US 12,154,263 B2
Method, apparatus, and device for labeling images
Guo-Chin Sun, New Taipei (TW); and Chin-Pin Kuo, New Taipei (TW)
Assigned to HON HAI PRECISION INDUSTRY CO., LTD., New Taipei (TW)
Filed by HON HAI PRECISION INDUSTRY CO., LTD., New Taipei (TW)
Filed on Jan. 27, 2022, as Appl. No. 17/585,813.
Claims priority of application No. 202110183358.2 (CN), filed on Feb. 9, 2021.
Prior Publication US 2022/0253996 A1, Aug. 11, 2022
Int. Cl. G06T 7/00 (2017.01); G06F 18/214 (2023.01); G06F 18/24 (2023.01); G06T 7/136 (2017.01); G06T 7/187 (2017.01); G06T 7/70 (2017.01); G06V 10/44 (2022.01); G06V 10/82 (2022.01)
CPC G06T 7/001 (2013.01) [G06F 18/24 (2023.01); G06T 7/136 (2017.01); G06T 7/187 (2017.01); G06T 7/70 (2017.01); G06V 10/82 (2022.01); G06F 18/214 (2023.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30141 (2013.01); G06V 10/44 (2022.01)] 19 Claims
OG exemplary drawing
 
1. A method for labeling images comprising:
obtaining an image to be tested;
comparing the image to be tested to a reference image to generate an image mask, the image mask includes several connected domains;
detecting defects of the image to be tested;
when at least one defect is detected in the image to be tested, obtaining a coordinate of the at least one defect;
based on a central coordinate of the connected domains and the coordinate of the at least one defect, determining the connected domains to be defect connected domains or normal connected domains;
generating a first image mask and a second image mask corresponding to the defect connected domains and the normal connected domains; and
processing the first image mask and the second image mask with the image to be tested, respectively, to obtain a defect element image corresponding to the defect connected domains and a normal element image corresponding to the normal connected domains.