US 12,487,078 B2
Apparatus for continuously measuring thickness of thin material, method for continuously measuring thickness of thin material using same, and method for manufacturing high-temperature superconducting wire using same
In Sung Park, Gyeongsangnam-do (KR); Gwan Tae Kim, Gyeongsangnam-do (KR); Ho Sup Kim, Gyeongsangnam-do (KR); and Hong Soo Ha, Gyeongsangnam-do (KR)
Assigned to KOREAN ELECTROTECHNOLOGY RESEARCH INSTITUTE, Gyeongsangnam-do (KR)
Appl. No. 18/280,273
Filed by KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE, Gyeongsangnam-do (KR)
PCT Filed Aug. 7, 2023, PCT No. PCT/KR2023/011569
§ 371(c)(1), (2) Date Sep. 5, 2023,
PCT Pub. No. WO2024/122793, PCT Pub. Date Jun. 13, 2024.
Claims priority of application No. 10-2022-0167829 (KR), filed on Dec. 5, 2022.
Prior Publication US 2025/0020451 A1, Jan. 16, 2025
Int. Cl. G01B 11/06 (2006.01); H01B 12/02 (2006.01)
CPC G01B 11/0691 (2013.01) [G01B 11/0608 (2013.01); H01B 12/02 (2013.01)] 2 Claims
OG exemplary drawing
 
1. A method for continuously measuring a thickness of a thin material, the method comprising:
measurement preparation step in which the thin material provided to be movable for a continuous manufacturing process of the thin material as a measurement target and at least one of the apparatus for continuously measuring the thickness of the thin material in correspondence to an entire manufacturing process are disposed;
representative shape measurement step in which a representative shape of the thin material is measured using any one measurement apparatus in a state in which movement of the thin material prepared through the measurement preparation step is stopped and a measured representative shape is transmitted to a main control unit;
thickness measurement information setting step in which the main control unit receives information on the measured representative shape and movement control information is determined according to a measurement width and a measurement length of the thin material; and
measurement method selection step in which a thickness distribution measurement method is selected on the basis of the movement control information set through the thickness measurement information setting step,
wherein, in the measurement method selection step, any one among a method of forming a scan line for detecting a thickness distribution of the thin material in a widthwise direction, a method of forming a scan line for detecting a thickness distribution of the thin material in a lengthwise direction and a method of forming a meandering scan line for detecting an overall thickness distribution of the thin material is selected,
wherein the apparatus comprises:
a main frame configured by an upper frame and a lower frame which are provided in a direction crossing with a movement direction of the thin material to be measured and a vertical frame which connects the upper frame and the lower frame;
an upper slider and a lower slider moved by sliding along guide grooves which are formed in the upper frame and the lower frame;
an upper confocal sensor provided on the upper slider, and radiating light toward the thin material; and
a lower confocal sensor provided on the lower slider, and radiating light toward the thin material,
wherein the upper confocal sensor and the lower confocal sensor are disposed on the same axis according to a coaxial driving scheme, and height measurement is performed by receiving light only at a moment when a focus coincides at a measurement position, and
wherein the upper confocal sensor and the upper slider and the lower confocal sensor and the lower slider are synchronously controlled, and are controlled in conjunction with movement of the thin material.