LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 3rd DAY OF December, 2024
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

UAB Research Foundation, The: See--
Liu, Xiaoguang; Zhou, Lufang; Ou, Jianfa; Si, Yingnan; Jaskula-Sztul, Renata; Chen, Herbert; Whitt, Jason Derek; and Zhang, Jianyi 12156918 Cl. A61K 47/6849.
Varley, Katherine E; Myers, Richard M; Roberts, Brian S; Gertz, Jason; Buchsbaum, Donald J; Forero-Torres, Andres; and LoBuglio, Albert F 12157759 Cl. C07K 14/47.
Uang, Jennifer: See--
Askin, Erik Keith; Boyd, Jeffrey Alan; Dixon, Alex; Drayna, Garrett Korda; French, Merric-Andrew Jaranowski; Goldstein, Daniel Lami; Jacob, Rochus Emanuel; Kole, Jared Mitchell; Lin, Chen-Yu; Mueller, Oliver Maximilian; Peng, James Jeng-Yeu; Reimer, Andrew Michael; Saldanha, Neil Richard Anthony; Shambat, Gary; and Uang, Jennifer 12157530 Cl. B62H 5/003.
Ubaru, Shashanka: See--
Akhalwaya, Ismail Yunus; Clarkson, Kenneth; Horesh, Lior; Squillante, Mark; Ubaru, Shashanka; and Kalantzis, Vasileios 12159195 Cl. G06N 10/00.
Ubiquiti Inc.: See--
Hardy, Matthew A.; Frei, Randall W.; Bauer, Jonathan P.; and Paolini-Subramanya, Mahesh 12160424 Cl. H04L 63/0876.
Ubl, Malte: See--
Pettitt, John Philip; Ubl, Malte; and Voytenko, Dmytro 12160507 Cl. H04L 9/0869.
UC GLOBAL TRADE INC.: See--
Wang, Rong 12156843 Cl. A61H 19/44.
Uchida, Kenya; Fukui, Hiroyuki; Uematsu, Ikuo; Iwamoto, Takeaki; Kwon, Eunsang; KABUSHIKI KAISHA TOSHIBA; and Kioxia Corporation, to TOHOKU UNIVERSITY Process apparatus and process method 12157029 Cl. A62D 3/36.
Uchida, Masahiro: See--
Ito, Shintaro; and Uchida, Masahiro 12158269 Cl. F23R 3/14.
Uchida, Seiichi; to SHARP KABUSHIKI KAISHA Display device and method for driving same 12159578 Cl. G09G 3/3233.
Udomsawat, Wilairat: See--
Zeng, Hui; Shumway, Douglas R.; Geske, Paul A.; and Udomsawat, Wilairat 12158883 Cl. G06F 16/2428.
Ueda, Hatsuhisa; Naruke, Toshiaki; Izumi, Shinnosuke; Tomiyama, Hideki; Inagaki, Ryo; Kanbe, Takeshi; and Ishikawa, Tatsuya, to SUBARU CORPORATION Vehicle battery cooling apparatus 12157397 Cl. B60L 58/26.
Ueda, Junya; to SEIKO EPSON CORPORATION Control method for robot system, robot system, and storage medium 12157236 Cl. B25J 9/1687.
Ueda, Kazuo: See--
Ogashiwa, Toshinori; and Ueda, Kazuo 12157170 Cl. B22F 7/062.
Ueda, Shiori; Shagawa, Tomohiro; and Tamaoki, Soichiro, to SHIMADZU CORPORATION Preparative liquid chromatograph 12158455 Cl. G01N 30/8631.
Ueda, Takehiko: See--
Yoshino, Masaharu; and Ueda, Takehiko 12158736 Cl. G05B 15/02.
Ueda, Tomohiro; and Aoki, Seiichi, to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. Cylindrical secondary battery 12159974 Cl. H01M 10/0587.
Ueda, Yuichi: See--
Masuda, Junichi; and Ueda, Yuichi 12157055 Cl. A63F 13/537.
