US 12,482,642 B2
Nanoparticle baseline and particle detection threshold determination through iterative outlier removal
Cole J. Nardini, Omaha, NE (US); Austin Schultz, Omaha, NE (US); and Daniel R. Wiederin, Omaha, NE (US)
Assigned to Elemental Scientific, Inc., Omaha, NE (US)
Filed by Elemental Scientific, Inc., Omaha, NE (US)
Filed on Apr. 21, 2023, as Appl. No. 18/137,549.
Claims priority of provisional application 63/335,510, filed on Apr. 27, 2022.
Claims priority of provisional application 63/335,523, filed on Apr. 27, 2022.
Claims priority of provisional application 63/335,516, filed on Apr. 27, 2022.
Prior Publication US 2023/0352288 A1, Nov. 2, 2023
Int. Cl. H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/10 (2006.01); H01J 49/36 (2006.01)
CPC H01J 49/0031 (2013.01) [H01J 49/0036 (2013.01); H01J 49/045 (2013.01); H01J 49/105 (2013.01); H01J 49/36 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A method for iterative determination of outlier data from a spectrometry data set, comprising:
transferring a fluid sample containing nanoparticles to a spectrometry sample analyzer;
generating a spectrometry data set via the spectrometry sample analyzer associated with detected ion signal intensity over time;
generating from the spectrometry data set, via one or more computer processors, a raw data set that includes a count distribution of counts of ion signal intensity and a frequency of the ion signal intensity of each count;
iteratively removing, via the one or more computer processors, ion signal intensity values that exceed an outlier threshold value associated with a sum of a first multiple of an average of the count distribution of ion signal intensity and a first multiple of a standard deviation of the count distribution of ion signal intensity until no count values exceed the outlier threshold value to provide a background data set; and
setting, via the one or more computer processors, a nanoparticle baseline intensity value as a sum of a second multiple of an average of the background data set and a second multiple of a standard deviation of the background data set, wherein the first multiple of the standard deviation of the count distribution of ion signal intensity differs from the second multiple of a standard deviation of the background data set.