffer LLC: See--
Chen, Jeff 12384211 Cl. B60G 11/22.
Elizabeth Warren, Lauren: See--
Warren, Jonathon; Elizabeth Warren, Lauren; and Yuan, Shi Gang D1087967 Cl. D14‑372.
ELKA INTERNATIONAL LTD.: See--
Yang, Jui-Ming; and Deng, Youyuan 12388227 Cl. H01R 43/0263.
Elkin, Ilyas: See--
Roy, Rajarshi; Godil, Saad; Raiman, Jonathan; Kant, Neel; Elkin, Ilyas; Siu, Ming Y.; Kirby, Robert; Oberman, Stuart; and Catanzaro, Bryan 12387028 Cl. G06F 30/394.
Elkins, Susanne: See--
Kotaru, Chandra; David, Prabu; and Elkins, Susanne 12389052 Cl. H04N 21/234309.
Ellappan, Parthiban: See--
Zhang, Danlu; Ellappan, Parthiban; Momeyer, Brian; and Pan, Jiaying 12383177 Cl. A61B 5/163.
Eller, Rick: See--
Buckfeller, Joseph; Eller, Rick; Rizer, John; Thrun, Lora; and Offord, Gary 12387913 Cl. H01J 37/32513.
Ellinger, Philipp: See--
Schönfeld, Dorian; Dröbner, Karoline; Weber, Ernst; Filarsky, Katharina; Ellinger, Philipp; McAleese Eser, Fionnuala Mary; Flamme, Ingo; Wunderlich, Winfried; Schmidt, Antje; Sedaghat, Yalda; and Young, Kenneth 12384843 Cl. C07K 16/2803.
Elliot, Ross F.; Haberman, Seth; Baumer, Michael A.; and Darwa, Nakul, to UNKNOT INC. Systems and methods for processing audiovisual data using latent codes from generative networks and models 12386882 Cl. G06F 16/532.
Elliott, Andrew: See--
Riegle, Connor; Boyd, Bailey; Lark, Andrew; Goulet, Grant; Elliott, Andrew; and Lamson, Kyle 12383014 Cl. A42B 3/12.
Elliott, Hunter L.: See--
Taylor-Weiner, Amaro N.; Pokkalla, Harsha Vardhan; Elliott, Hunter L.; Glass, Benjamin P.; Wapinski, Ilan N.; Khosla, Aditya; Resnick, Murray; Montalto, Michael C.; Beck, Andrew H.; Shanis, Zahil; Pedawi, Aryan; Le, Quang Huy; Wang, Jason K.; Pouryahya, Maryam; Leidal, Kenneth Knute; Carrasco-Zevallos, Oscar M.; Juyal, Dinkar; Biddle-Snead, Charles; and Wack, Katy 12383191 Cl. A61B 5/4244.
Elliott, Jason H.: See--
Monzon, Byron R.; Power, Bronwyn; Joly, Michael M.; Elliott, Jason H.; Li, Xuetao; and Miller, Christopher Beaudry 12385399 Cl. F01D 5/141.
Elliott, John A.: See--
Josse, Loïc; Peultier, Bertrand; Prevost, Julien J.; Elliott, John A.; Grizzard, Mark R.; and Bobbitt, Dustin 12383335 Cl. A61B 34/10.
Elliott, Leah: See--
Green, Chad; Martinson, Laura; Olson, Erik; Bellora, Val Anthony; Elliott, Leah; Grant, Richard Alexander; Koenig, Donald; and Strollo, Giacomo 12383670 Cl. A61M 5/14276.
Ellis, Jr., James Howard; Rademacher, Timothy John; and Williams, Jennifer Topmiller, to LEXMARK INTERNATIONAL, INC. Authentication using analog signal challenge 12386942 Cl. G06F 21/44.
Ellis, Matthew U-turn signal 12384291 Cl. B60Q 1/346.
Ellison, Kevin D.: See--
Britton, Rick A.; Britton, Jeffrey M.; and Ellison, Kevin D. 12387579 Cl. G08B 13/19682.
Britton, Rick A.; Britton, Jeffrey M.; and Ellison, Kevin D. 12387580 Cl. G08B 13/19682.
Ellson, Richard N.; Stearns, Richard G.; and Hadimioglu, Babur, to Labcyte Inc. Acoustic concentration, transfer and analysis of samples containing particles 12385820 Cl. G01N 15/10.
Elmaleh, David R.; and Shoup, Timothy M., to General Hospital Corporation, The Cromolyn esters and uses thereof 12383528 Cl. A61K 31/352.
Elmallah, Ahmed Safwat Mohamed Aboelenein; Khashaba, Amr Tarek Ahmed Abdelrazik; Abdullatif, Mohammed Mohsen Abdulsalam; and Ali, Tamer Mohammed, to MEDIATEK INC. Gain calibration of digitally controlled delay line 12388431 Cl. H03K 5/14.
Elo Touch Solutions, Inc.: See--
Noppenberger, David; Wang, Wei; Zhao, Xingdong; and Yang, Hui D1087968 Cl. D14‑375.
Eloul, Shaltiel; Moran, Sean; Silavong, Fanny; Kamthe, Sanket; and Georgiadis, Antonios, to JPMORGAN CHASE BANK, N.A. Systems and methods for federated model validation and data verification 12386979 Cl. G06F 21/577.
Elram, Elad Shmuel: See--
Moyal, Oshri; Maltabashi, Bar; and Elram, Elad Shmuel 12388727 Cl. H04L 41/5048.
ElSahhar, Bassem: See--
Elsheikh, Ahmad K; ElSahhar, Bassem; Abdelkader, Aya; Abdelkader, Mohamed; Tarek, Bassem; ElSayed, Omar; Ahmed, Ziad; and Elghazaly, Ahmed D1088238 Cl. D24‑181.
ElSayed, Omar: See--
Elsheikh, Ahmad K; ElSahhar, Bassem; Abdelkader, Aya; Abdelkader, Mohamed; Tarek, Bassem; ElSayed, Omar; Ahmed, Ziad; and Elghazaly, Ahmed D1088238 Cl. D24‑181.
