CPC G01N 33/207 (2019.01) [G01N 29/043 (2013.01); H05H 1/2406 (2013.01); G01N 2291/267 (2013.01)] | 20 Claims |
1. A system for evaluating a bond, comprising:
a first electrode;
a second electrode spaced apart from the first electrode;
a sacrificial material layer positioned proximate to a surface of a bonded structure that includes the bond; and
a power source configured to cause the first and second electrodes to generate an electrical arc that at least partially ablates the sacrificial material layer as part of a non-destructive inspection of the bond, wherein a first wave is generated in response to the ablation of the sacrificial material layer, and wherein the first wave reflects off of the bond as a second wave.
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