US 11,844,206 B2
Semiconductor device and method for fabricating the same
Seung Hwan Kim, Gyeonggi-do (KR)
Assigned to SK hynix Inc., Gyeonggi-do (KR)
Filed by SK hynix Inc., Gyeonggi-do (KR)
Filed on Aug. 17, 2021, as Appl. No. 17/404,462.
Claims priority of application No. 10-2021-0026739 (KR), filed on Feb. 26, 2021.
Prior Publication US 2022/0278106 A1, Sep. 1, 2022
Int. Cl. H10B 12/00 (2023.01); H01L 29/06 (2006.01)
CPC H10B 12/30 (2023.02) [H01L 29/0649 (2013.01); H10B 12/03 (2023.02); H10B 12/482 (2023.02); H10B 12/488 (2023.02)] 9 Claims
OG exemplary drawing
 
1. A semiconductor device, comprising:
a plurality of active layers vertically stacked over a substrate;
a plurality of bit lines connected to first ends of the active layers, respectively, and extended parallel to the substrate;
line-shape air gaps disposed between the bit lines;
a plurality of capacitors connected to second ends of the active layers, respectively;
a word line and a vertical shape air gap facing each other with the active layers interposed therebetween, the word line and the vertical shape air gap are vertically oriented from the substrate; and
a gap capping layer capping an upper surface of the vertical shape air gap.