| CPC G02B 21/16 (2013.01) [G02B 21/025 (2013.01); G02B 21/361 (2013.01)] | 11 Claims |

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1. A wide-field mid-infrared photothermal microscopy (MIP) system for analyzing a sample on a substrate using dark-field illumination, comprising:
a mid-infrared optical source generating a mid-infrared beam, the mid-infrared beam being directed through the substrate and to the sample from a first side of the sample to heat the sample;
a visible light source generating a light, the light illuminating the sample on the substrate from a second side of the sample, the second side of the sample opposite the first side of the sample, and creating a scattered field and a reflected field along a collection path of the system;
an objective pupil within the collection path relayed to a unit magnification 4f system, the unit magnification 4f system including optics spaced at a shared focal length between the following in succession: an objective pupil, a first lens, an intermediate image plane, a second lens, and a back pupil, wherein the reflected field is refocused at the objective pupil; and
a camera positioned at an end of the collection path to collect the scattered field and generate a dark-field image of the sample,
wherein the MIP system is configured to simultaneously heat the sample with the mid-infrared optical source while imaging the sample with the visible light source.
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