US 11,852,578 B2
Microparticle measurement spectrometer, microparticle measurement device using the microparticle measurement spectrometer, and method for calibrating microparticle measurement photoelectric conversion system
Masaaki Hara, Tokyo (JP); Tomoyuki Umetsu, Tokyo (JP); and Yoshiki Okamoto, Tokyo (JP)
Assigned to SONY CORPORATION, Tokyo (JP)
Appl. No. 17/250,369
Filed by SONY CORPORATION, Tokyo (JP)
PCT Filed Jun. 7, 2019, PCT No. PCT/JP2019/022685
§ 371(c)(1), (2) Date Jan. 12, 2021,
PCT Pub. No. WO2020/017183, PCT Pub. Date Jan. 23, 2020.
Claims priority of application No. 2018-136365 (JP), filed on Jul. 20, 2018.
Prior Publication US 2021/0318224 A1, Oct. 14, 2021
Int. Cl. G01N 15/14 (2006.01); G01N 3/02 (2006.01); G01N 15/10 (2006.01); G01J 3/02 (2006.01); G01N 21/64 (2006.01)
CPC G01N 15/1429 (2013.01) [G01J 3/02 (2013.01); G01N 15/1012 (2013.01); G01N 21/64 (2013.01); G01N 2015/1006 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A microparticle measurement spectrometer, comprising:
a spectroscopic element configured to disperse that light emitted from microparticles flowing through a flow path; and
a photoelectric conversion array that has a plurality of light receiving elements having different detection wavelength ranges, wherein
the photoelectric conversion array is configured to convert optical information obtained by the light receiving elements into electrical information, and
outputs of all channels of the photoelectric conversion array are uniform when light, with which an amount of light per unit wavelength becomes same, is incident on the photoelectric conversion array.