US 11,841,627 B2
Display panel test method comprising the step of automatically searching for an alignment mark by obtaining position information of the display panel and display panel test device
Zanting Zeng, Shenzhen (CN)
Assigned to SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD., Shenzhen (CN)
Appl. No. 17/419,716
Filed by SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD., Shenzhen (CN)
PCT Filed Dec. 18, 2020, PCT No. PCT/CN2020/137552
§ 371(c)(1), (2) Date Jun. 30, 2021,
PCT Pub. No. WO2021/208478, PCT Pub. Date Oct. 21, 2021.
Claims priority of application No. 202010291069.X (CN), filed on Apr. 14, 2020.
Prior Publication US 2022/0404723 A1, Dec. 22, 2022
Int. Cl. G03F 9/00 (2006.01); G02F 1/1333 (2006.01)
CPC G03F 9/7088 (2013.01) [G02F 1/133354 (2021.01); G03F 9/7084 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A display panel test method, comprising following steps:
obtaining position information of a display panel;
automatically searching for an alignment mark on the display panel according to the position information of the display panel;
determining whether to allow automatic searching again for the alignment mark on the display panel when the alignment mark on the display panel is not found;
searching again for the alignment mark on the display panel when automatically searching again for the alignment mark on the display panel is allowed;
issuing a first warning when a number of times of searching again for the alignment mark on the display panel is greater than a preset value;
choosing to search again for the alignment mark on the display panel or proceeding to a next operation after the first warning is issued;
adjusting a position of the alignment mark on the display panel for aligning the alignment mark after choosing to proceed to the next operation; and
performing a test process after the alignment mark on the display panel is successfully aligned.