CPC G11C 29/46 (2013.01) [G11C 29/4401 (2013.01); G11C 29/56004 (2013.01)] | 13 Claims |
1. A memory test method, comprising:
testing a second memory to acquire defect information of the second memory;
storing the defect information of the second memory;
acquiring repair information of the second memory according to the defect information of the second memory;
repairing the second memory according to the repair information of the second memory;
testing a first memory to acquire defect information of the first memory;
acquiring repair information of the first memory according to the defect information of the first memory; and
storing the repair information of the first memory in the second memory.
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