| CPC G06F 30/398 (2020.01) | 14 Claims |

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1. A method for testing an electronic circuit design, the method comprising:
determining a plurality of signals in the electronic circuit design that have been selected for waveform capture, wherein each of the plurality of signals updates after a respective number of clock cycles of an emulation clock signal;
forming, based on the respective numbers of clock cycles for the plurality of signals to update, a first group of signals from the plurality of signals and a second group of signals from the plurality of signals;
sampling the first group of signals according to a first sampling clock signal to produce a first set of sampled signals, wherein a frequency of the first sampling clock signal is set as a frequency of the emulation clock signal divided by a minimum of the respective numbers of clock cycles for the signals of the first group of signals to update, wherein a size of the first group of signals is based on the minimum of the respective numbers of clock cycles for the signals of the first group of signals to update;
sampling the second group of signals according to a second sampling clock signal to produce a second set of sampled signals, wherein a frequency of the second sampling clock signal is set as a frequency of the emulation clock signal divided by a minimum of the respective numbers of clock cycles for the signals of the second group of signals to update, wherein a size of the second group of signals is based on the minimum of the respective numbers of clock cycles for the signals of the second group of signals to update, and wherein the size of the first group of signals is larger than the size of the second group of signals based on the minimum of the respective numbers of clock cycles for the signals of the first group of signals to update being larger than the minimum of the respective numbers of clock cycles for the signals of the second group of signals to update; and
generating a waveform capture frame based on the first set of sampled signals and the second set of sampled signals.
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