| CPC C01B 33/035 (2013.01) [C01P 2002/60 (2013.01); C01P 2004/02 (2013.01)] | 3 Claims |

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1. A method for manufacturing a single crystal silicon comprising:
manufacturing a polysilicon rod or polysilicon rods;
selecting a representative polysilicon rod from the polysilicon rod or the polysilicon rods;
determining boundary features of the representative polysilicon rod in an area including the entire representative polysilicon rod excluding a seed core;
selecting a polysilicon rod or polysilicon rods satisfying the boundary features, where the boundary features are a coincidence grain boundary ratio that exceeds 20%, a grain boundary length that exceeds 550 mm/mm2, and a random grain boundary length that does not exceed 800 mm/mm2; and
manufacturing the single crystal silicon by a floating zone (FZ) method using the polysilicon rod or polysilicon rods that satisfy the boundary features along with raw materials.
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