| CPC H10H 29/012 (2025.01) [H10H 20/01335 (2025.01); H10H 20/825 (2025.01)] | 10 Claims |

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1. A method, comprising:
bonding a semiconductor wafer to a Complementary Metal-Oxide-Semiconductor (CMOS) wafer via one or more adhesive layers, wherein the semiconductor wafer comprises a first substrate, an LED epilayer formed on the first substrate, and a stress release pattern that divides the LED epilayer into a plurality of portions, and wherein the CMOS wafer comprises a second substrate and a plurality of interconnects formed on the second substrate;
etching the LED epilayer and the one or more adhesive layers to form a plurality of micro-LED structures;
fabricating a dielectric layer on the plurality of micro-LED structures; and
fabricating an electrode layer on the plurality of micro-LED structures, wherein fabricating the electrode layer comprises fabricating a layer of a conductive material on the dielectric layer and top surfaces of the plurality of micro-LED structures.
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