US 12,499,569 B2
Measurement card, measurement system and measurement method using the same
Yu-Wei Chang, Kaohsiung (TW); Shih-Fang Yang Mao, Zhubei (TW); and Tien-Yan Ma, New Taipei (TW)
Assigned to INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu (TW)
Filed by INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu (TW)
Filed on Jan. 18, 2023, as Appl. No. 18/098,493.
Claims priority of application No. 111137291 (TW), filed on Sep. 30, 2022.
Prior Publication US 2024/0112360 A1, Apr. 4, 2024
Int. Cl. G06T 7/60 (2017.01); G01B 11/00 (2006.01); G06T 7/73 (2017.01); G06T 7/90 (2017.01); G06V 10/25 (2022.01); G06V 10/56 (2022.01)
CPC G06T 7/60 (2013.01) [G06T 7/73 (2017.01); G06T 7/90 (2017.01); G06V 10/25 (2022.01); G06V 10/56 (2022.01); G06T 2207/10024 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30204 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A measurement system, comprising:
a camera configured for capturing a measurement card image of a measurement card, the measurement card comprises a main body and a plurality of feature patterns, wherein the main body has a lateral edge and a tip opposite to the lateral edge, the feature patterns are formed on the main body, and the feature patterns satisfy at least one of the following (1) and (2): (1). there is a first interval between a first-one and a second-one of the feature patterns in a reference axis passing through the lateral edge and the tip, there is a second interval between the second-one and a third-one of the feature patterns in the reference axis, wherein the second interval is different from the first interval; (2). the feature patterns are asymmetrically arranged with respect to the reference axis; the measurement card image comprises a plurality of feature pattern images corresponding to the feature patterns; and
a processor electrically connected to the camera and configured to:
analyze the feature pattern images to obtain a feature point coordinate of a feature point of each of the feature pattern images; and
input the feature point coordinates into a transformation matrix to obtain a tip coordinate of the tip.