US 12,477,720 B2
Semiconductor device and method for fabricating the same
Seung Hwan Kim, Gyeonggi-do (KR)
Assigned to SK hynix Inc., Gyeonggi-do (KR)
Filed by SK hynix Inc., Gyeonggi-do (KR)
Filed on Oct. 31, 2023, as Appl. No. 18/498,056.
Application 18/498,056 is a continuation of application No. 17/404,462, filed on Aug. 17, 2021, granted, now 11,844,206.
Claims priority of application No. 10-2021-0026739 (KR), filed on Feb. 26, 2021.
Prior Publication US 2024/0064959 A1, Feb. 22, 2024
Int. Cl. H10B 12/00 (2023.01); H10D 62/10 (2025.01)
CPC H10B 12/30 (2023.02) [H10B 12/03 (2023.02); H10B 12/482 (2023.02); H10B 12/488 (2023.02); H10D 62/115 (2025.01)] 10 Claims
OG exemplary drawing
 
1. A semiconductor device comprising:
a plurality of active layers vertically stacked in a first direction, and horizontally extended in a second direction perpendicular to the first direction;
a plurality of bit lines connected to first ends of the active layers, respectively, and horizontally extended in a third direction;
line-shape air gaps disposed between the bit lines;
a plurality of capacitors connected to second ends of the active layers, respectively;
a word line and a back gate facing each other with each of the active layers interposed therebetween, the word line and the back gate are vertically extended in the first direction,
a capping layer capping the line-shape air gaps,
a liner capping layer formed between the capping layer and the bit lines,
wherein the back gate has a length greater than that of the word line in the second direction,
wherein the word line and the back gate are applied with different voltages, and
wherein the line-shape air gaps are positioned between the capping layer and the liner capping layer.