Uehara, Kazuto: See--
Sugahara, Akio; Handa, Takaya; Isomura, Ryosuke; Uehara, Kazuto; Sato, Junichi; Asaoka, Norichika; Yamaoka, Masashi; Sanad, Bushnaq; Shibazaki, Yuzuru; Kumazaki, Noriyasu; and Terada, Yuri 12159677 Cl. G11C 16/30.
Uehara, Masakazu; Watatani, Tomohiro; and Kawasumi, Takuya, to KYOCERA Document Solutions Inc. Fixing device and image forming apparatus 12158717 Cl. G03G 15/2053.
Uematsu, Akihisa: See--
Maeda, Takashi; Tomii, Naoya; Uematsu, Akihisa; Inaoka, Kazuya; and Kawaguchi, Noriyuki 12160050 Cl. H01Q 3/2682.
Uematsu, Ikuo: See--
Uchida, Kenya; Fukui, Hiroyuki; Uematsu, Ikuo; Iwamoto, Takeaki; and Kwon, Eunsang 12157029 Cl. A62D 3/36.
Ueno, Hiroshi: See--
Asakawa, Yuichiro; Tsuiki, Hirofumi; Ueno, Hiroshi; Assresahegn Dasalegn, Birhanu; Daigle, Jean-Christophe; and Zaghib, Karim 12159969 Cl. H01M 10/0567.
Ueno, Makoto: See--
Ono, Nobukazu; Shinhara, Atsuko; Muramatsu, Takahiko; Kikuchi, Shinya; Yamamoto, Hiroshi; Shiraishi, Koichi; Katayama, Kazuhiro; Fukutake, Nobuyasu; Higashiyama, Masahiko; Ohkawa, Shinichi; Ueno, Makoto; Miyagi, Yohei; and Okamoto, Naoyuki 12159718 Cl. G16H 50/20.
Uenodan, Akira: See--
Araki, Yushi; Uenodan, Akira; and Gorai, Nobuaki 12158365 Cl. G01F 1/6842.
Ueshima, Akira: See--
Nakamura, Wataru; Nishide, Shuichi; Ueshima, Akira; Yoshida, Michiaki; and Shinoto, Keigo 12158030 Cl. E05C 1/085.
Uesugi, Tomoya: See--
Nishi, Akio; Ishii, Toru; Nagaoka, Kazuaki; and Uesugi, Tomoya 12158724 Cl. G03G 5/14769.
Uhkötter, Stephan; Kracht, Uwe; Kurz-Hardjosoekatmo, Wolfram; Douma, Rens; and Martin, Ivo, to ROLLS-ROYCE DEUTSCHLAND LTD & CO KG Plain bearing, and method for lubricating and cooling a plain bearing 12158182 Cl. F16C 33/1055.
Uhlich, Stefan: See--
Alonso Garcia, Javier; Cardinaux, Fabien; Kemp, Thomas; Mauch, Lukas; Uhlich, Stefan; and Tiedemann, Stephen 12159122 Cl. G06F 40/58.
Uhling, Thomas F.; and Barnes, Keith Wayne, to ITRON, INC. Determining network reliability using message success rates 12160358 Cl. H04L 43/0841.
Uhm, Junwhon: See--
Seo, Mincheol; Kim, Nari; Uhm, Junwhon; Lee, Jaehyuk; Park, Sungchul; Park, Jiyoon; and Yun, Yongsang 12160032 Cl. H01Q 1/273.
Uhm, Sae Hoon; Lee, Yun Seong; Sohn, Yeong Hoon; and Park, Se Hong, to EN2CORE TECHNOLOGY, INC. Plasma generating apparatus and method for operating same 12159766 Cl. H01J 37/3211.
Uijlenbroek, Jos; and Borgna, Michael E., to FineLine Technologies RFID mesh label, tire having RFID mesh label integrally incorporated therein, and methods of making 12159182 Cl. G06K 19/07764.
UiPath Inc.: See--
Petrescu, Alexandru C.; Voicu, Cosmin V.; Marinovici, Razvan; and Miron, Ion 12159101 Cl. G06F 40/174.
Uitto, Mikko: See--
Heikkinen, Antti; Uitto, Mikko; Harb, Reda; and Lal, Dhananjay 12160322 Cl. H04L 12/185.
