US 12,146,923 B2
Current leak detection for solid state devices
Leo Aichriedler, Puch (AT); and Gerald Wriessnegger, Villach (AT)
Assigned to INFINEON TECHNOLOGIES AUSTRIA AG, Villach (AT)
Filed by Infineon Technologies Austria AG, Villach (AT)
Filed on Jun. 27, 2022, as Appl. No. 17/850,713.
Prior Publication US 2023/0417841 A1, Dec. 28, 2023
Int. Cl. G01R 31/52 (2020.01)
CPC G01R 31/52 (2020.01) 20 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
a solid state device;
a switch in series with the solid state device;
a leak detection component comprising a capacitor connected in parallel to the solid state device, wherein the capacitor is charged when the switch is closed; and
a gate driver configured to drive a gate of the solid state device, wherein the gate driver comprises test circuitry configured to apply a test voltage to the gate of the solid state device, wherein the test voltage is less than a threshold voltage of the solid state device, and wherein a leakage current of the solid state device is detected by the leak detection component based upon a rate of a change of a charge of the capacitor over a period of time exceeding a threshold when the switch is open.