US 12,149,295 B2
Self-radiated loopback test procedure for millimeter wave antennas
Gaurav Verma, San Diego, CA (US); David Collins, Del Mar, CA (US); Ryan Reddy Wendlandt, San Diego, CA (US); Prachi Deshpande, San Diego, CA (US); Gaurav Singhania, San Diego, CA (US); Karthik Moncombu Ramakrishnan, Chennai (IN); Jeffrey Carr, San Diego, CA (US); Anushruti Bhattacharya, San Diego, CA (US); and Dennis Feenaghty, Solana Beach, CA (US)
Assigned to QUALCOMM Incorporated, San Diego, CA (US)
Filed by QUALCOMM Incorporated, San Diego, CA (US)
Filed on Feb. 1, 2023, as Appl. No. 18/162,805.
Application 18/162,805 is a division of application No. 16/663,298, filed on Oct. 24, 2019, granted, now 11,575,450.
Claims priority of provisional application 62/751,525, filed on Oct. 26, 2018.
Prior Publication US 2023/0171006 A1, Jun. 1, 2023
Int. Cl. H04B 17/14 (2015.01); H01Q 3/26 (2006.01); H04B 1/00 (2006.01); H04B 1/50 (2006.01); H04B 17/19 (2015.01)
CPC H04B 17/14 (2015.01) [H01Q 3/267 (2013.01); H04B 1/0064 (2013.01); H04B 1/50 (2013.01); H04B 17/19 (2015.01)] 9 Claims
OG exemplary drawing
 
1. A method of testing a device under test (DUT) performed by a test unit, the method comprising:
configuring the DUT to set a simultaneous transmit and receive mode;
generating a lower frequency radio frequency (RF) signal, the test unit comprising only lower frequency RF components;
providing the lower frequency RF signal to the DUT;
receiving a received test RF signal from the DUT; and
comparing measurements derived from the received test RF signal to a design specification for the DUT.