Ukai, Tomohiro: See--
Ichihara, Takashi; Furukawa, Yutaka; and Ukai, Tomohiro 12160048 Cl. H01Q 25/002.
Ukigai, Saori: See--
Hijikata, Ryojiro; and Ukigai, Saori 12157993 Cl. E03C 1/0404.
Ullberg, Christer; to Varex Imaging Sweden AB Method of reading out data in a radiation detector, radiation detector and imaging apparatus 12158549 Cl. G01T 1/17.
Ullrich, Joachim: See--
Meyer, Thorsten; Berger, Michael; Warrass, Ralf; and Ullrich, Joachim 12157717 Cl. C07C 259/06.
Ulm, III, Arthur John; to Legacy Ventures LLC Catheter delivered endovascular devices 12156670 Cl. A61B 17/221.
Ulrich, Evan R.; and Oberto, Robert Edward, to THE AEROSPACE CORPORATION Counter rotating torque drive for rotary wing vehicle propulsion 12157579 Cl. B64D 35/06.
Ulrich, Markus; to MVTec Software GmbH Hand-eye calibration of camera-guided apparatuses 12159429 Cl. G06T 7/80.
ULTRAHAPTICS IP LTD: See--
Iodice, Michele; Long, Benjamin John Oliver; Kappus, Brian; Carter, Thomas Andrew; Jibry, Rafel; and Georgiou, Orestis 12158522 Cl. G01S 15/32.
Um, Yoonsung: See--
Chen, Xingwu; Um, Yoonsung; Zhang, Yinfeng; Zhang, Xin; Chen, Lixuan; and Li, Dongze 12158668 Cl. G02F 1/134309.
UMBRA Technologies Ltd.: See--
Rubenstein, Joseph E.; and Oré, Carlos Eduardo 12160328 Cl. H04L 12/465.
Umebayashi, You; and JNC CORPORATION, to JNC FIBERS CORPORATION Combined fiber nonwoven fabric, laminate, filtration medium for filter and method thereof 12157077 Cl. B01D 39/1623.
Umehara, Tsuyoshi; Harada, Kentaro; and Kobayashi, Takafumi, to TDK Corporation Method of designing and manufacturing magnetic sensor 12158510 Cl. G01R 33/093.
Umemura, Kenji: See--
Kagabu, Shinzo; Yamamoto, Kentaro; Ohno, Ikuya; Nagata, Hirotaka; Takiguchi, Yukiko; Umemura, Kenji; and Mitomi, Masaaki 12156523 Cl. A01N 43/58.
Umezaki, Atsushi; to Semiconductor Energy Laboratory Co., Ltd. Display device 12159880 Cl. H01L 27/124.
Unagami, Yuji; Inokuchi, Toshihiro; and Ohmori, Motoji, to Panasonic Intellectual Property Corporation of America Charging station, battery management system, and charging method that forgo charging when a degree of deterioration is advanced 12157384 Cl. B60L 53/62.
Underground Magnetics, Inc.: See--
Khapochkin, Yuriy; and Fedorov, Dmitry 12158069 Cl. E21B 47/13.
Underhill, Derek Michael: See--
Nook, Jonathan Lewis; Nook, Sr., William Knight; Stanfield, James Richard; and Underhill, Derek Michael 12157381 Cl. B60L 53/18.
Underwood, Jonathan; Barlow, Neil; and Scott, Fraser Richard, to Capital One Services, LLC Methods and systems for comparing crowd sourced threat modeling systems to non-integrated threat modeling systems 12158957 Cl. G06F 21/577.
UNILIN BV: See--
Cappelle, Mark; and Devos, Pieter 12158013 Cl. E04F 15/02038.
Devos, Pieter 12158014 Cl. E04F 15/107.
UNIMATEC CO., LTD.: See--
Urata, Kimihiko; Oda, Yuichiro; Kondo, Takuya; and Kaneumi, Yoshiyama 12157752 Cl. C07F 9/091.
