US 12,144,617 B2
Component measurement device and component measurement method
Yuki Tsuda, Tokyo (JP); Shusaku Hayashi, Tokyo (JP); and Koichi Akiyama, Tokyo (JP)
Assigned to MITSUBISHI ELECTRIC CORPORATION, Tokyo (JP)
Appl. No. 18/279,070
Filed by Mitsubishi Electric Corporation, Tokyo (JP)
PCT Filed Mar. 3, 2021, PCT No. PCT/JP2021/008216
§ 371(c)(1), (2) Date Aug. 28, 2023,
PCT Pub. No. WO2022/185454, PCT Pub. Date Sep. 9, 2022.
Prior Publication US 2024/0122503 A1, Apr. 18, 2024
Int. Cl. A61B 5/145 (2006.01); A61B 5/107 (2006.01); A61B 5/1455 (2006.01)
CPC A61B 5/14532 (2013.01) [A61B 5/1075 (2013.01); A61B 5/1455 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A component measurement device for measuring a given component contained in a sample, the component measurement device comprising:
an optical medium portion on which the sample is stationarily placed;
an excitation light source to emit excitation light onto the optical medium portion;
a probe light source to emit probe light onto the optical medium portion;
a stratum corneum information acquisition circuitry to acquire stratum corneum information about a stratum corneum of the sample,
an intensity modulator to perform intensity modulation on the excitation light emitted by the excitation light source based on the stratum corneum information about the stratum corneum of the sample acquired by the stratum corneum information acquisition circuitry to generate intensity-modulated excitation light such that the generated intensity-modulated excitation light is emitted onto the optical medium portion;
a light position detector to detect a difference between the probe light emitted from the optical medium portion in a first state where the excitation light is emitted and the probe light emitted from the optical medium portion in a second state where the intensity-modulated excitation light is emitted; and
an operation processor configured to measure the given component based on the detected difference.