Elsen, Erich; Hawthorne, Curtis; Odena, Augustus; Nye, Maxwell; Somani, Arushi; Vigen, Kyle; Bavishi, Rohan; Tasirlar, Sagnak; Vijitbenjaronk, Warut; Kirazci, Ulas; Gershenson, Joe; and Zarkesh, Shaya, to Anthropic, PBC Multimodal agent for efficient image-text interface automation 12387036 Cl. G06F 40/166.
Elsheikh, Ahmad K; ElSahhar, Bassem; Abdelkader, Aya; Abdelkader, Mohamed; Tarek, Bassem; ElSayed, Omar; Ahmed, Ziad; and Elghazaly, Ahmed, to ITXPros LLC Dental tooth guide D1088238 Cl. D24‑181.
Elsied, Ahmed M.: See--
Gawai, Trupti D.; Pratt, David S.; Elsied, Ahmed M.; Kewley, David A; Collins, Dale W.; Ahmed, Raju; Jordan, Chelsea M.; and Kotti, Radhakrishna 12387981 Cl. H01L 21/76883.
Eltawil, Ahmed M.: See--
Çelik, Abdulkadir; and Eltawil, Ahmed M. 12388495 Cl. H04B 7/04013.
Elucent Medical, Inc.: See--
Naumann, Charles Foard; Dean, Bryan; Kotula, Jeff; and Hiltner, Jason 12383349 Cl. A61B 34/20.
Embalo, Umaru: See--
Monceaux, Jerome; Ferreira, Sara; Embalo, Umaru; and Hong, Robert D1088042 Cl. D14‑494.
EMC IP Holding Company LLC: See--
Sethi, Parminder Singh; Goel, Akanksha; Chopra, Shelesh; and Saxena, Priyansh 12387045 Cl. G06F 40/30.
Weng, Lingdong; Liu, Bing; and Chen, Tao 12387135 Cl. G06N 20/00.
EMEL VENTURES, INC.: See--
Kim, Heuibae; Yoon, Hyunkeun; and Kim, Kyuyup 12387186 Cl. G06Q 20/123.
Emelyanov, Eugene: See--
Marsh, Jeffrey Carroll; Emelyanov, Eugene; Satti, Salar; and Stephan, Mark 12386912 Cl. G06F 16/9538.
eMemory Technology Inc.: See--
Chang, Chia-Fu; Lin, Chun-Hung; Peng, Jen-Yu; and Chuang, You-Ruei 12387804 Cl. G11C 17/18.
Emer, Joel: See--
Shao, Yakun; Venkatesan, Rangharajan; Wang, Miaorong; Smith, Daniel; Dally, William James; Emer, Joel; Keckler, Stephen W.; and Khailany, Brucek 12387089 Cl. G06N 3/063.
Emerson Electric Co.: See--
Fauss, Taylor M.; Jadhav, Vikas Mahadev; Doke, Rahul Shrihari; Meher, Vivek Balasaheb; Paul, Karan Ravindra; Patil, Mahesh Baburao; Kale, Pankaj Pandurang; and Burch, Christopher D1087733 Cl. D8‑349.
Emilio Serrano, Diego: See--
Rahafrooz, Amir; Emilio Serrano, Diego; Nunan, Thomas Kieran; and Jafri, Ijaz 12388411 Cl. H03H 9/02433.
Emmanuel, Daina: See--
Chandrashekar, Padmassri; Emmanuel, Daina; and Harb, Reda 12389083 Cl. H04N 21/6587.
Shah, Akshay Chetan; Chandrashekar, Padmassri; and Emmanuel, Daina 12389068 Cl. H04N 21/44218.
Emmett, Robert: See--
Dittmann, Leander; and Emmett, Robert 12382989 Cl. A24F 40/05.
Emmons, Kirsten: See--
Meyerson, Craig M.; Jensen, Eric P; Fitzgibbons, Stacey Ann; Chahal, Jotpreet; Emmons, Kirsten; and Zapfe, Lori Ann 12387824 Cl. G16H 10/65.
EMOCOG Co., Ltd.: See--
Lee, Eun Jung; Shin, Eun Jie; and Lee, Su Bin D1088019 Cl. D14‑485.
Emory University: See--
Gavegnano, Christina; and Schinazi, Raymond F. 12383558 Cl. A61K 31/519.
Liotta, Dennis; and Giesler, Kyle 12383568 Cl. A61K 31/661.
Emoto, Yuki: See--
Somano, Toshiaki; Yamamoto, Kosuke; Sakurai, Norio; Emoto, Yuki; and Muro, Kentaro 12384168 Cl. B41J 11/0005.
empirical innovations, inc.: See--
Roth, Nicholas A. 12382970 Cl. A23B 2/001.
Enam, Syed Aziz; to GM Cruise Holdings LLC Continuous radar calibration check 12386057 Cl. G01S 13/865.
Enami, Takuya; Fujimoto, Seiichi; and Kaneko, Masaaki, to AISIN CORPORATION Valve opening and closing timing control device 12385421 Cl. F01L 1/344.
Enanta Pharmaceuticals, Inc.: See--
Wang, Guoqiang; Ma, Jun; Granger, Brett; Long, Jiang; Wang, Bin; Ghorai, Sourav; He, Jing; He, Yong; Xing, Xuechao; Shen, Ruichao; and Or, Yat Sun 12384753 Cl. C07D 265/36.
Endemann, Ulrich: See--
Mochev, Stefan; and Endemann, Ulrich 12384118 Cl. B29C 65/103.
Endo, Hiroki: See--
Yanagi, Yoshihiro; Endo, Hiroki; and Wu, Tong 12387917 Cl. H01J 37/32715.
Endo, Kota; Ikezawa, Yuta; and Tochigi, Kohei, to TOYOTA JIDOSHA KABUSHIKI KAISHA Driving assistance apparatus, driving assistance method, and program 12384366 Cl. B60W 30/146.
ENDO-PEACE MEDICAL: See--
Lin, Xi-Zhang; Chen, Chih-Hong; Lin, Chuan-Pin; and Chen, Ying-Chen 12383717 Cl. A61M 35/00.
Endo, Shinichi; and Taguchi, Sho, to Alps Alpine Co., Ltd. Contact deciding apparatus 12384392 Cl. B60W 50/08.