Unimicron Technology Corp.: See--
Yang, Kai-Ming; Peng, Chia-Yu; Ko, Cheng-Ta; and Lin, Pu-Ju 12160953 Cl. H05K 1/0298.
UNISANTIS ELECTRONICS SINGAPORE PTE. LTD.: See--
Harada, Nozomu; and Sakui, Koji 12159923 Cl. H01L 29/66666.
Unison Industries, LLC: See--
Nayak, Subrata; Dranschak, David Allan; Zinger, Marc David; Meyers, Shiloh Montegomery; Asdev, Jasraj; Patil, Sharad Pundlik; Paramashivaiah, Sagar; and Yamarthi, David Raju 12158075 Cl. F01D 21/045.
UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY): See--
Kim, Jangbae; Park, Soojin; Chae, Jonghyun; Yang, Jihye; Bok, Taesoo; Hong, Dongki; Ryu, Jaegeon; and Yoo, Seokkeun 12159999 Cl. H01M 4/587.
Kim, Jin Gook; and Jeong, Sang Yeong 12159742 Cl. H01F 27/427.
UNITED IMAGING RESEARCH INSTITUTE OF INNOVATIVE MEDICAL EQUIPMENT: See--
Xie, Fan 12160253 Cl. H03M 7/6011.
United Microelectronics Corp: See--
Li, Xiang; Chen, Ding Lung; and Yao, Changda 12159917 Cl. H01L 29/66189.
UNITED MICROELECTRONICS CORP.: See--
Hsu, Yu-Ming; Chen, Yen-Hsing; Yang, Tsung-Mu; and Wang, Yu-Ren 12159930 Cl. H01L 29/7785.
Wang, Hui-Lin; Hsu, Ching-Hua; Weng, Chen-Yi; Jhang, Jing-Yin; and Hsu, Po-Kai 12161050 Cl. H10N 50/01.
United Parcel Service of America, Inc.: See--
Woodrough, Jr., Stephens B.; and Brown, Joshua D. 12157641 Cl. B65G 47/24.
United Services Automobile Association: See--
Prasad, Bharat; Brown, Christine Marie; Gonzales, Rod; and Healy, Jodi Jean 12157052 Cl. A63F 13/212.
United Services Automobile Association (USAA): See--
Bueche, Jr., Michael Patrick; Prasad, Bharat; Liang, Minya; Medina, Reynaldo; and Oakes, III, Charles Lee 12159310 Cl. G06Q 40/02.
Jones, Jr., David M.; Black, Robert Lee; Chalmers, Timothy Blair; Luck, Gideon Bowie; Jonak, Sumita T.; Maldonado, Ana Rosa; and Tijerina, Oscar Roberto 12159126 Cl. G06F 8/4435.
Khmelev, Yevgeniy Viatcheslavovich; Guerra, Oscar; Pollack, Jeffrey Neal; Dziuk, Janelle Denice; Philbrick, Ashley Raine; Russell, Ryan Thomas; and Dixon, David Patrick 12157427 Cl. B60R 21/0136.
Philbrick, Ashley; Jackson, Justin; Mitchem, Sean C.; Khmelev, Yevgeniy; Lyle, Ruthie; and Durairaj, Ravi 12158962 Cl. G06F 21/604.
Prasad, Bharat; Oakes, III, Charles Lee; Vijayvergia, Gunjan C.; Jayapalan, Vijay; and Buckingham, Thomas Bret 12160420 Cl. H04L 63/0853.
Raubenheimer, Peter D.; Spears, James M.; and Taylor, Crystal J. 12159315 Cl. G06Q 40/08.
Schwarz, Jr., Thomas Wayne; Mitchem, Sean Carl; Chalmers, Timothy Blair; Black, Robert Lee; and Luck, Gideon Bowie 12160430 Cl. H04L 63/1416.
United States Government as Represented by The Department of Veteran Affairs, The: See--
Madabhushi, Anant; Barrera, Cristian; Khorrami, Mohammadhadi; Jain, Prantesh; and Dowlati, Afshin 12159403 Cl. G06T 7/0012.
United States of America as represented by the Administrator of NASA: See--
Courtright, Zachary Stephen 12157179 Cl. B23K 20/1215.
