US 12,487,195 B2
Detector stand and X-ray diffraction apparatus
Yuji Shiramata, Tokyo (JP); and Atsushi Kuji, Tokyo (JP)
Assigned to RIGAKU CORPORATION, Tokyo (JP)
Filed by RIGAKU CORPORATION, Tokyo (JP)
Filed on Jan. 9, 2024, as Appl. No. 18/407,503.
Claims priority of application No. 2023-012826 (JP), filed on Jan. 31, 2023.
Prior Publication US 2024/0255446 A1, Aug. 1, 2024
Int. Cl. G01N 23/20008 (2018.01); G01N 23/207 (2018.01)
CPC G01N 23/20008 (2013.01) [G01N 23/207 (2013.01); G01N 2223/056 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/321 (2013.01); G01N 2223/501 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A detector stand for an X-ray detector, comprising:
a first arrangement portion configured to arrange the X-ray detector in first orientation;
a second arrangement portion configured to arrange the X-ray detector in second orientation; and
a mounting portion to which the X-ray detector can be fixed, wherein
in the detector stand, the X-ray detector is selectively mountable on the first arrangement portion or the second arrangement portion through the mounting portion, and
an arrangement angle of the X-ray detector fixed to the mounting portion is different between the first orientation and the second orientation.