US 12,388,540 B2
Apparatus and methods for electronic testing using beamforming integrated circuits as impedance tuners
Islam A. Eshrah, Giza (EG)
Assigned to Analog Devices International Unlimited Company, Limerick (IE)
Filed by Analog Devices International Unlimited Company, Limerick (IE)
Filed on Feb. 14, 2023, as Appl. No. 18/168,873.
Prior Publication US 2024/0275500 A1, Aug. 15, 2024
Int. Cl. H04B 17/00 (2015.01); G01R 27/28 (2006.01); G01R 31/28 (2006.01)
CPC H04B 17/0085 (2013.01) [G01R 27/28 (2013.01); G01R 31/2822 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An electronic testing setup comprising:
a radio frequency (RF) coupler including a through line, a first coupled line coupled to the through line, and a second coupled line coupled to the through line, wherein the through line is configured to receive an RF output signal from an output of a device under test (DUT); and
a beamforming integrated circuit (IC) including a first transmit channel having an output connected to the first coupled line, and a second transmit channel having an output connected to the second coupled line, wherein a gain and a phase of the first transmit channel and a gain and a phase of the second transmit channel are each controllable to provide impedance tuning at the output of the DUT.