United States of America, as represented by the Secretary, Department of Health and Human Services, The: See--
Hinrichs, Christian S.; and Jin, Benjamin Y. 12157762 Cl. C07K 14/7051.
United States of America, as Represented by the Secretary of Agriculture, The: See--
Cheng, Huai N.; Dowd, Michael K.; and He, Zhongqi 12157843 Cl. C09J 189/00.
United States of America as represented by the Secretary of the Air Force: See--
Tassev, Vladimir 12157956 Cl. C30B 25/04.
United States of America as represented by the Secretary of the Navy: See--
Dawson, David Carlos 12160049 Cl. H01Q 3/2611.
Gabrys, Ryan; Martinez, Luis M.; Fugate, Sunny James; and Tall, Mike 12160508 Cl. H04L 9/0869.
United States of America, as Represented by the Secretary of the Navy, The: See--
Hammond, Christopher J.; and Potter, Alexander M. 12159980 Cl. H01M 10/4285.
McNicholas, William E.; Gwaltney, Joshua E.; Scheid, Eric; Cummings, Matt E.; and Davis, Andrew Richard 12158327 Cl. F42B 12/24.
United States of America, represented by the Secretary of the Navy, The: See--
Nwokoye, Chidubem A.; Yoo, JinHyeon; and Jones, Nicholas J. 12158511 Cl. G01R 33/323.
UNITED STATES POSTAL SERVICE: See--
Johnson, Jeffrey C.; Jackson, Leonetta J.; Chappidi, Srinivasa R.; Growney, Dongni S.; Nidhiri, Bijai T.; Tan, Danny; Thokalath, Jini J.; and Yin, Gang 12160795 Cl. H04W 4/029.
Zeng, Hui; Shumway, Douglas R.; Geske, Paul A.; and Udomsawat, Wilairat 12158883 Cl. G06F 16/2428.
Universal City Studios LLC: See--
Puglisi, Nicholas Anthony; and Lugo, Victor Alexander 12159507 Cl. G07F 17/3227.
UNIVERSAL DISPLAY CORPORATION: See--
Dyatkin, Alexey Borisovich; and Ma, Bin 12161047 Cl. H10K 85/6572.
Menon, Vinod M.; Fusella, Michael; and Thompson, Nicholas J. 12161009 Cl. H10K 50/822.
Tsai, Jui-Yi; Dyatkin, Alexey Borisovich; Yeager, Walter; Boudreault, Pierre-Luc T.; and Chen, Hsiao-Fan 12157748 Cl. C07F 15/0086.
UNIVERSIDAD TÉCNICA FEDERICO SANTA MARÍA: See--
González Böhme, Luis Felipe; García Alvarado, Rodrigo Hernán; Quitral Zapata, Francisco Javier; Martínez Rocamora, Alejandro; and Auat Cheein, Fernando Alfredo 12158015 Cl. E04G 21/0436.
UNIVERSITA' DEGLI STUDI DI MODENA E REGGIO EMILIA: See--
Bocci, Guido; Di Desidero, Teresa; Giuliani, Daniela; Guarini, Salvatore; Orlandi, Paola; Ottani, Alessandra; Pardini, Carla Maria Francesca; and Vaglini, Francesca 12156867 Cl. A61K 31/4164.
Universita' Degli Studi “G. d'Annunzio” Chieti-Pescara: See--
Kabir, Abuzar; Furton, Kenneth G.; Locatelli, Marcello; and Tartaglia, Angela 12158403 Cl. G01N 1/34.
UNIVERSITA' DI PISA: See--
Bocci, Guido; Di Desidero, Teresa; Giuliani, Daniela; Guarini, Salvatore; Orlandi, Paola; Ottani, Alessandra; Pardini, Carla Maria Francesca; and Vaglini, Francesca 12156867 Cl. A61K 31/4164.
Universite De Lille: See--
Danneville, Francois; Cappy, Alain; Sourikopoulos, Ilias; and Loyez, Christophe 12159220 Cl. G06N 3/065.
