US 11,835,399 B2
Semiconductor integrated circuit with configurable setting based on temperature information
Takayuki Tsukamoto, Yokohama Kanagawa (JP)
Assigned to KIOXIA CORPORATION, Tokyo (JP)
Filed by Kioxia Corporation, Tokyo (JP)
Filed on Jul. 7, 2021, as Appl. No. 17/369,392.
Claims priority of application No. 2021-007123 (JP), filed on Jan. 20, 2021.
Prior Publication US 2022/0228929 A1, Jul. 21, 2022
Int. Cl. G01K 7/01 (2006.01); G05F 3/26 (2006.01); G05F 3/30 (2006.01); G05F 3/02 (2006.01); G05F 3/22 (2006.01); G11C 16/04 (2006.01)
CPC G01K 7/01 (2013.01) [G05F 3/02 (2013.01); G05F 3/222 (2013.01); G05F 3/225 (2013.01); G05F 3/26 (2013.01); G05F 3/262 (2013.01); G05F 3/265 (2013.01); G05F 3/30 (2013.01); G11C 16/0483 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A semiconductor integrated circuit comprising:
a bandgap reference circuit that includes a first bandgap element, a second bandgap element, and a current mirror circuit, the bandgap reference circuit configured to generate a temperature-dependent first voltage and a temperature-independent reference voltage;
an analog-to-digital converter configured to convert the first voltage into an output code based on the reference voltage and output the first voltage as temperature information;
a regulator configured to supply a power supply voltage to the bandgap reference circuit; and
a setting control circuit configured to change a resistance value of the bandgap reference circuit and the regulator based on the temperature information,
wherein the temperature information is an intermediate result which is output from the analog-to-digital converter during detection operation.