Endo, Taisuke: See--
Nakata, Ryusuke; Kato, Naoyuki; Yamada, Kenji; Noda, Satoshi; Ishikura, Kenichi; Iizuka, Takahiro; Tanaka, Hiroyuki; Hasegawa, Shinya; Tomioka, Kota; Yamakawa, Yoichi; Sato, Tomonori; Koda, Kazuyuki; Adachi, Isamu; Morita, Miho; Ishida, Tomomi; Kondo, Shinnosuke; Shiokawa, Yuya; Ishihara, Daisuke; Tachibana, Kohei; Ohba, Shinichi; and Endo, Taisuke 12388936 Cl. H04N 1/0066.
Endor Labs Inc: See--
Hejderup, Joseph; Hamer, Philip; Apostolopoulos, Georgios; and Styliadis, Dimitrios 12386981 Cl. G06F 21/577.
Endress+Hauser Flowtec AG: See--
Habermehl, Anne; Pflüger, Stefan; and Drahm, Wolfgang 12385853 Cl. G01N 22/00.
Endrigkeit, Esther: See--
Hiller, Lasse; and Endrigkeit, Esther D1087832 Cl. D11‑216.
Endrigkeit, Esther; Rudolph, Sven; Schelling, Carsten; and Webermann, Ralf, to FIDLOCK GMBH Part of coupler D1087732 Cl. D8‑349.
Endrödi, Balázs: See--
Danyi, Antal; Darvas, Ferenc; Endrödi, Balázs; Janáky, Csaba; Jones, Richard; Kecsenovity, Egon; Samu, Angelika; and Török, Viktor 12385146 Cl. C25B 1/135.
Endurance Lift Solutions, LLC: See--
Rogers, Jack; Bayer, Travis; and Gernentz, Ryan 12385370 Cl. E21B 43/121.
ENERKEM INC.: See--
Gil, Jennifer; Fuente-Hernandez, Ariadna; and C. Marie-Rose, Stéphane 12383888 Cl. B01J 23/63.
Enescu, Mihai: See--
Hajri, Salah Eddine; and Enescu, Mihai 12388506 Cl. H04B 7/0626.
ENEVATE CORPORATION: See--
Park, Benjamin Yong; Browne, Ian Russell; and Anderson, Heidi Leighette 12388075 Cl. H01M 4/1395.
ENF TECHNOLOGY CO., LTD.: See--
Park, Sang Seung; Kim, Yang Ryoung; Lee, Bo Yeon; Jeong, Min Gyeong; and Kim, Se Hoon 12385142 Cl. C23F 1/40.
Eng, Chin Lam; Jia, Yu; Gui, Lichao; Ng, Chee Wai; and Frank, Philipp, to Telefonaktiebolaget LM Ericsson (publ) Classifier model for determining a network status of a communication network from log data 12388730 Cl. H04L 43/04.
Engel, Rainer: See--
Span, Eduard; Demir, Yavuz; Engel, Rainer; and Heitzer, Heinz-Dieter 12384447 Cl. B62D 3/12.
Engelbogen, Nils: See--
Rösch, Frank; Greifenstein, Lukas; Engelbogen, Nils; and Bergmann, Ralf 12383636 Cl. A61K 51/0497.
Engelkemier, Darren S.: See--
Petersen, Brian Arnold; Myers, Jr., Roy T.; Engelkemier, Darren S.; Sedarat, Hossein; Shirani, Ramin; Wellbaum, Tom Quoc; and Leung, Poon-Kuen 12388915 Cl. H04L 69/18.
Engelmann, Austin: See--
Valiensi, Nicholas; Engelmann, Austin; Dohrmann, Dave; Samiec, Jeremy; and Ang, Ryan 12388861 Cl. H04L 63/1433.
Engelnkemper, Sebastian: See--
Weis, Eduard; Knobloch, Alexander; Engelnkemper, Sebastian; and Linck, Jochen 12387188 Cl. G06Q 20/18.
Engels, Bart Marinus: See--
van der Heijden, Maurice Wilhelmus; and Engels, Bart Marinus 12385048 Cl. C12N 15/67.
Engels, Boris: See--
Abujoub, Aida; Blankenship, John; Bondanza, Attilio; Brogdon, Jennifer; Bu, Dexiu; De Vita, Serena; Dranoff, Glenn; Engels, Boris; Fleming, Tony; Granda, Brian Walter; Greene, Michael R.; Guimaraes, Carla Patricia; Hack, Anniesha; Holmberg, Brian; Hong, Connie; Huang, Lu; Kodrasi, Olja; Lam, Joni Waiee; Lim, Hyungwook; Pratico, Elizabeth Dorothy; Price, Andrew; Sohoni, Akash; Stein, Andrew Marc; Treanor, Louise; Zhang, Chonghui; and Zhu, Xu 12383601 Cl. A61K 38/177.
Engels, Jary: See--
McCullough, Susan L.; Heine, Christopher; Manning, Edward; Odish, Randy; Engels, Jary; Gameros, Carlos M.; Smith, Steven; and Joe, Sung D1087991 Cl. D14‑485.
Smith, Steven; Mittal, Atul; Heine, Christopher; Odish, Randy; and Engels, Jary D1087988 Cl. D14‑485.
Smith, Steven; Mittal, Atul; Joe, Sung; Heine, Christopher; Manning, Edward; Ververs, Patricia; Gameros, Carlos M.; and Engels, Jary D1087986 Cl. D14‑485.
Engels, Lute Edwin: See--
Loman, Mark Willem; Engels, Lute Edwin; Tijink, Ronny Henk Gert; van Hillo, Victor Marinus Johann Simon; Vermaning, Alexander; and Harmsen, Jeroen 12388795 Cl. H04L 63/0414.
Engendahl, Barthel: See--
Leibig, Cora; Garrod, Michael; Benson, Garth; Engendahl, Barthel; Ch'ng, Sherilyn; Hoffman, Matthias; and Leibig, Theresa 12384102 Cl. B29C 64/118.
Engert, Susanne Carina: See--
Garcia Marcos, Alejandra; Hueffer, Stephan; Holcombe, Thomas Wesley; Ettl, Roland; Panchenko, Alexander; Engert, Susanne Carina; Juntermanns, Stefanie; Janssen, Frank; Dreja, Michael; Bluhm, Nadine; and Junkes, Christa 12384989 Cl. C11D 3/3707.