UNIVERSITE LE HAVRE NORMANDIE: See--
Eudier, Florine; Grisel, Michel; Picard, Céline; and Savary, Géraldine 12159552 Cl. G09B 23/30.
UNIVERSITE PARIS-SACLAY: See--
Balembois, François; and Pichon, Pierre 12158601 Cl. G02B 6/0003.
Universite Paris-Suclay: See--
Gonzales, Juan Carlos; Costan, Valentin; Damm, Gilney; Benchaib, Abdelkrim; Lamnabhi-Lagarrigue, Françoise; and Luscan, Bruno 12160111 Cl. H02J 5/00.
Universiteit Twente: See--
Prakash, Jai; Van Hoogevest, Peter; and Storm, Gerrit 12156938 Cl. A61K 9/127.
UNIVERSITY-INDUSTRY COOPERATION GROUP OF KYUNG HEE UNIVERSITY: See--
Jeong, Sun Ho; Jo, Ye Jin; Bae, Sang Hyeok; and Shim, Ji Yu 12157828 Cl. C09D 11/52.
Kang, Jung Won; Ko, Hyun Suk; Lim, Sung Chang; Lee, Jin Ho; Jun, Dong San; Kim, Hui Yong; Park, Gwang Hoon; Choi, Jin Soo; Kim, Tae Hyun; Lee, Dae Young; and Heo, Young Su 12160565 Cl. H04N 19/105.
University of Adelaide, The: See--
Warren-Smith, Stephen Christopher; Ebendorff-Heidepriem, Heike; Nguyen, Viet Linh; and Schartner, Erik Peter 12158377 Cl. G01K 11/3206.
University of Akron, The: See--
Becker, Matthew; Kleinfehn, Alex P.; and Petersen, Shannon R. 12157795 Cl. C08G 63/823.
University of Central Florida Research Foundation, Inc.: See--
Li, Guifang; and LiKamWa, Patrick 12160078 Cl. H01S 3/06754.
Wu, Annie S. 12158861 Cl. G06F 16/1744.
UNIVERSITY OF CONNECTICUT: See--
Yan, Riqiang; and Das, Brati 12156879 Cl. A61K 31/549.
University of Florida Research Foundation, Inc.: See--
Chauhan, Anuj; Dixon, Phillip J.; and Sekar, Poorvajan 12156850 Cl. A61J 1/1468.
MacIntosh, Andrew J.; Cagampang, Gloria; and Percival, Susan S. 12156526 Cl. A23D 9/013.
University of Florida Research Foundation, Incorporated: See--
Bloom, David C.; Lewin, Alfred S.; Neumann, Donna M.; Watson, Zachary L.; Tuli, Sonal Sanjeev; and Schultz, Gregory Scott 12156919 Cl. A61K 48/0091.
University of Hong Kong, The: See--
Choy, Chik Ho; and Kim, Jinwook 12157142 Cl. B05D 1/38.
University of Kansas: See--
Shiflett, Mark Brandon; Kore, Rajkumar; and Scurto, Aaron M. 12157719 Cl. C07C 309/06.
University of Kentucky Research Foundation: See--
Wang, Wang-Xia 12157918 Cl. C12Q 1/6883.
University of lowa Research Foundation: See--
Laroia, Sandeep 12156706 Cl. A61B 34/20.
University of Manchester, The: See--
Kocobas, Coskun; Bakan, Gokhan; and Ergoktas, Muhammed Said 12157287 Cl. B32B 15/18.
UNIVERSITY OF MARYLAND, BALTIMORE: See--
Kaushal, Sunjay 12156891 Cl. A61K 35/34.
UNIVERSITY OF MARYLAND, COLLEGE PARK: See--
Hu, Liangbing; Song, Jianwei; Chen, Chaoji; and Gong, Amy 12157249 Cl. B27K 3/007.
Saeidi, Hamed; Krieger, Axel; Leonard, Simon; and Opfermann, Justin 12156708 Cl. A61B 34/30.
Scarcelli, Giuliano; Zhang, Jitao; and Nikolic, Milos 12158373 Cl. G01J 3/4412.
