CPC G06T 11/008 (2013.01) [G06T 7/11 (2017.01); G06T 2207/10081 (2013.01); G06T 2207/20081 (2013.01)] | 19 Claims |
1. A method for providing a second artifact-reduced x-ray image dataset based on an artifact-affected x-ray image dataset of an examination object, an artifact of the artifact-affected x-ray image dataset being caused by an object being at least one of on, outside of or within the examination object, the method comprising:
provisioning
the artifact-affected x-ray image dataset and creating a first projection dataset, including a plurality of projections, based on the artifact-affected x-ray image dataset, or
the first projection dataset including the plurality of projections, and creating the artifact-affected x-ray image dataset based on the first projection dataset;
creating a first artifact-reduced x-ray image dataset based on the artifact-affected x-ray image dataset, and creating a second projection dataset based on the first artifact-reduced x-ray image dataset;
identifying an object area; in at least one projection of the first projection dataset, the object area mapping the object in the at least one projection;
creating a third projection dataset based on the first projection dataset, the third projection dataset including an adapted projection value, the adapted projection value being a first projection value in the object area of the first projection dataset and adapted based on a second projection value of the second projection dataset and as a function of a measure of influence of the first projection value by the artifact; and
creating the second artifact-reduced x-ray image dataset based on the third projection dataset, the second artifact-reduced x-ray image dataset being provided based on the third projection dataset, and wherein
a respective projection of the plurality of projections corresponds to an irradiation of the examination object with x-ray radiation from a projection direction,
the object is an asymmetrical object, the asymmetrical object including a longitudinal extent and a transverse extent,
a maximum of the transverse extent is less than or equal to 30% of a maximum of the longitudinal extent, and
the object is in the examination object such that a majority of the longitudinal extent overlaps with the projection direction.
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