US 12,146,816 B2
Test jig and test method
Yu Harubeppu, Tokyo (JP); Hisashi Tanie, Tokyo (JP); and Hiroshi Shintani, Tokyo (JP)
Assigned to Hitachi, Ltd., Tokyo (JP)
Appl. No. 18/023,782
Filed by Hitachi, Ltd., Tokyo (JP)
PCT Filed Mar. 2, 2021, PCT No. PCT/JP2021/007900
§ 371(c)(1), (2) Date Feb. 28, 2023,
PCT Pub. No. WO2022/054309, PCT Pub. Date Mar. 17, 2022.
Claims priority of application No. 2020-150306 (JP), filed on Sep. 8, 2020.
Prior Publication US 2023/0324255 A1, Oct. 12, 2023
Int. Cl. G01M 7/06 (2006.01)
CPC G01M 7/06 (2013.01) 12 Claims
OG exemplary drawing
 
1. A test jig comprising:
a vibration generating apparatus coupling unit that is able to be coupled to a vibration generating apparatus and is vibrated in a z-axis direction;
a first diaphragm that is coupled to the vibration generating apparatus coupling unit and extends in a cantilever manner in an x-axis direction intersecting the z-axis direction;
a second diaphragm that is coupled to a vicinity of an x-axis direction end portion of the first diaphragm and extends in a cantilever manner in a y-axis direction intersecting the z-axis direction and the x-axis direction; and
a test piece installation portion on which the test piece is able to be installed and which receives vibration from the vibration generating apparatus coupling unit via the first diaphragm and the second diaphragm,
wherein at least one of the first diaphragm and the second diaphragm includes a length adjusting mechanism.