Engineered Controls International, LLC: See--
Mendenhall, Andrew B.; and Zink, Paul T. D1087522 Cl. D23‑223.
Engler, Peter; Tanoury, Peter; and Santamaria, Willis Tire deflator D1088049 Cl. D15‑7.
Englund, Sven: See--
Maderud, Carl-Johan; Sundstrom, Johan; Ekelund, Magnus; and Englund, Sven 12383956 Cl. B22F 3/15.
Engvall, Daniel: See--
Solem, Jan Otto; Solem, Kristian; Engvall, Daniel; and Wolff, Martin 12383304 Cl. A61B 17/3423.
Engwall, Sebastian: See--
Sjögren, Jonas; Vozzi, Mariano; Carlberg, Dan; Engwall, Sebastian; Walter, Mathias; Bognäs, Mattias; and Selimovic, Azra D1088085 Cl. D16‑203.
ENI S.P.A.: See--
Po, Riccardo; Corso, Gianni; and Barbieri, Riccardo 12389734 Cl. H10K 30/30.
ENKRIS SEMICONDUCTOR, INC.: See--
Cheng, Kai 12389621 Cl. H10D 30/47.
Enomoto, Kaori: See--
Koyama, Shingo; and Enomoto, Kaori 12383679 Cl. A61M 5/3129.
Enomoto, Kenji: See--
Rhodes, Tenell; Price, Brian; Enomoto, Kenji; and Wampler, Kevin 12387410 Cl. G06T 13/40.
Enomoto, Seigo; Mizuno, Ko; and Ishikawa, Tomokazu, to PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA Information processing method, recording medium, and information processing system 12389182 Cl. H04S 7/00.
Enomoto, Tetsuya: See--
Tahara, Shingo; Saito, Nobuyuki; Matsukawa, Daisaku; and Enomoto, Tetsuya 12386257 Cl. G03F 7/031.
Yoshizawa, Atsutaro; Yoneda, Satoshi; Asada, Akira; Ohe, Masayuki; and Enomoto, Tetsuya 12386256 Cl. G03F 7/031.
Enpro Subsea Limited: See--
Donald, Ian; Reid, John; McDonald, Craig; and McGhie, Michael 12385365 Cl. E21B 43/013.
Enright, John David: See--
Mertel, Jacob; Enright, John David; and Monnig, Taylor 12384419 Cl. B60W 60/0025.
ENSHI SE-RUN MATERIAL ENGINEERING TECHNOLOGY CO., LTD.: See--
Liu, Haiyuan; Cong, Xin; Xu, Bo; Zhang, Yue; Li, Jie; Li, Cui; Zhu, Zhenzhou; and Cheng, Shuiyuan 12385076 Cl. C12P 21/06.
Ensysce Biosciences Inc.: See--
Kirkpatrick, Lynn 12384744 Cl. C07C 279/12.
Ent, Ali: See--
Perelli, Thomas; and Ent, Ali 12386389 Cl. G06F 1/1632.
ENTEGRIS, INC.: See--
Wiseman, Brian; Raschke, Russ V.; Magoon, Paul J.; and Wang, Huaping 12387958 Cl. H01L 21/67359.
entigenlogic LLC: See--
Williams, Frank John; Lazzara, David Ralph; Sundberg, Stephen Emerson; Reed, Ameeta Vasant; Roberson, Dennis Arlen; MacTavish, Thomas James; Knutson, Karl Olaf; Thomas, Jessy; MacTavish, Niklas Josiah; Corns, II, David Michael; Chu, Andrew; Mazurkiewicz, Theodore; and Grube, Gary W. 12386869 Cl. G06F 16/3322.
Entrust Corporation: See--
Gray, John Robert; Ounsworth, Michael; and Mister, Serge Jean Maurice 12388661 Cl. H04L 9/3268.
Griera, Jordi Íñigo 12388637 Cl. H04L 9/0877.
Entzminger, Rob A.: See--
Mazur, David C.; Entzminger, Rob A.; McCleave, Jr., Bruce T.; and Teal, James M. 12386344 Cl. G05B 19/41885.
Eom, Yonghwan: See--
Choi, Sangbok; Eom, Yonghwan; Park, Kyongbae; Heo, Juyeong; Han, Cholok; Kim, Sungwook; and Baik, Wookyung 12385683 Cl. F25D 21/025.
EOS GmbH Electro Optical Systems: See--
Gruenberger, Stefan; Kneisel, Stefan; Schneider, Gabriel; Markl, Stefanie; and Paternoster, Stefan 12383961 Cl. B22F 12/52.
Epizon, Inc.: See--
Nguyen, Sam L.; and Rudey, John M. 12383514 Cl. A61K 31/122.
EPOS GROUP A/S: See--
Hansen, Anders Røser; Hestbek, Poul Peder; Feldt, Svend; and Fynsk, Casper 12387739 Cl. G10L 21/0208.
EPPENDORF SE: See--
Goemann-Thoss, Wolfgang; Wente, Wolf; Thieme, Andreas; Frerichs, Jan-Gerd; Markau, Christiane; and Hacker, Jan-Hendrik 12385932 Cl. G01N 35/00584.
Epshteyn, Albert: See--
Pate, Bradford B.; Maza, William; Breslin, Vanessa; DeSario, Paul A.; Feygelson, Tatyana I.; Epshteyn, Albert; Owrutsky, Jeffrey C.; and Hangarter, Carlos 12384684 Cl. C01B 32/28.
Epstein, Michael James Boyer: See--
Hochschild, Peter; Lloyd, Alexander; Hsieh, Wilson Cheng-Yi; Felderman, Robert Edman; and Epstein, Michael James Boyer 12386384 Cl. G06F 1/12.
Erb, Klaus: See--
Rommelaere, Heidi; Brigé, Ann; Cornelis, Sigrid; Dombrecht, Bruno; Lorent, Eric; Rieger, Melanie; Soos, Timothy; Park, John; Weigle, Bernd; and Erb, Klaus 12384840 Cl. C07K 16/244.
