US 12,493,685 B2
Method and apparatus for testing a device under test
Fabiano Anemone, Stuttgart (DE); Alexei Karpov, Stuttgart (DE); Cederic Laumen, Stuttgart (DE); Stefan Rabin, Stuttgart (DE); Geoffrey Van Den Berge, Stuttgart (DE); and Simon Gillet, Stuttgart (DE)
Assigned to SONY GROUP CORPORATION, Tokyo (JP)
Filed by Sony Group Corporation, Tokyo (JP)
Filed on Mar. 9, 2022, as Appl. No. 17/689,988.
Claims priority of application No. 21162788 (EP), filed on Mar. 16, 2021.
Prior Publication US 2022/0300604 A1, Sep. 22, 2022
Int. Cl. G06F 21/53 (2013.01)
CPC G06F 21/53 (2013.01) [G06F 2221/034 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method for testing a Device Under Test (DUT), the method comprising:
emulating a Trusted Execution Environment (TEE) of the DUT by means of a software emulator running on a device separate from the DUT in order to provide an emulated TEE;
intercepting, at the DUT, a call from a Rich Execution Environment (REE) of the DUT directed to and intended for the TEE of the DUT, the intercepting including augmenting a behavior of an OS, of one or more applications, of one or more functions, of one or more routines, or of another software component of the REE;
redirecting the call from the DUT to the emulated TEE running on the device separate from the DUT such that the call is processed by the emulated TEE; and
transmitting a response of the emulated TEE from the device separate from the DUT to the REE of the DUT, the response being based on the call.