US 11,852,668 B2
Method and system for real time outlier detection and product re-binning
Shaul Teplinsky, San Francisco, CA (US); Arie Peltz, Ness Ziona (IL); and Dan Sebban, Rishon LeZion (IL)
Assigned to OPTIMAL PLUS LTD., Holon (IL)
Filed by Optimal Plus Ltd., Holon (IL)
Filed on Jul. 12, 2022, as Appl. No. 17/863,261.
Application 17/863,261 is a continuation of application No. 16/682,925, filed on Nov. 13, 2019, granted, now 11,402,419.
Claims priority of provisional application 62/760,327, filed on Nov. 13, 2018.
Prior Publication US 2022/0349930 A1, Nov. 3, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 31/01 (2020.01); G01R 31/317 (2006.01); B07C 5/344 (2006.01)
CPC G01R 31/01 (2013.01) [B07C 5/344 (2013.01); G01R 31/31718 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method for analyzing device test data, the method comprising:
accessing a core analytics rule that is based on manufacturing data of a plurality of devices, wherein each of the plurality of devices are produced in one of a plurality of manufacturing facilities and are of a same type as a first device being tested on a tester at a testing facility;
receiving initial test results of a plurality of other devices of a same type tested at the testing facility;
generating, based on the initial test results, an edge analytics rule;
modifying the core analytics rule based on the edge analytics rule, wherein the modified core analytics rule includes modified binning limits;
applying the modified core analytics rule to testing data obtained by testing the first device while the first device is still on the tester; and
determining, based on applying the modified core analytics rule, that the first device is an outlier with respect to the modified binning limits while the first device is still on the tester.