US 11,842,080 B2
Memory device health evaluation at a host device
Aaron P. Boehm, Boise, ID (US); Mark D. Ingram, Boise, ID (US); Scott E. Schaefer, Boise, ID (US); Scott D. Van De Graaff, Boise, ID (US); and Todd Jackson Plum, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Apr. 19, 2022, as Appl. No. 17/724,216.
Claims priority of provisional application 63/180,465, filed on Apr. 27, 2021.
Prior Publication US 2022/0342604 A1, Oct. 27, 2022
Int. Cl. G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 11/30 (2006.01)
CPC G06F 3/0659 (2013.01) [G06F 3/0604 (2013.01); G06F 3/0679 (2013.01); G06F 11/3058 (2013.01); G06F 11/3065 (2013.01)] 28 Claims
OG exemplary drawing
 
1. A method, comprising:
receiving, at a host device from a memory device, one or more first parameters indicative of a status of the memory device;
sending the one or more first parameters to a first circuit of the host device based at least in part on identifying the first circuit as a destination for the one or more first parameters;
determining, at the first circuit, the status of the memory device based at least in part on the one or more first parameters; and
transmitting, to the memory device, a command associated with one or more operational parameters that are based at least in part on the status of the memory device.