ERBA DIAGNOSTICS LIMITED: See--
Vazirani, Nikhil; Randrianarivo, Jeanet; Ghoris, Valentin; and Andlauer, Sylvain 12385937 Cl. G01N 35/04.
Erbeznik, Brennan: See--
Cansizoglu, Omer; Li, Chang; Erbeznik, Brennan; Gardelli, Giovanni; Hornberger, Ryan; and Xu, Jingou 12387241 Cl. G06Q 30/0267.
Ercegovac, Vuk: See--
Armbrust, Michael Paul; Ercegovac, Vuk; Lappas, Paul; Liang, Xi; Murthy, Mukul; Papakonstantinou, Yannis; Sharma, Nitin; Sismanis, John; Torres, Joseph; and Yang, Min 12386833 Cl. G06F 16/254.
Erdmann, Jeremy M.; to DEERE & COMPANY Net wrap roll with lift hook location markings 12382872 Cl. A01F 15/071.
Erdtmann, Bernhard; and Seither, Thomas, to JOSEPH VOEGELE AG Road finisher with lighting 12385194 Cl. E01C 19/48.
Eren, Ezgi; Li, Jiabing; Rauch, Jonas; Zhang, Zhaoyang; Kallesen, Royce; and Kumar, Ravi, to PROS, Inc. Machine learning techniques for generating predictions based on incomplete data 12387084 Cl. G06N 3/04.
Erfan, Mazen: See--
Sabry, Yasser M.; Mortada, Bassem; Al Haron, Mohamed H.; Anwar, Momen; Youssef, Mohamed Metwally; Erfan, Mazen; and Deutsch, Erik R. 12385892 Cl. G01N 33/0062.
ERGO EXERGY TECHNOLOGIES INC.: See--
Blinderman, Mikhail 12385360 Cl. E21B 41/0064.
Erhan, Can: See--
Ozdemir, Halil Umut; Ozkan, Ali Ibrahim; Yavas, Muharrem Ugur; Erhan, Can; and Kurtulus, Can 12385980 Cl. G01R 31/388.
Erichsen, Kewin: See--
Akke, Fredrik; and Erichsen, Kewin 12387280 Cl. G06Q 50/06.
Ericksen, Everet Owen; Peterson, Evan; Power, Evan; Fraguglia, Michael; Michaels, Zachary; and Cortes, Jordi, to Fox Factory, Inc. Hot-start suspension tune 12384213 Cl. B60G 17/016.
Erickson, Evan Lawrence; and Haywood, Christopher, to Rambus Inc. Low overhead page recompression 12386551 Cl. G06F 3/0656.
Erickson, Patrick Daniel: See--
Huang, Yao-Yuan; and Erickson, Patrick Daniel D1087622 Cl. D6‑308.
Eriksen, Tommy; and Ringstad, Richard Hagvåg, to TCO Group AS Plug breaker 12385343 Cl. E21B 23/0413.
Eriksson, Erik; Tidestav, Claes; and Landström, Anders, to Telefonaktiebolaget LM Ericsson (Publ) Feedback reporting for wireless communication 12388572 Cl. H04L 1/1671.
Eris, Furkan: See--
Garg, Alok; Keltcher, Paul; Chhablani, Mayank; and Eris, Furkan 12386624 Cl. G06F 9/3836.
Erlen, Christoph: See--
Schwarz, Jan; Schwalm, Matthias; Niemeier, Carsten; Haemmerle, Simon; Erlen, Christoph; Schuetz, Joachim; Schoeffel, Gerhard; and Wolf, Daniel 12383678 Cl. A61M 5/31.
Erman, Kutlay: See--
Khawer, Mohammad Riaz; Buddhikot, Milind M.; Yandun, Sebastian; and Erman, Kutlay 12389234 Cl. H04W 16/14.
Ermolaev, Gregory: See--
Islam, Toufiqul; He, Hong; and Ermolaev, Gregory 12389434 Cl. H04W 72/53.
Ermolaev, Gregory Aleksandrovich: See--
Davydov, Alexei Vladimirovich; Morozov, Gregory Vladimirovich; Dikarev, Dmitry Sergeyevich; and Ermolaev, Gregory Aleksandrovich 12388496 Cl. H04B 7/0413.
Erni, Philipp: See--
Van Der Gucht, Jasper; De Vries, Renko; Li, Xiufeng; Dardelle, Gregory; Erni, Philipp; Ouali, Lahoussine; and Thiebaut, Nathalie 12383881 Cl. B01J 13/10.
Van Gruijthuijsen, Kitty; Dardelle, Gregory; Struillou, Arnaud; and Erni, Philipp 12383477 Cl. A61K 8/11.
Ernst & Young U.S. LLP: See--
Yip, Vincent; Joshi, Kaushal; Gibiec, Marek; Madhok, Abhishek; Zaidi, Syed Muhammad Raza; Abunayyan, Fahad; Lanzilotta, Chris; Chaturvedi, Divye; and Manav, Yashika 12386991 Cl. G06F 21/6218.
Ernst, Stephen Daniel; and Tomlinson, James A., to MARATHON PETROLEUM COMPANY LP Exhaust handling systems for marine vessels and related methods 12384508 Cl. B63H 21/32.
Ershov, Alexander Igorevich: See--
Labetski, Dzmitry; Berendsen, Christianus Wilhelmus Johannes; Duarte Rodrigues Nunes, Rui Miguel; Ershov, Alexander Igorevich; Feenstra, Kornelis Frits; Fomenkov, Igor Vladimirovich; Hummler, Klaus Martin; Johnkadaksham, Arun; Kraushaar, Matthias; Laforge, Andrew David; Langlois, Marc Guy; Loginov, Maksim; Ma, Yue; Mojab, Seyedmohammad; Nadir, Kerim; Shatalov, Alexander; Stewart, John Tom; Tegenbosch, Henricus Gerardus; and Xia, Chunguang 12389519 Cl. H05G 2/009.
Ersoy, Okan; to WAVEFRONT ANALYSIS SYSTEMS LLC Encryption and decryption using phase recovery 12388639 Cl. H04L 9/0894.
Ersoz, Ali; to GE Precision Healthcare LLC System and method for reduced fine-line artifacts in magnetic resonance imaging 12385998 Cl. G01R 33/4818.
