| CPC H01J 49/0454 (2013.01) [H01J 49/0036 (2013.01); H01J 49/0418 (2013.01)] | 15 Claims |
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1. A system for calculating an area of a sample peak of a trace produced using high-throughput sample introduction coupled mass spectrometry, comprising:
a sample introduction system that ejects each sample of a series of samples at an ejection time, producing a series of ejections times corresponding to the series of samples, and ionizes each ejected sample of the series of samples, producing an ion beam;
a mass spectrometer that receives the ion beam and mass analyzes the ion beam over time, producing a trace of intensity versus time values for one or more mass-to-charge ratio (m/z) values for the series of samples; and
a processor that
receives the trace and the series of ejection times,
calculates a series of expected peak times corresponding to the series of ejection times using a known delay time from ejection to mass analysis,
identifies at least one isolated peak of the trace using the series of expected peak times,
calculates a peak profile by fitting a mixture of at least two different distribution functions to the at least one isolated peak, and
for at least one time of the series of expected peak times, calculates an area of a peak at the at least one time by fitting the peak profile to the trace at the one time and calculating an area of the fitted peak profile.
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