US 12,148,212 B2
Sensor device and parameter setting method
Susumu Takatsuka, Tokyo (JP); and Hiroki Tetsukawa, Kanagawa (JP)
Assigned to Sony Group Corporation, Tokyo (JP)
Appl. No. 17/272,826
Filed by Sony Group Corporation, Tokyo (JP)
PCT Filed Oct. 4, 2019, PCT No. PCT/JP2019/039283
§ 371(c)(1), (2) Date Mar. 2, 2021,
PCT Pub. No. WO2020/080139, PCT Pub. Date Apr. 23, 2020.
Claims priority of application No. 2018-197495 (JP), filed on Oct. 19, 2018; and application No. 2019-111091 (JP), filed on Jun. 14, 2019.
Prior Publication US 2021/0192692 A1, Jun. 24, 2021
Int. Cl. G06K 9/00 (2022.01); G06T 5/00 (2006.01); G06V 10/20 (2022.01); G06V 20/40 (2022.01)
CPC G06V 20/46 (2022.01) [G06T 5/00 (2013.01); G06V 10/20 (2022.01)] 20 Claims
OG exemplary drawing
 
1. A sensor device comprising:
an array sensor having a plurality of visible or non-visible imaging elements in one or two dimensional manner;
a first processor configured to perform image processing using a parameter on which an instruction is given, for an image signal obtained by imaging in the array sensor, and output the image signal as the image signal to be used for image recognition; and
a second processor configured to identify a class for an object detected from the image signal obtained by the imaging in the array sensor, select a parameter from a set of selectable parameters defining an image quality adjustment value to be used in the image processing of the image signal on a basis of the identified class, and perform a processing setting for the first processor, using the selected parameter,
wherein each selectable parameter is associated with a respective confidence rate, and the respective confidence rate associated with the selected parameter is a lowest respective confidence rate that is above a predefined confidence threshold for an object detection.