US 12,152,988 B2
Spatially resolved fourier transform impedance spectroscopy and applications to optoelectronics
Mathew L. Kelley, Columbia, SC (US); Andrew B. Greytak, Columbia, SC (US); and M V S Chandrashekhar, Columbia, SC (US)
Assigned to UNIVERSITY OF SOUTH CAROLINA, Columbia, SC (US)
Filed by UNIVERSITY OF SOUTH CAROLINA, Columbia, SC (US)
Filed on Mar. 7, 2022, as Appl. No. 17/688,230.
Claims priority of provisional application 63/185,784, filed on May 7, 2021.
Prior Publication US 2022/0373463 A1, Nov. 24, 2022
Int. Cl. G01N 21/64 (2006.01)
CPC G01N 21/6452 (2013.01) [G01N 21/6456 (2013.01); G01N 2021/6423 (2013.01)] 20 Claims
OG exemplary drawing
 
1. Methodology for determining the frequency response of a subject optoelectronic device having a composite interface, comprising:
turning on and off for an input time an electrical or optical source as am input associated with a subject optoelectronic device having a composite interface;
measuring the resulting transient photocurrent from the subject optoelectronic device to generate measurement data; and
performing Fourier Transform calculations on the transient photocurrent measurement data to determine the frequency response of the subject optoelectronic device.