US 12,175,101 B2
Techniques to predict or determine time-to-ready for a storage device
Joseph D. Tarango, Longmont, CO (US); and Jim S. Baca, Longmont, CO (US)
Assigned to SK hynix NAND Product Solutions Corp., San Jose, CA (US)
Filed by SK hynix NAND Product Solutions Corp., San Jose, CA (US)
Filed on Jun. 8, 2023, as Appl. No. 18/207,548.
Application 18/207,548 is a continuation of application No. 16/831,689, filed on Mar. 26, 2020, granted, now 11,748,001.
Prior Publication US 2023/0315309 A1, Oct. 5, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 3/00 (2006.01); G06F 3/06 (2006.01); G06N 5/04 (2023.01)
CPC G06F 3/0629 (2013.01) [G06F 3/0616 (2013.01); G06F 3/0679 (2013.01); G06N 5/04 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A system comprising:
a memory; and
a controller coupled to the memory and configured to at least:
obtain first operating information included in a snapshot for a data storage device, the snapshot associated with a first time interval during operation of the data storage device; and
predict, based on the first operating information, a time-to-ready (TTR) value that indicates an amount of time the data storage device will be at an operational state following a power loss recovery of the data storage device.