CPC G01R 1/06722 (2013.01) [G01R 1/06738 (2013.01); G01R 1/0735 (2013.01); G01R 3/00 (2013.01)] | 22 Claims |
1. A probe, comprising:
(a) a first tip arm connecting directly or indirectly to an attachment region of a first tip for making electrical contact to a first electrical circuit element;
(b) a second tip arm connecting directly or indirectly to an attachment region of a second tip;
(c) a compliant structure comprising at least one spring, wherein a first region of the compliant structure directly or indirectly joins the first tip arm and a second region of the compliant structure directly or indirectly joins the second tip arm,
wherein a relative displacement of the first and second tip arms results in elastic movement of the at least one spring of the compliant structure;
(d) a first frame structure comprising at least one first lateral element, a second lateral element and a first pair of longitudinal elements extending from the first lateral element to the second lateral element, the first lateral element being connected directly or indirectly to the first tip arm and the second lateral element being connected to the first region of the compliant structure; and
(e) a second frame structure comprising at least one third lateral element, a fourth lateral element and a second pair of longitudinal elements extending from the third lateral element to the fourth lateral element, the third lateral element being connected to the second region of the compliant structure and the fourth lateral element being connected directly or indirectly to the second tip arm,
wherein the first and second frame structures are elastically joined to one another by the at least one spring of the compliant structure and allowed to slide relative to one another by movement of the first and second pair of longitudinal elements.
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