US 11,852,684 B2
Methods and systems for detecting defects on an electronic assembly
Leonid Gurov, Rishon LeZion (IL); Gal Peled, Ezer (IL); Dan Sebban, Rishon LeZion (IL); and Shaul Teplinsky, San Francisco, CA (US)
Assigned to Optimal Plus Ltd., Holon (IL)
Filed by Optimal Plus Ltd., Holon (IL)
Filed on Mar. 31, 2023, as Appl. No. 18/194,264.
Application 18/194,264 is a continuation of application No. 16/981,951, granted, now 11,650,250, previously published as PCT/IL2019/050311, filed on Mar. 20, 2019.
Claims priority of provisional application 62/646,596, filed on Mar. 22, 2018.
Prior Publication US 2023/0236245 A1, Jul. 27, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G01R 31/28 (2006.01); H01L 21/66 (2006.01)
CPC G01R 31/318511 (2013.01) [G01R 31/31718 (2013.01); H01L 22/12 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of identifying defects in an electronic assembly, comprising, by a processing unit:
obtaining a grid of nodes representative of a location of electronic units of an electronic assembly, wherein each node is representative of an electronic unit and is neighboured by at most eight other nodes,
wherein a first plurality of nodes represents failed electronic units according to at least one test criterion, and a second plurality of nodes represents passing electronic units according to the least one test criterion,
based on the grid, determining for at least one first node of the first plurality of nodes, at least one first straight line which:
is oriented along a direction on the grid out of four possible directions,
includes the first node and nodes of at least the first plurality of nodes, and
matches a first criterion,
based on the grid, determining for at least one second node of the first plurality of nodes, at least one second straight line which:
is oriented along a direction on the grid out of four possible directions,
includes the second node and nodes of at least the first plurality of nodes, and
matches the first criterion,
wherein if the first straight line and the second straight line match a second criterion, determining a third line which fits at least part of the first line and at least part of the second line according to a fitting criterion, thereby identifying, based on this third line, a subset of nodes, and
wherein if at least one node from the subset of nodes belongs to the second plurality of nodes, concluding that an electronic unit represented by the at least one node on the grid is a failed electronic unit, thereby facilitating identification of a failed electronic unit of the electronic assembly.