| CPC H01L 24/29 (2013.01) [H01L 2224/29287 (2013.01); H01L 2224/29293 (2013.01); H01L 2224/29324 (2013.01); H01L 2224/29339 (2013.01); H01L 2224/29347 (2013.01); H01L 2924/14 (2013.01); H01L 2924/351 (2013.01)] | 20 Claims |

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1. An apparatus, comprising:
an integrated circuit (IC) die comprising integrated circuitry over a first side of a material layer comprising silicon, and a second side of the IC die opposite the first side of the material layer; and
a composite layer on the second side of the IC die, wherein the composite layer comprises:
a first constituent material having a first linear coefficient of thermal expansion (CTE) and a first thermal conductivity, the first thermal conductivity exceeding that of the material layer; and
a second constituent material having a second CTE, the second CTE lower than the first CTE by at least 5 ppm/K, and a second thermal conductivity exceeding that of the material layer, wherein the composite layer comprises particles of one of the first or second constituent materials embedded within another of the first or second constituent materials.
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