US 11,852,676 B2
Integrated circuit with reference sub-system for testing and replacement
Carlo Caimi, Cinisello Balsamo (IT); Massimiliano Pesaturo, Torre de' Roveri (IT); Stefano Antonio Mastrorosa, Milan (IT); Alfredo Lorenzo Poli, Pontida (IT); and Marco Della Seta, Milan (IT)
Assigned to STMICROELECTRONICS S.R.L., Agrate Brianza (IT)
Filed by STMICROELECTRONICS S.R.L., Agrate Brianza (IT)
Filed on Feb. 15, 2022, as Appl. No. 17/672,588.
Prior Publication US 2023/0258709 A1, Aug. 17, 2023
Int. Cl. G01R 31/28 (2006.01); G01R 31/00 (2006.01); G01R 31/317 (2006.01); G01R 31/3187 (2006.01); G01R 31/3185 (2006.01)
CPC G01R 31/2856 (2013.01) [G01R 31/007 (2013.01); G01R 31/3187 (2013.01); G01R 31/31703 (2013.01); G01R 31/31724 (2013.01); G01R 31/318525 (2013.01)] 16 Claims
OG exemplary drawing
 
1. An integrated circuit, comprising:
a sub-system;
a reference sub-system, wherein the reference sub-system is capable of performing a function of the sub-system and is inactive within the integrated circuit by default;
a test circuit coupled to the sub-system and the reference sub-system and configured to obtain a parameter value from the sub-system and a reference parameter value from the reference sub-system;
a control circuit coupled to the test circuit and configured to compare the parameter value to the reference parameter value and to determine whether the sub-system has deteriorated based on the parameter value and the reference parameter value.