UNIVERSITY OF NORTH TEXAS: See--
Mahbub, Ifana; Reid, Russell; Adhikari, Pashupati R.; Tasneem, Nishat T.; and Biswas, Dipon K. 12160185 Cl. H02N 1/08.
University of Science and Technology Beijing: See--
Yan, Baijun; Dong, Zihui; and Zhang, Jie 12157931 Cl. C22B 7/04.
UNIVERSITY OF SHARJAH: See--
Altel, Taleb H.; El-Awady, Raafat A; Vunnam, Srinivasulu; Vazhappilly, Cijo George; and Omar, Hany A. 12157745 Cl. C07D 513/14.
University of South Florida: See--
Aghayev, Kamran; Doulgeris, James J.; Gonzalez Blohm, Sabrina A.; and Vrionis, Frank D. 12156818 Cl. A61F 2/447.
University of Southern California: See--
Cronin, Stephen B.; Nystrom, Alec; Subramanian, Sriram; Gururajan, Vyaas; Shi, Haotian; Gundersen, Martin A.; Schroeder, William; Yang, Sisi; Schroeder, Christi; Egolfopoulos, Fokion; and Huiskamp, Tom 12157089 Cl. B01D 53/32.
UNIVERSITY OF SURREY: See--
Fallah, Mohammad Saber; and Biddle, Liam Thomas 12158752 Cl. G05B 23/0283.
UNIVERSITY OF TENNESSEE RESEARCH FOUNDATION: See--
Hewezi, Tarek Abdelfattah; Rambani, Aditi; Pantalone, Vincent R.; and Rice, J. Hollis 12157896 Cl. C12N 15/8285.
Hun, Diana; Cao, Pengfei; Saito, Tomonori; Zhang, Zhen; Li, Bingrui; and Ghezawi, Natasha 12157845 Cl. C09J 7/30.
Wall, Jonathan S.; Foster, James S.; and Guthrie, Spencer 12157765 Cl. C07K 16/18.
University of Utah Research Foundation: See--
Heflin, John; Fallin, T. Wade; and Evans, Zackery 12156683 Cl. A61B 17/7098.
University of Washington: See--
Khokhlova, Vera; Bailey, Michael R.; Farr, Navid; Khokhlova, Tatiana D.; Kreider, Wayne; Maxwell, Adam D.; Partanen, Ari; Sapozhnikov, Oleg A.; Schade, George R.; and Wang, Yak-Nam 12157018 Cl. A61N 7/02.
UNLIKELY ARTIFICIAL INTELLIGENCE LIMTED: See--
Tunstall-Pedoe, William; Curran, Finlay; Roscoe, Harry; and Heywood, Robert 12159117 Cl. G06F 40/35.
Unnikrishnan, Jayakrishnan; and Niesen, Urs, to QUALCOMM Incorporated Resolution of elevation ambiguity in one-dimensional radar processing 12158518 Cl. G01S 13/89.
Unnithan, Hima: See--
Abdou, Meena; Unnithan, Hima; Atluri, Sunil; Meshram, Amit Kumar; Le, Thien B; Assadihaghi, Atousa; Marpu, Rhea; Maufort, Rocky J; Caplan, Moshe; Craig, Ben; Rai, Myna; Dey, Srinwantu; and Manaloto, Paul 12158937 Cl. G06F 21/34.
Unterbrunner, Philipp Thomas: See--
Dageville, Benoit; Povinec, Peter; Unterbrunner, Philipp Thomas; and Hentschel, Martin 12158970 Cl. G06F 21/6227.
UOP LLC: See--
Liu, Chunqing; Dong, Xueliang; and Webb, Jeremy 12157087 Cl. B01D 53/228.
Upadhyay, Devesh: See--
Admasu, Alemayehu; Upadhyay, Devesh; Blanchard, Patrick James; and Tardiff, Janice Lisa 12159395 Cl. G06T 7/001.
Uphoff, Laura A.: See--
Fields, Brian Mark; Cielocha, Steven C.; Alt, Jacob J.; Uphoff, Laura A.; Chan, Leo Nelson; Wazeer, Mohamed A.; Gaudin, Kristopher Keith; Davis, Justin; Baumann, Nathan W.; and Roll, Giles 12159317 Cl. G06Q 50/00.
