US 12,489,974 B2
Imaging apparatus, imaging method, and program
Toshihiro Aoi, Saitama (JP); Masahiko Sugimoto, Saitama (JP); Shinichi Shimotsu, Saitama (JP); and Tetsuya Fujikawa, Saitama (JP)
Assigned to FUJIFILM Corporation, Tokyo (JP)
Filed by FUJIFILM Corporation, Tokyo (JP)
Filed on Feb. 8, 2023, as Appl. No. 18/165,931.
Application 18/165,931 is a continuation of application No. PCT/JP2021/026153, filed on Jul. 12, 2021.
Claims priority of application No. 2020-139633 (JP), filed on Aug. 20, 2020.
Prior Publication US 2023/0185214 A1, Jun. 15, 2023
Int. Cl. H04N 23/67 (2023.01); H04N 23/10 (2023.01); H04N 23/11 (2023.01)
CPC H04N 23/673 (2023.01) [H04N 23/11 (2023.01); H04N 23/125 (2023.01)] 16 Claims
OG exemplary drawing
 
1. An imaging apparatus comprising:
an optical element that extracts a plurality of pieces of band light from incident light incident on an optical system;
a photoelectric conversion device capable of imaging the plurality of pieces of band light extracted from the incident light by the optical element; and
a processor that is configured to output image data obtained by imaging band light, among the plurality of pieces of band light, selected according to an imaging condition determined based on a field of view by the photoelectric conversion device,
wherein the plurality of pieces of band light includes at least one of visible light, high transmittance band light among near-infrared light, or high transmittance band light among short-wavelength infrared light,
at least one of the plurality of pieces of band light is high transmittance band light having higher atmospheric transmittance than other pieces of band light in short-wavelength infrared band light,
a wavelength of the at least visible light is less than 800 nm,
a wavelength of the high transmittance band light among near-infrared light is substantially 1000 nm or 1250 nm, and
a wavelength of the high transmittance band light among short-wavelength infrared light is substantially 1550 nm or 2150 nm.