CPC H04N 9/3135 (2013.01) [G01K 13/08 (2013.01); G02B 26/0858 (2013.01); G02B 26/101 (2013.01); G06F 18/253 (2023.01); H04N 9/3194 (2013.01)] | 20 Claims |
1. A method for building a model that reflects a relationship between a temperature characteristic of a micro-electromechanical system (MEMS) scanning device and an operational characteristic of the MEMS scanning device, said method comprising:
causing one or more laser units and the MEMS scanning device to project a predetermined pattern, wherein the predetermined pattern has multiple lines in a scanning direction of the MEMS scanning device;
while the predetermined pattern is being projected, monitoring a temperature of the MEMS scanning device, such that temperature data is generated;
while the predetermined pattern is being projected, obtaining images of the predetermined pattern, such that image data is generated, wherein the image data provides indications of how the predetermined pattern changes over time based on fluctuations in the temperature of the MEMS scanning device, and wherein the indications are reflective of the operational characteristic of the MEMS scanning device; and
feeding the temperature data and the image data into a model that determines a relationship between the temperature of the MEMS scanning device and the operational characteristic of the MEMS scanning device.
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