| CPC H04N 25/711 (2023.01) [H04N 25/701 (2023.01); H04N 25/745 (2023.01)] | 20 Claims |

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1. A time-delay integration (TDI) line sensor, wherein the TDI line sensor has n TDI lines, at least one readout electronics unit and a circuit arrangement for generating CCD control signals for the TDI lines, wherein a period of the CCD control signals is an integer multiple of a system period, wherein all TDI lines are controlled with the same CCD control signal, wherein the TDI line sensor is configured such that an optimum period of the CCD control signals is calculated on the basis of a relative velocity, wherein the optimum period is not an integer multiple of the system period, wherein the period of the CCD control signals is changed as an integer multiple of the system period during integration over all n TDI lines so that an arithmetic mean of the period of the CCD control signals over the n integration steps corresponds to the optimum period, wherein the change in the period of the CCD control signals over the n integration steps is limited to one system period.
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