Upsilon Healthcare Technology, LLC: See--
Sturniolo, Antonella; Meyer, Harrison; Briganti, Richard; and Soichet, Stefanie 12156830 Cl. A61F 6/142.
Upton, Christopher: See--
Philip, Ramila; Perrins, Richard David; Huang, Xiaofang; Rademacher, Thomas; and Upton, Christopher 12156909 Cl. A61K 39/145.
Urabe, Yoshio: See--
Chitrakar, Rojan; Huang, Lei; and Urabe, Yoshio 12160283 Cl. H04B 7/024.
Urak, Evren: See--
Hirtsiefer, Artur; Tanriverdi, Himmet; and Urak, Evren 12158031 Cl. E05D 15/1042.
Urata, Izumi: See--
Goto, Daisuke; Yamashita, Fumihiro; Matsui, Munehiro; Shibayama, Hiroki; Imaizumi, Yutaka; Harada, Koichi; Urata, Izumi; and Shima, Masaki 12160855 Cl. H04W 72/0453.
Urata, Kimihiko; Oda, Yuichiro; Kondo, Takuya; and Kaneumi, Yoshiyama, to UNIMATEC CO., LTD. Perfluoropolyether phosphate ester, method for producing the same, and surface treatment agent comprising the same as active ingredient 12157752 Cl. C07F 9/091.
Uratani, Mitsuru; Yamada, Takayuki; Kunieda, Hiroyasu; and Hori, Shinjiro, to Canon Kabushiki Kaisha Image processing apparatus, control method, and storage medium 12159336 Cl. G06T 11/60.
Urban-Klik, Manfred: See--
Nachbagauer, Josef; Urban-Klik, Manfred; and Boehringer, Volker 12156527 Cl. A23L 2/60.
Nachbagauer, Josef; Urban-Klik, Manfred; and Boehringer, Volker 12156528 Cl. A23L 2/60.
Urban, Shannon S.: See--
McCurdy, Alexander T.; Muppaneni, Tapaswy; Flittie, Brett A.; Urban, Shannon S.; Milbrandt, Jacob A.; and Bly, Steven T. 12157822 Cl. C08L 91/00.
Urness, Adam C.: See--
Ayres, Mark R.; Urness, Adam C.; and Chung, Jaebum 12158581 Cl. G02B 27/0172.
Ursenbach, Daniel O.: See--
Shen, Shyan Bob; van Tooren, Michael; Lohman, Sarah; Ursenbach, Daniel O.; and Ballocchi, Paolo 12157277 Cl. B29C 65/0618.
Usher, Raymond W.: See--
Grubac, Vladimir; Bonner, Matthew D.; Usher, Raymond W.; Anderson, Thomas A; and Alfoqaha, Arshad A. 12157003 Cl. A61N 1/05.
Usui, Masaaki; to RENESAS ELECTRONICS CORPORATION AD converter and semiconductor device including the same 12160245 Cl. H03M 1/1245.
UT-Battelle, LLC: See--
Hun, Diana; Cao, Pengfei; Saito, Tomonori; Zhang, Zhen; Li, Bingrui; and Ghezawi, Natasha 12157845 Cl. C09J 7/30.
Utsumi, Tetsuaki; to Kioxia Corporation Semiconductor memory device 12159678 Cl. G11C 16/30.
Utsunomiya, Hirofumi: See--
Tajiri, Yoji; Shiotani, Yoshihiro; and Utsunomiya, Hirofumi 12160075 Cl. H01R 35/04.
Utsunomiya, Takahiro; to TOYOTA JIDOSHA KABUSHIKI KAISHA Power generation control apparatus, vehicle, control method, and control program 12157401 Cl. B60L 8/003.
Uyeda, Alan; and Lin, James, to ASSA ABLOY Americas Residential Inc. Locking assembly with spring mechanism 12158023 Cl. E05B 49/00.
Uzawa, Kiyoshi: See--
Nishimura, Isao; Uzawa, Kiyoshi; and Nunotani, Katsuhiko 12157281 Cl. B29C 70/56.