US 12,480,886 B2
Curved substrate bubble detection method and detection system
Xing Li, Beijing (CN); Ruize Li, Beijing (CN); Hao Tang, Beijing (CN); Ronghua Lan, Beijing (CN); Jiuyang Cheng, Beijing (CN); Meng Guo, Beijing (CN); Zhihui Yang, Beijing (CN); Qing Zhang, Beijing (CN); Xuehui Zhu, Beijing (CN); Quanguo Zhou, Beijing (CN); Lijia Zhou, Beijing (CN); Yong Qiao, Beijing (CN); Zhong Huang, Beijing (CN); and Lirong Xu, Beijing (CN)
Assigned to Beijing BOE Technology Development Co., Ltd., Beijing (CN)
Appl. No. 18/023,810
Filed by BOE TECHNOLOGY GROUP CO., LTD., Beijing (CN)
PCT Filed Mar. 1, 2022, PCT No. PCT/CN2022/078662
§ 371(c)(1), (2) Date Feb. 28, 2023,
PCT Pub. No. WO2023/164809, PCT Pub. Date Sep. 7, 2023.
Prior Publication US 2024/0288376 A1, Aug. 29, 2024
Int. Cl. G01N 21/88 (2006.01); G01N 21/892 (2006.01); G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06V 10/44 (2022.01); G01N 21/89 (2006.01); H10K 71/70 (2023.01)
CPC G01N 21/8851 (2013.01) [G01N 21/892 (2013.01); G06T 7/0004 (2013.01); G06T 7/13 (2017.01); G06V 10/44 (2022.01); G01N 2021/8887 (2013.01); G01N 2021/891 (2013.01); G01N 2201/0438 (2013.01); G01N 2201/06146 (2013.01); G06T 2207/30108 (2013.01); H10K 71/70 (2023.02)] 18 Claims
OG exemplary drawing
 
1. A curved substrate bubble detection method, comprising:
providing, by a first light source and a second light source, parallel light incident to a to-be-tested substrate in different incident directions;
obtaining, by a linear array camera, a first image comprising image information of a first side edge of the to-be-tested substrate, wherein the linear array camera is located in a transmission path of reflected light that is the parallel light provided by the first light source and specularly reflected off the to-be-tested substrate, and is located outside a transmission path of reflected light that is the parallel light provided by the second light source and specularly reflected off the to-be-tested substrate;
determining location information of a defect region of the to-be-tested substrate according to the first image, and generating a second image comprising image information of the defect region; and
binarizing the second image, and determining that the to-be-tested substrate has a bubble defect in case that there are at least two bright spots in an obtained binarized image, and a distance between any two first bright spots of at least two first bright spots is less than a first preset value,
wherein the determining of the location information of the defect region of the to-be-tested substrate according to the first image, and the generating of the second image comprising image information of the defect region specifically comprise:
comparing brightness values of pixels in the first image with a first threshold value, adjusting the brightness value of any pixel whose brightness value is greater than the first threshold value to a first brightness value, and adjusting the brightness value of any pixel whose brightness value is less than the first threshold value to a second brightness value, wherein a location on the to-be-tested substrate corresponding to the pixel with the first brightness value is a location of the first side edge of the to-be-tested substrate, the first side edge comprising a straight portion and arc portions at two ends of the straight portion; and
selecting, with the location of the first side edge as a reference, a rectangular area in each of regions of an active display region of the to-be-tested substrate that are close to the arc portions respectively to obtain the second image.