Ertan, Ali Erdem: See--
Ali, Murtaza; Ertan, Ali Erdem; and Foltinek, Kevin B. 12386030 Cl. G01S 7/352.
Ertas, Bugra H.; Ganiger, Ravindra Shankar; Piazza, Andrea; Miller, Brandon W.; and GENERAL ELECTRIC COMPANY, to GE AVIO S.R.L. Mounting assembly for a gearbox assembly 12385443 Cl. F02C 7/36.
Ervin, Timothy Bain: See--
Bowman, Clay Evan; Mosley, Harold Thomas; and Ervin, Timothy Bain 12385233 Cl. E03B 7/006.
Erwin, Michael Jason; Young, Bradley Robert; Pederson, Stephen Marvin; and Dold, Zachary Adam, to BG Intellectuals, Inc. Sprayer D1088186 Cl. D23‑225.
Escamilla, Eduardo: See--
Wingfield, Megan C.; and Escamilla, Eduardo 12389557 Cl. H05K 5/0221.
Eschbaumer, Maximilian: See--
Achatz, Simon; and Eschbaumer, Maximilian 12386062 Cl. G01S 13/931.
Escient Pharmaceuticals, Inc.: See--
Lanier, Marion; Boehm, Marcus; Huang, Liming; Martinborough, Esther; Sainz, Marcos; Selfridge, Brandon; and Yeager, Adam 12384748 Cl. C07D 215/44.
Escorce-Jones, Ainsley: See--
Cherivirala, Sushain; and Escorce-Jones, Ainsley 12386598 Cl. G06F 8/433.
Eshraghi, Aria: See--
Maligeorgos, James; Eshraghi, Aria; Lobo, Ryan; Lim, Lysander; Giannini, Vito; and Goldenberg, Marius 12386029 Cl. G01S 7/352.
Eshrah, Islam A.; to Analog Devices International Unlimited Company Apparatus and methods for electronic testing using beamforming integrated circuits as impedance tuners 12388540 Cl. H04B 17/0085.
Esmail, Adnan; Joshi, Prashant; Balasubramaniam, Sundar; Tripathi, Brijesh; and Chandra, Gaurav, to Tesla, Inc. Vehicle network and method of communication 12388767 Cl. H04L 47/805.
Espino, Ignacio: See--
Cruz Morales, Tania; Shanker, Purva; Yogerst, Shannon; Espino, Ignacio; Lin, Dan; and Wolfe, Nathan 12386804 Cl. G06F 16/2228.
Espinosa, Edward P; to Melcher, Jeffrey S. Wireless device and selective user control and management of a wireless device and data 12387065 Cl. G06K 7/10297.
Espinosa, Thomas M.; to CETRES HOLDINGS, LLC Reinforced building wall using compression rod 12385276 Cl. E04H 9/021.
Esser, Steven K.: See--
Datta, Pallab; Cassidy, Andrew S.; Flickner, Myron D.; Penner, Hartmut; Appuswamy, Rathinakumar; Sawada, Jun; Arthur, John V.; Modha, Dharmendra S.; Esser, Steven K.; Taba, Brian; and Klamo, Jennifer 12387082 Cl. G06N 3/04.
Essilor International: See--
French, Elliot; and Balasubramanian, Srinivasan 12386207 Cl. G02C 7/107.
Hamlaoui, Samy; Chene, Sylvain; and Fermigier, Bruno 12386202 Cl. G02C 7/085.
Tranvouez-Bernardin, Delphine; Faubert, Jocelyn; and Giraudet, Guillaume 12386199 Cl. G02C 7/027.
ESSITY HYGIENE AND HEALTH AKTIEBOLAG: See--
Kling, Robert; Källgren, Antonio; and Henson, Mark W. 12383104 Cl. A47K 10/32.
Essling, Mirko; to ANDROTEC GMBH Measuring assembly and method 12386022 Cl. G01S 5/16.
Esswie, Ali; to Dell Products L.P. Dynamic reporting of packet delay status information 12388737 Cl. H04L 43/0852.
Estany Rodriguez, Miquel: See--
Apodaca, Gregory M.; Dascola, Jonathan R.; Estany Rodriguez, Miquel; Krivoruchko, Evgenii; Lyons, Richard D.; Moon, Jay; Pastrana Vicente, Israel; Pazmino, Lorena; Sorrentino, III, William A.; Stauber, Matan; and Wan, Wan Si D1087990 Cl. D14‑485.
Estay Forno, Ignacio; Liu, Nanqi; Kuo, Yu-Wen; and Desai, Dhyey Naren, to TEXAS INSTRUMENTS INCORPORATED Methods, apparatus, and articles of manufacture to reduce leakage current in sampling circuitry 12388458 Cl. H03M 1/1255.
Estep, Patrick: See--
Windh, Skyler Arron; Brewer, Tony M.; and Estep, Patrick 12386656 Cl. G06F 9/4881.
Estes, Kurt: See--
Boundy, Timothy John; Barger, Steven Michael; Lydon, Terence Michael; Lang, Richard Michael; Gonzalez, Jr., Wilfredo; Boundy, Darren Michael; McHugh, Eric; Schuda, David; Wilson, IV, George L.; Grube, Gary W.; Resch, Jason K.; DeRango, Mario F.; Buchalo, John Edward; Herbst, Richard A.; Estes, Kurt; and Anderson, Evan 12385546 Cl. F16F 9/53.
Estrada, Eduardo; Calamaco, J. Eli; Villagrana Noris, Martin R.; and Varela Antillon, Victor D., to INTEVA PRODUCTS, LLC Apparatus and method for uniform release effort in a vehicle latch 12385299 Cl. E05B 85/26.
ESW Technologies FZ-LLC: See--
Kapadia, Jignesh; and Shah, Shalin 12389277 Cl. H04W 28/0942.
Etchebes, Marie: See--
Tilke, Peter; Etchebes, Marie; Lefranc, Marie Emeline Cecile; and Zhu, Lingchen 12387468 Cl. G06V 10/774.
ETH ZÜRICH (EIDGENÖSSISCHE TECHNISCHE HOCHSCHULE ZÜRICH): See--
Guay, Martin; Cimen, Gökcen; Maurhofer, Christoph; Ryffel, Mattia; and Sumner, Robert W. 12387437 Cl. G06T 19/006.
