	US 11,852,823 B2
	Device and method for measuring depth of object
Sangho Yoon, Suwon-si (KR); Jongchul Choi, Suwon-si (KR); Jaewoo Ko, Suwon-si (KR); and Bonkon Koo, Suwon-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Appl. No. 17/602,645
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
PCT Filed Sep. 24, 2021, PCT No. PCT/KR2021/013059 § 371(c)(1), (2) Date Oct. 8, 2021, PCT Pub. No. WO2022/075642, PCT Pub. Date Apr. 14, 2022.
Claims priority of application No. 10-2020-0130460 (KR), filed on Oct. 8, 2020.
Prior Publication US 2023/0122125 A1, Apr. 20, 2023
Int. Cl. G02B 27/00 (2006.01); G01S 17/894 (2020.01); G01B 11/25 (2006.01); G06T 19/00 (2011.01); G02B 27/01 (2006.01)

CPC G02B 27/0172 (2013.01) [G01B 11/25 (2013.01); G01S 17/894 (2020.01); G06T 19/006 (2013.01); G06T 2207/10028 (2013.01)]

15 Claims

1. A method, by an augmented reality (AR) device, of measuring a depth of an object, the method comprising:

determining, from among a dot-pattern and a surface-pattern, a pattern of light to be emitted for measuring the depth of the object;

identifying, from within an entire area of a pattern generator, a partial area of a light source unit corresponding to an area for the determined pattern;

emitting light through the area for the determined pattern, by activating the identified partial area of the light source unit;

receiving light reflected from the object; and

measuring the depth of the object based on the emitted light and the received reflected light.