| CPC G01N 27/4145 (2013.01) [C12Q 1/6869 (2013.01); C12Q 1/6874 (2013.01); G01N 27/4148 (2013.01); H01L 21/82 (2013.01)] | 20 Claims |

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1. A method for manufacturing a semiconductor device, comprising:
forming an array of chemically-sensitive field effect transistor (chemFET) sensors, each chemFET sensor in the array of chemFET sensors having a floating gate structure including a sensing surface formed on a top metal layer of the floating gate structure;
depositing a dielectric layer over the array of chemFET sensors;
etching the dielectric layer to define an array of reaction chambers; each reaction chamber in the array of reaction chambers exposing a corresponding sensing surface of a floating gate structure; and
depositing a sensing material within the array of reaction chambers and at least partially on each reaction chamber sidewall, wherein each reaction chamber in the array of reaction chambers includes a sensing layer comprising the sensing material in contact with the sensing surface of a floating gate structure.
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