Etheridge, Harvey: See--
Leeson, Kim; Trezise, Shaun; and Etheridge, Harvey 12386130 Cl. G02B 6/4441.
Ethernovia Inc.: See--
Petersen, Brian Arnold; Myers, Jr., Roy T.; Engelkemier, Darren S.; Sedarat, Hossein; Shirani, Ramin; Wellbaum, Tom Quoc; and Leung, Poon-Kuen 12388915 Cl. H04L 69/18.
Ethington, Seth E.; Farmer, William Daniel; Krishnaswamy, Pooja; Shiveley, Timothy; Thomas, Anto Chirayil; and Veibell, Daniel Scott, to United Services Automobile Association (USAA) Systems and methods for controlling vehicle systems based on driver assessment 12384383 Cl. B60W 40/09.
Etiometry Inc.: See--
Baronov, Dimitar V.; Butler, Evan J.; and Lock, Jesse M. 12387842 Cl. G16H 40/63.
Etkin, Amit; Trivedi, Madhukar; Wu, Wei; Board of Trustees of the Leland Stanford Junior University, The; and Board of Regents, The University of Texas System, to United States Government as represented by the Department of Veterans Affairs, The Treatment of depression using machine learning 12383196 Cl. A61B 5/4848.
ETO MAGNETIC GMBH: See--
Bönisch, Benjamin 12388951 Cl. H04N 5/772.
Eto, Motoki: See--
Yamada, Takashi; Nishibayashi, Akihito; Haibara, Teruo; Oda, Daizo; Eto, Motoki; Oyamada, Tetsuya; Kobayashi, Takayuki; and Uno, Tomohiro 12388044 Cl. H01L 24/45.
ETT, L.L.C.: See--
Merrett, Stanley L. 12385506 Cl. F04F 5/10.
Ettl, Roland: See--
Garcia Marcos, Alejandra; Hueffer, Stephan; Holcombe, Thomas Wesley; Ettl, Roland; Panchenko, Alexander; Engert, Susanne Carina; Juntermanns, Stefanie; Janssen, Frank; Dreja, Michael; Bluhm, Nadine; and Junkes, Christa 12384989 Cl. C11D 3/3707.
Eubanks, Mark Daniel; Gozdecki, Sarah Jean; Nicodemus, Steve; Sisson, Richard Kerr; and Webb, Jeremy Michael, to Video Gaming Technologies, Inc. Gaming machines with free play bonus mode presenting only winning outcomes 12387567 Cl. G07F 17/3267.
Eurothreads LLC: See--
Moore, Tamara; and Wall, Laurie 12383258 Cl. A61B 17/06166.
Eutsler, Nathaniel C.; and Shepherd, Matthew Mullin, to Wells Fargo Bank, N.A. Localization control for non-fungible tokens (NFTs) via transfer by containerized data structures 12387262 Cl. G06Q 40/04.
Euvrard, Nicolas: See--
Rivier, Cédric; and Euvrard, Nicolas 12383365 Cl. A61B 50/39.
EvacuPak, Inc.: See--
Nebeker, Travis; and Byars, Robert 12382969 Cl. A23B 2/001.
EVAN CLABOTS DESIGN LLC: See--
Clabots, Evan D1087653 Cl. D6‑569.
Evans, James F.; and Miller, Andrew, to Cleveland-Cliffs Steel Properties Inc. Slurry-blasted hot-roll-based hot dip aluminized steel strip 12385120 Cl. C23C 2/024.
Evans, Jeffrey: See--
Brooks, Andrew; Brooks, Brad; Bhatia, Sumeet; and Evans, Jeffrey 12388775 Cl. H04L 51/04.
Evans, Matthew Lucien: See--
Garcia-Tobin, Carlos; Mathewson, Bruce James; Evans, Matthew Lucien; and Grisenthwaite, Richard Roy 12386755 Cl. G06F 12/1009.
Evans, Michael; Faccin, Jessica; and Adams, Cameron, to Canva Pty Ltd Digital video production systems and methods 12387761 Cl. G11B 27/031.
Evans, Michael John: See--
Boroujerdi, Rastan; Evans, Michael John; and Haritatos, Panayoti 12387444 Cl. G06T 19/006.
Evans, Thomas J.: See--
Guiles, Marvin A.; McPherson, Aaron; and Evans, Thomas J. 12383300 Cl. A61B 17/322.
EVARISTO FONTECHA CUETOS: See--
Fontecha Cuetos, Evaristo 12383942 Cl. B08B 9/0933.
EVATEC AG: See--
Trajcevski, Boris 12389797 Cl. H10N 30/079.
EVE Energy Ventures Inc.: See--
Srinath Bharadwaj, Nikhil 12389225 Cl. H04W 12/068.
Everett, Matthew J.: See--
Roberts, Simon P.; Gage, Sergei I.; Ding, Yang; Macpherson, Christopher J.; Kushnerik, Michael R.; Matsumura, Naohiro J.; Frank, Cory M.; May, Jessica; and Everett, Matthew J. 12389471 Cl. H04W 76/14.
EVERICH AND TOMIC HOUSEWARES CO., LTD: See--
Yao, Huajun D1087691 Cl. D7‑392.1.
EVERICH AND TOMIC HOUSEWARES CO., LTD.: See--
Yao, Huajun D1087761 Cl. D9‑446.
Everman, Cory: See--
Srour, Joey; Omansky, Robert; Campbell, Corey; Everman, Cory; and Campbell, David 12383078 Cl. A47D 13/066.
Everschor-Sitte, Karin: See--
Nothhelfer, Jonas; Hals, Kjetil Magne Dørheim; Everschor-Sitte, Karin; and Rizzi, Matteo 12389804 Cl. H10N 50/10.
Evolve To You Corporation: See--
Warren, Jonathon; Elizabeth Warren, Lauren; and Yuan, Shi Gang D1087967 Cl. D14‑372.
EVOLVED BY NATURE, INC.: See--
Altman, Gregory H.; and Mortarino, Enrico 12385181 Cl. D06M 15/15.
