CPC H01L 23/3107 (2013.01) [H01L 21/561 (2013.01); H01L 21/568 (2013.01); H01L 23/041 (2013.01); H01L 23/293 (2013.01); H01L 23/36 (2013.01); H01L 23/481 (2013.01); H01L 23/485 (2013.01); H01L 24/96 (2013.01)] | 9 Claims |
1. A method for manufacturing an embedded chip package, the method comprising:
obtaining a chip socket array comprising a frame, wherein the frame is formed therein with a frame via-post passing through a height of the frame;
placing the chip socket array onto an adhesive tape;
placing a chip, with a terminal face of the chip facing downwards, into a cavity of the chip socket array surrounded by the frame;
laminating or coating a first photosensitive polymer dielectric onto the chip and the frame such that the first photosensitive polymer dielectric fully fills a gap between the chip and the frame and covers a back face of the chip and an upper surface of the frame;
exposing and developing the first photosensitive polymer dielectric to form a first pattern which forms a first blind via exposing an end of the frame via-post at the upper surface of the frame and a second blind via revealing the back face of the chip;
removing the adhesive tape, and laminating or coating a second photosensitive polymer dielectric onto the terminal face of the chip and a lower surface of the frame;
exposing and developing the second photosensitive polymer dielectric to form a second pattern which forms a third blind via exposing a terminal of the chip and a fourth blind via exposing an end of the frame via-post at the lower surface of the frame;
applying a metal seed layer onto the first pattern and the second pattern;
applying a photoresist layer onto the metal seed layer, and patterning the photoresist layer to form a third pattern comprising a first wiring layer and a second wiring layer; and
performing Cu electroplating to simultaneously fill the first, second and third patterns to form first, second, third and fourth via-posts and the first and second wiring layers.
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