US 12,146,935 B2
Fast RF power measurement apparatus for production testing
Anant Verma, Austin, TX (US)
Assigned to Silicon Laboratories Inc., Austin, TX (US)
Filed by Silicon Laboratories Inc., Austin, TX (US)
Filed on Aug. 23, 2022, as Appl. No. 17/893,635.
Prior Publication US 2024/0069140 A1, Feb. 29, 2024
Int. Cl. G01R 35/00 (2006.01); G01R 21/06 (2006.01); G01R 31/26 (2020.01)
CPC G01R 35/005 (2013.01) [G01R 21/06 (2013.01); G01R 31/2601 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A method of testing a semiconductor device using a production test system, wherein the production test system includes a socket to hold the semiconductor device, a signal generator and a RF meter; the method comprising:
inserting a monitoring device in a connector, the connector in electrical communication with an interface on the socket for holding the semiconductor device;
calibrating the RF meter and the monitoring device;
removing the monitoring device;
using the signal generator to create a signal wherein the signal is received at the semiconductor device and at the RF meter; and
determining parameters of the signal as received by the semiconductor device based on measurements from the RF meter and correlation information determined during the calibrating.