Evoqua Water Technologies Canada Ltd.: See--
Gupta, Hari B.; Ceklosky, James M.; Zhu, Ivan; Berger, David; Scott, Daniel B.; Sassaman, Frank; Kohl, William; Grant, Shannon; and Hunsaker, Mark 12384707 Cl. C02F 3/2826.
Evoqua Water Technologies LLC: See--
Gullion, Michael; Hawley, Joshua; and Hall, Christopher 12383869 Cl. B01D 65/02.
Gupta, Hari B.; Ceklosky, James M.; Zhu, Ivan; Berger, David; Scott, Daniel B.; Sassaman, Frank; Kohl, William; Grant, Shannon; and Hunsaker, Mark 12384707 Cl. C02F 3/2826.
Evrard, Thomas: See--
Patel, Dinesh; Sigmundsen, Jone; Nilsen, Tom Krister; Lee, Alexander Wei; Abdul-Kareem, Tosin; Fedorchenko, Evgeny; and Evrard, Thomas 12385342 Cl. E21B 23/02.
Ewart, Sean W.: See--
Krasovskiy, Arkady L.; Konstantinov, Ivan A.; Munjal, Sarat; and Ewart, Sean W. 12384866 Cl. C08F 255/10.
EWHA UNIVERSITY-INDUSTRY COLLABORATION FOUNDATION: See--
Jo, William; Cho, Yun Ae; and Jung, Hye Ri 12385156 Cl. C30B 7/04.
Exact Sciences Corporation: See--
Allawi, Hatim; Oldham-Haltom, Rebecca; Gagrat, Zubin; Domanico, Michael; and Lidgard, Graham 12385087 Cl. C12Q 1/686.
Exactech, Inc.: See--
Angibaud, Laurent; and Hamad, Cyril 12383338 Cl. A61B 34/10.
EXALOS AG: See--
Dülk, Marcus 12386118 Cl. G02B 6/29389.
Excelitas Noblelight GmbH: See--
Graziel, Bernhard; Tittmann, Michael; Büngener, Jens; Krafft, Vincent; and Von Riewel, Larisa 12385693 Cl. F26B 3/283.
Excelitas Technologies Corp.: See--
Johnson, Bartley C. 12388235 Cl. H01S 5/18366.
EXEL INDUSTRIES: See--
Bacle, Thibault; Gautier, Jocelyn; and Jeantet, Paul 12385453 Cl. F02M 35/10262.
Exilard, Gabriel Gorka: See--
Richard, Stéphane Raphaël Yves; Breining, Jean-Luc; Cladiere, Mathieu Pierre; Descubes, Olivier Pierre; Dinquel, Jerome; Exilard, Gabriel Gorka; Pellaton, Bertrand Guillaume Robin; Perra, Nicolas Christophe; and Viguier, Christophe Nicolas Henri 12385440 Cl. F02C 7/25.
EXLAY WEBARTS INC.: See--
Fujisawa, Nobuaki 12387412 Cl. G06T 13/80.
Exley, Trevor W.: See--
Jafari, Amir; and Exley, Trevor W. 12384024 Cl. B25J 9/142.
ExlService Holdings, Inc.: See--
Nawab, Rahul; Chopra, Namit; Kushwaha, Saurabh; Dattana, Saish; and Garg, Siddharth 12387271 Cl. G06Q 40/08.
EXOCAD GMBH: See--
Annucci, Marco 12383383 Cl. A61C 13/0004.
EXOTEC PRODUCT FRANCE: See--
Chatain, Marc; Moulin, Romain; and Heitz, Renaud 12384621 Cl. B65G 1/0464.
Expel, Inc.: See--
Peters, Matt D1087978 Cl. D14‑485.
Weber, Elisabeth; and Hung, Jane 12388870 Cl. H04L 63/1483.
Experian Information Solutions, Inc.: See--
Hjermstad, Erik Peter; Morris, Tony T.; Haupt, Heidi Beth; and Schwartz, Jennifer Kuhr 12387142 Cl. G06N 20/00.
Rege, Anukool; Sahay, Prashant Kumar; Lally, Mervyn; Kumar, Shirish; and Sahay, Sanskar 12386875 Cl. G06F 16/337.
Express Scripts Strategic Development, Inc.: See--
Gangaikondan-Iyer, Harry S.; Bini, Mark G.; Goodman, Zachary A.; Raj, Sara A.; Patterson, William S.; Ng, Damian; Casper, Daniel C.; Jenne, Ashley M.; Ham, Sarah E.; Williams, Jamie; Vallery, Christina M.; Micheletti, Sarah; Stettin, Glen D.; Mahon, Snezana; Prabhu, Selva; and Khan, Shahnawaz A. 12387827 Cl. G16H 20/10.
EXPRO NORTH SEA LIMITED: See--
Horn, Tristam Paul; Bruce, Stephen Edmund; Shand, David Michael; and Reynolds, Tyler Rhes 12385327 Cl. E21B 17/06.
ExxonMobil Technology and Engineering Company: See--
Gao, Zhisheng; Koch, Winfried; McBride, Nicholas W.; and Gary, Dana J. 12384980 Cl. C10M 111/04.
Hawkins, Harrison T.; Blumenfeld, Michael; Brown, Nilka Y.; and Pathare, Rugved P. 12384983 Cl. C10M 169/04.
Northrop, P. Scott; and Harnsberry, Kevin A. 12384955 Cl. C09K 8/536.
Shen, Eric B.; Kovvali, Anjaneya S.; Ramkrishnan, Aruna; Sharma, Arun K.; Cady, Samuel J.; Brown, Stephen H.; Billimoria, Rustom M.; Raich, Brenda A.; Patel, Bryan A.; Schoch, Phillip K.; and Della Mora, John 12384976 Cl. C10G 67/049.
EYGS LLP: See--
Sengupta, Dipanjan; and Chatterjee, Samriddha 12386850 Cl. G06F 16/258.
Ezov, Gilad: See--
Drucker, Nir; Aharoni, Ehud; Ezov, Gilad; and Shaul, Hayim 12388618 Cl. H04L 9/008.
Ezumi, Yosuke: See--
Aida, Takahiro; Ezumi, Yosuke; Ogushi, Takuhiro; Nishikawa, Yukinori; and Ueki, Hideyuki 12384147 Cl. B41J 2/0457.