US 12,488,214 B2
Method for detecting an attack by electromagnetic waves of a chip or a system-in-package based on the GMI effect
Thibaut Sohier, Grenoble (FR); Stéphan Borel, Grenoble (FR); and Jean-Philippe Michel, Grenoble (FR)
Assigned to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES, Paris (FR)
Filed by COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES, Paris (FR)
Filed on Jul. 3, 2023, as Appl. No. 18/346,644.
Claims priority of application No. 22 06850 (FR), filed on Jul. 5, 2022.
Prior Publication US 2024/0013022 A1, Jan. 11, 2024
Int. Cl. G06K 19/073 (2006.01)
CPC G06K 19/07372 (2013.01) [G06K 19/07336 (2013.01)] 9 Claims
OG exemplary drawing
 
1. A method for detecting an attack by electromagnetic waves on an electronic chip or system-in-package type device including at least one attack detection element of the device, said attack detection element including at least one giant magneto-impedance, GMI, effect electrically-conductive material, including at least the following steps:
a) demagnetising the GMI-effect electrically-conductive material such that a value Mrd of its remanent magnetisation is equal to a predefined value lower than the value of its maximum remanent magnetisation,
b) determining a first value of the impedance of the attack detection element for a given value of the frequency of an alternating current circulating in the GMI-effect electrically-conductive material, then
c) after a time period during which the device might have undergone an attack by electromagnetic waves, measuring a second value of the impedance of the attack detection element by circulating in the GMI-effect electrically-conductive material an alternating current with a frequency equal to said given value,
d) comparing the first and second values of the impedance of the attack detection element, the device being considered as having undergone an attack by electromagnetic waves when the first and second values of the impedance of the attack detection element are significantly different from each other.